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    • 2. 发明授权
    • Current steering circuit for a digital-to-analog converter
    • 用于数模转换器的电流转向电路
    • US5909187A
    • 1999-06-01
    • US918344
    • 1997-08-26
    • Bhupendra K. Ahuja
    • Bhupendra K. Ahuja
    • H03K17/041H03M1/74H03M1/66
    • H03K17/04106H03M1/742
    • An improved current steering cell for a DAC which eliminates the need for an inverter reduces the noise at the common mode. The cell includes a first and a second current steering MOS transistor of a first polarity type, each having a gate and a pair of current passing terminals. The cell has an input terminal for receiving digital input signals coupled to the gate of the first of the pair of current steering transistors, and a common mode node for receiving an input current coupled to the same one of the pair of current passing terminals of each current steering MOS transistor. The current output terminal of the cell is coupled to the other of the pair of current passing terminals of the first of the current steering MOS transistors. Finally, the cell includes a third MOS transistor of the opposite polarity type to the current steering MOS transistors, having a gate and a pair of current passing terminals for passing a current through the transistor, the gate of the third MOS transistor being coupled to the gate of the first MOS current steering transistor, and the current passing terminals of the third MOS transistor being coupled between the gate of the second MOS current steering transistor and one of the pair of current passing terminals of the second MOS current steering transistor.
    • 用于DAC的改进的电流转向单元消除了对逆变器的需要,降低了在共模下的噪声。 电池包括第一极性类型的第一和第二电流转向MOS晶体管,每个具有栅极和一对电流通过端子。 电池具有用于接收耦合到一对电流转向晶体管中的第一对的栅极的数字输入信号的输入端子,以及用于接收耦合到每对电流对的一对电流通过端子中的相同一个的输入电流的共模节点 电流转向MOS晶体管。 电池的电流输出端子耦合到第一电流转向MOS晶体管的一对电流通过端子中的另一个。 最后,电池包括与电流转向MOS晶体管相反极性类型的第三MOS晶体管,具有用于使电流通过晶体管的栅极和一对电流通过端子,第三MOS晶体管的栅极耦合到 并且第三MOS晶体管的电流通过端子耦合在第二MOS电流转向晶体管的栅极和第二MOS电流转向晶体管的一对电流通过端子中的一个之间。
    • 4. 发明授权
    • Precision floating gate reference temperature coefficient compensation circuit and method
    • 精密浮栅参考温度系数补偿电路及方法
    • US07221209B2
    • 2007-05-22
    • US11129455
    • 2005-05-12
    • Bhupendra K. AhujaHoa VuCarlos Laber
    • Bhupendra K. AhujaHoa VuCarlos Laber
    • H01L35/00
    • G05F3/30
    • A circuit and corresponding method for a precision floating gate voltage reference that uses a feedback loop, conduction of tunnel devices, and a bandgap cell to accurately program a desired charge level on a floating gate and provide a predictable and programmable temperature coefficient parameter for such voltage reference. In one embodiment, a bandgap cell is coupled through a capacitor to the floating gate storage node for providing a voltage source for canceling the temperature coefficient (TC) of the storage capacitor. The circuit and method enables TC to be minimized by either choosing the proper voltage source characteristics or alternatively, by choosing the proper ratio of two capacitors. The bandgap cell can alternatively be designed to have positive TC (PTAT voltage sources) or negative TC (VBE junction).
    • 一种用于精密浮动栅极电压基准的电路和相应方法,其使用反馈回路,隧道装置的导通以及带隙单元来精确地编程浮动栅极上的期望电荷电平,并为这种电压提供可预测和可编程的温度系数参数 参考。 在一个实施例中,带隙单元通过电容器耦合到浮动栅极存储节点,用于提供用于消除存储电容器的温度系数(TC)的电压源。 电路和方法可以通过选择适当的电压源特性或者通过选择两个电容器的适当比例来最小化TC。 可替代地,带隙单元可被设计为具有正的TC(PTAT电压源)或负的TC(VBE结)。
    • 6. 发明授权
    • Automatic circuit and method for temperature compensation of oscillator frequency variation over temperature for a real time clock chip
    • 用于实时时钟芯片的振荡器频率变化温度补偿的自动电路和方法
    • US07371005B1
    • 2008-05-13
    • US11818387
    • 2007-06-14
    • Bhupendra K. AhujaHoa VuTeck-Boon Serm
    • Bhupendra K. AhujaHoa VuTeck-Boon Serm
    • G04B17/20H03L1/00
    • G04F5/06H03L1/02H03L1/022H03L1/027H03L1/028
    • An automatic temperature compensated real-time clock (RTC) chip includes a clock portion having a crystal oscillator block including crystal compensation circuitry adapted to be coupled to a crystal. The crystal compensation circuitry includes a non-linear capacitor DAC including a plurality of load capacitors, wherein the load capacitors have respective switches which switch respective ones of the load capacitors to change a parallel resonance frequency (fp) generated by the oscillator block. The capacitor DAC is arranged so that Analog Trimming (ATR) bits received cause an arrangement of the switches to provide a non-linear change in overall load capacitance to result in a linear relationship between fp and the ATR bits. A temperature sensor block is coupled to the crystal for measuring a temperature of at least the crystal. An A/D converter is coupled to the temperature sensor for outputting a digital temperature signal representative of the temperature of the crystal. A DSP engine receives the digital temperature signal and calculates frequency correction needed to correct for frequency inaccuracy and determines a bit sequence including the ATR bits appropriate to achieve the frequency correction.
