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    • 3. 发明授权
    • Exposure apparatus
    • 曝光装置
    • US6049372A
    • 2000-04-11
    • US881902
    • 1997-06-23
    • Kinya KatoHiroshi ShirasuYukio KakizakiKei Nara
    • Kinya KatoHiroshi ShirasuYukio KakizakiKei Nara
    • G03F7/20G03F9/00G03B27/42
    • G03F7/70358G03F7/70716G03F7/70775G03F9/70
    • Apparatus and methods are disclosed for transferring a pattern defined by a mask onto a surface of a substrate. The apparatus includes an illumination optical system for illuminating the pattern on the mask. A projection optical system forms an erect image of the pattern on the substrate. For exposure, the mask and substrate are movable together in a scanning direction relative to the projection optical system. First and second relative-displacement measuring systems, the first being separated from the second by a predetermined distance perpendicular to the scanning direction, measure displacement of the mask relative to the substrate in the scanning direction. First and second detection systems detect displacement of the mask and substrate, respectively, in the direction perpendicular to the scanning direction. A position-adjusting system adjusts the position of at least one of the mask and substrate. A calculation system calculates a position-adjusting amount based on outputs from the first and second relative-displacement measuring systems and from the first and second detection systems. A control system controls the position-adjusting system based on an output from the calculation system.
    • 公开了用于将由掩模限定的图案转印到基板的表面上的装置和方法。 该装置包括用于照亮掩模上的图案的照明光学系统。 投影光学系统在基板上形成图案的直立图像。 为了曝光,掩模和基板可相对于投影光学系统沿扫描方向一起移动。 第一和第二相对位移测量系统,第一和第二相对位移测量系统,其中第一相对位移测量系统从垂直于扫描方向的预定距离与第二相对位移测量系统分离,测量掩模相对于基板在扫描方向 第一和第二检测系统分别在与扫描方向垂直的方向上检测掩模和基板的位移。 位置调整系统调整至少一个掩模和基底的位置。 计算系统基于来自第一和第二相对位移测量系统以及第一和第二检测系统的输出来计算位置调整量。 控制系统根据计算系统的输出控制位置调整系统。
    • 4. 发明授权
    • Exposure apparatus and method
    • 曝光装置和方法
    • US5657130A
    • 1997-08-12
    • US408714
    • 1995-03-22
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • G03F7/20G03F7/207G03F9/00H01L21/027G01B11/00
    • G03F7/70216G03F7/70275G03F7/70358G03F7/70791G03F9/70
    • In an exposure apparatus and method, a mask and a substrate are scanned in synchronism with each other so that the pattern of the mask may be transferred onto the substrate through a projection optical system. First beams of light are irradiated to least two locations on the mask spaced apart in a direction intersecting the scanning direction of the mask. The reflected light thereof is received, and the positions of the points on the mask to which the beam of light has been irradiated are detected in the direction of the optical axis of the projection optical system. In addition, second beams of light are irradiated to at least two locations on the substrate spaced apart in the scanning direction, and the reflected light thereof is received. The positions of the points on the substrate to which the second beam of light has been irradiated are also detected in the direction of the optical axis of the projection optical system are detected. The posture of at least one of the mask and the substrate is adjusted on the basis of the positions detected with the first and second beams.
    • 在曝光装置和方法中,掩模和基板彼此同步地扫描,使得掩模的图案可以通过投影光学系统被转印到基板上。 第一光束照射在与掩模的扫描方向相交的方向间隔开的掩模上的至少两个位置。 在投影光学系统的光轴的方向上检测其反射光,并且在光束照射的掩模上的点的位置被检测。 此外,第二光束照射到沿扫描方向间隔开的基板上的至少两个位置,并且其反射光被接收。 检测到在投影光学系统的光轴的方向上检测到已经照射第二光束的基板上的点的位置。 基于由第一和第二光束检测到的位置来调整掩模和基板中的至少一个的姿势。