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    • 9. 发明授权
    • Mechanized retractable pellicles and methods of use
    • 机械化可伸缩薄膜和使用方法
    • US06734445B2
    • 2004-05-11
    • US09840364
    • 2001-04-23
    • Arun RamamoorthyHsing-Chien Ma
    • Arun RamamoorthyHsing-Chien Ma
    • G03B2762
    • G03F1/64G03F7/70983
    • Apparatus and methods to protect a photomask that is used for semiconductor photolithography at wavelengths outside the visible spectrum include a pellicle that is readily retracted during exposure or to provide access to the photomask. The pellicle can be transparent at an inspection wavelength and opaque at an exposure wavelength. In various embodiments, the pellicle is slid, retracted, or pivoted relative to a base aligned with the photomask, thus uncovering the photomask. When overlying the photomask, the pellicle can be secured with magnetic elements, such as magnets or electromagnets. In another embodiment, the pellicle includes a diaphragm that can be opened or closed. Methods of using a pellicle are also described.
    • 用于保护在可见光谱外的波长处用于半导体光刻的光掩模的装置和方法包括在曝光期间容易缩回或提供对光掩模的访问的防护薄膜组件。 防护薄膜组件在检测波长下可以是透明的,并且在曝光波长处是不透明的。 在各种实施例中,防护薄膜组件相对于与光掩模对准的底座滑动,缩回或枢转,从而露出光掩模。 当覆盖光掩模时,防护薄膜组件可以用诸如磁体或电磁体的磁性元件固定。 在另一个实施例中,防护薄膜组件包括可打开或关闭的隔膜。 还描述了使用防护薄膜的方法。