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    • 4. 发明授权
    • Method and apparatus for memory dynamic burn-in and test
    • 用于记忆动态老化和测试的方法和装置
    • US5375091A
    • 1994-12-20
    • US163803
    • 1993-12-08
    • Robert W. Berry, Jr.Bernd K. F. KoenemannWilliam J. Scarpero, Jr.Philip G. Shephard, IIIKenneth D. WagnerGulsun Yasar
    • Robert W. Berry, Jr.Bernd K. F. KoenemannWilliam J. Scarpero, Jr.Philip G. Shephard, IIIKenneth D. WagnerGulsun Yasar
    • G11C29/10G11C29/50G11C13/00
    • G11C29/10G11C29/50
    • A memory embedded in a integrated processor chip is dynamically stressed tested by repeatedly writing a test pattern to the data locations of the memory in which a high percentage of the memory cells are sequentially written with complementary data in order to create a high stress on the memory devices. The test pattern is generated as a function of the number of address locations of the memory and the number of data bits of a memory data word. The test pattern is rotated each time the memory is addressed. The test pattern preferably has a contiguous group of digits with the number of digits in the contiguous group being a function of the number of address locations and the number of data bits in the memory word. The memory data input register is configured as a recirculating loop and additional dummy bits are added to provide recirculating loops longer than the data input register. A plurality of independent circulating loops may be created in the data input register or in combination with a number of dummy register bits.
    • 嵌入在集成处理器芯片中的存储器通过重复地将测试图案写入存储器的数据位置而被动态地受到压力测试,其中高百分比的存储器单元被顺序地写有补充数据,以便在存储器上产生高应力 设备。 作为存储器的地址位置的数量和存储器数据字的数据位的数量的函数产生测试图案。 每次存储器寻址时,测试模式都会旋转。 测试图案优选地具有连续的数字组,连续组中的位数是作为存储器字中的地址位置数和数据位数的函数。 存储器数据输入寄存器被配置为循环回路,并添加额外的虚拟位以提供比数据输入寄存器更长的再循环回路。 可以在数据输入寄存器中或与多个虚拟寄存器位组合地产生多个独立的循环回路。
    • 6. 发明授权
    • Frequency guard band validation of processors
    • 处理器的频率保护带验证
    • US08855969B2
    • 2014-10-07
    • US13170150
    • 2011-06-27
    • Robert W. Berry, Jr.Diyanesh B. ChinnakkondaPrasanna JayaramanTony E. Sawan
    • Robert W. Berry, Jr.Diyanesh B. ChinnakkondaPrasanna JayaramanTony E. Sawan
    • G01R31/28G06F11/24
    • G01R31/2879G06F11/24
    • Whether validation of at least one of a plurality of previously validated processors on a first system produced data usable for computing a validation start frequency of an unvalidated processor on a second system is determined. If validation of at least one of the plurality of previously validated processors on the first system produced data usable for validating the unvalidated processor, a validation start frequency associated with the unvalidated processor can be computed based, at least in part, on system parametric data associated with a subset of the plurality of previously validated processors that were validated on the first system. Otherwise, the validation start frequency associated with the unvalidated processor is computed based, at least in part, on tester parametric data associated with the unvalidated processor. Validation of the guard band frequency for the unvalidated processor is initiated at the validation start frequency.
    • 确定第一系统上的多个先前验证的处理器中的至少一个的验证是否产生可用于计算第二系统上未经验证的处理器的验证开始频率的数据。 如果对第一系统上的多个先前验证的处理器中的至少一个的验证产生可用于验证未验证的处理器的数据,则可以至少部分地基于与系统参数数据相关联地计算与未验证的处理器相关联的验证开始频率 具有在第一系统上验证的多个先前验证的处理器的子集。 否则,至少部分地基于与未经验证的处理器相关联的测试仪参数数据来计算与未验证的处理器相关联的验证开始频率。 无效处理器的保护频带频率的验证在验证开始频率处启动。