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    • 3. 发明授权
    • Exposure apparatus and method
    • 曝光装置和方法
    • US5657130A
    • 1997-08-12
    • US408714
    • 1995-03-22
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • G03F7/20G03F7/207G03F9/00H01L21/027G01B11/00
    • G03F7/70216G03F7/70275G03F7/70358G03F7/70791G03F9/70
    • In an exposure apparatus and method, a mask and a substrate are scanned in synchronism with each other so that the pattern of the mask may be transferred onto the substrate through a projection optical system. First beams of light are irradiated to least two locations on the mask spaced apart in a direction intersecting the scanning direction of the mask. The reflected light thereof is received, and the positions of the points on the mask to which the beam of light has been irradiated are detected in the direction of the optical axis of the projection optical system. In addition, second beams of light are irradiated to at least two locations on the substrate spaced apart in the scanning direction, and the reflected light thereof is received. The positions of the points on the substrate to which the second beam of light has been irradiated are also detected in the direction of the optical axis of the projection optical system are detected. The posture of at least one of the mask and the substrate is adjusted on the basis of the positions detected with the first and second beams.
    • 在曝光装置和方法中,掩模和基板彼此同步地扫描,使得掩模的图案可以通过投影光学系统被转印到基板上。 第一光束照射在与掩模的扫描方向相交的方向间隔开的掩模上的至少两个位置。 在投影光学系统的光轴的方向上检测其反射光,并且在光束照射的掩模上的点的位置被检测。 此外,第二光束照射到沿扫描方向间隔开的基板上的至少两个位置,并且其反射光被接收。 检测到在投影光学系统的光轴的方向上检测到已经照射第二光束的基板上的点的位置。 基于由第一和第二光束检测到的位置来调整掩模和基板中的至少一个的姿势。
    • 5. 发明授权
    • Scanning exposure apparatus
    • 扫描曝光装置
    • US5715037A
    • 1998-02-03
    • US615853
    • 1996-03-12
    • Kazuaki SaikiSusumu MoriHiroshi Shirasu
    • Kazuaki SaikiSusumu MoriHiroshi Shirasu
    • G03F7/20G03F9/00H01L21/027
    • G03F7/70241G03F7/70275G03F7/70358G03F9/00G03F9/70
    • The present invention provides a scanning exposure apparatus for projecting an image of a pattern area of a mask having a first alignment mark onto a photosensitive substrate disposed on a substrate stage. A second alignment mark is provided on at least one of the photosensitive substrate and the substrate stage. The scanning exposure apparatus includes a plurality of projection optical systems disposed along a predetermined direction and adapted to receive the luminous fluxes passed through the mask and to project elected images of unchanged dimension of the plurality of illuminated regions of the mask onto the substrate. There is provided a mark detection system for detecting the first alignment mark on the mask and the second alignment mark, and at least one of the projection optical systems constitutes a part of the mark detection system.
    • 本发明提供了一种用于将具有第一对准标记的掩模的图案区域的图像投影到设置在基板台上的感光基板上的扫描曝光装置。 在感光基板和基板台的至少一个上设置第二对准标记。 扫描曝光装置包括沿着预定方向设置的多个投影光学系统,其适于接收通过掩模的光通量,并将掩模的多个照明区域的未改变尺寸的选定图像投影到基板上。 提供了一种用于检测掩模上的第一对准标记和第二对准标记的标记检测系统,并且至少一个投影光学系统构成标记检测系统的一部分。