    • 自动温度补偿实时时钟(RTC)芯片包括具有晶体振荡器模块的时钟部分,该晶体振荡器模块包括适于耦合到晶体的晶体补偿电路。 晶体补偿电路包括包括多个负载电容器的非线性电容器DAC,其中负载电容器具有切换各个负载电容器的相应开关,以改变由振荡器模块产生的并联谐振频率(fp)。 电容器DAC被布置成使得接收的模拟微调(ATR)位导致开关的布置,以提供总负载电容的非线性变化,从而导致fp与ATR位之间的线性关系。 温度传感器模块耦合到晶体以测量至少晶体的温度。 A / D转换器耦合到温度传感器,用于输出代表晶体温度的数字温度信号。 DSP引擎接收数字温度信号并计算校正频率不准确所需的频率校正,并确定包括适合于实现频率校正的ATR位的比特序列。
    • 7. 再颁专利
    • Automatic circuit and method for temperature compensation of oscillator frequency variation over temperature for a real time clock chip
    • 用于实时时钟芯片的振荡器频率变化温度补偿的自动电路和方法
    • USRE43236E1
    • 2012-03-13
    • US12779885
    • 2010-05-13
    • Hoa VuTeck-Boon SermBhupendra K. Ahuja
    • Hoa VuTeck-Boon SermBhupendra K. Ahuja
    • G04B17/20H03L1/00
    • G04F5/06H03L1/02H03L1/022H03L1/027H03L1/028
    • An automatic temperature compensated real-time clock (RTC) chip includes a clock portion having a crystal oscillator block including crystal compensation circuitry adapted to be coupled to a crystal. The crystal compensation circuitry includes a non-linear capacitor DAC including a plurality of load capacitors, wherein the load capacitors have respective switches which switch respective ones of the load capacitors to change a parallel resonance frequency (fp) generated by the oscillator block. The capacitor DAC is arranged so that Analog Trimming (ATR) bits received cause an arrangement of the switches to provide a non-linear change in overall load capacitance to result in a linear relationship between fp and the ATR bits. A temperature sensor block is coupled to the crystal for measuring a temperature of at least the crystal. An A/D converter is coupled to the temperature sensor for outputting a digital temperature signal representative of the temperature of the crystal. A DSP engine receives the digital temperature signal and calculates frequency correction needed to correct for frequency inaccuracy and determines a bit sequence including the ATR bits appropriate to achieve the frequency correction.
    • 自动温度补偿实时时钟(RTC)芯片包括具有晶体振荡器模块的时钟部分,该晶体振荡器模块包括适于耦合到晶体的晶体补偿电路。 晶体补偿电路包括包括多个负载电容器的非线性电容器DAC,其中负载电容器具有切换各个负载电容器的相应开关,以改变由振荡器模块产生的并联谐振频率(fp)。 电容器DAC被布置成使得接收的模拟微调(ATR)位导致开关的布置,以提供总负载电容的非线性变化,从而导致fp与ATR位之间的线性关系。 温度传感器模块耦合到晶体以测量至少晶体的温度。 A / D转换器耦合到温度传感器,用于输出代表晶体温度的数字温度信号。 DSP引擎接收数字温度信号并计算校正频率不准确所需的频率校正,并确定包括适合于实现频率校正的ATR位的比特序列。
    • 8. 发明申请
    • AUTOMATIC CIRCUIT AND METHOD FOR TEMPERATURE COMPENSATION OF OSCILLATOR FREQUENCY VARIATION OVER TEMPERATURE FOR A REAL TIME CLOCK CHIP
    • 用于实时时钟芯片的振荡器频率变化温度补偿的自动电路和方法
    • US20080117722A1
    • 2008-05-22
    • US11818387
    • 2007-06-14
    • Bhupendra K. AhujaHoa VuTeck-Boon Serm
    • Bhupendra K. AhujaHoa VuTeck-Boon Serm
    • G04G3/02G04G3/00G04G5/00
    • G04F5/06H03L1/02H03L1/022H03L1/027H03L1/028
    • An automatic temperature compensated real-time clock (RTC) chip includes a clock portion having a crystal oscillator block including crystal compensation circuitry adapted to be coupled to a crystal. The crystal compensation circuitry includes a non-linear capacitor DAC including a plurality of load capacitors, wherein the load capacitors have respective switches which switch respective ones of the load capacitors to change a parallel resonance frequency (fp) generated by the oscillator block. The capacitor DAC is arranged so that Analog Trimming (ATR) bits received cause an arrangement of the switches to provide a non-linear change in overall load capacitance to result in a linear relationship between fp and the ATR bits. A temperature sensor block is coupled to the crystal for measuring a temperature of at least the crystal. An A/D converter is coupled to the temperature sensor for outputting a digital temperature signal representative of the temperature of the crystal. A DSP engine receives the digital temperature signal and calculates frequency correction needed to correct for frequency inaccuracy and determines a bit sequence including the ATR bits appropriate to achieve the frequency correction.
    • 自动温度补偿实时时钟(RTC)芯片包括具有晶体振荡器模块的时钟部分,该晶体振荡器模块包括适于耦合到晶体的晶体补偿电路。 晶体补偿电路包括包括多个负载电容器的非线性电容器DAC,其中负载电容器具有切换各个负载电容器的相应开关,以改变由振荡器模块产生的并联谐振频率(fp)。 电容器DAC被布置成使得接收的模拟微调(ATR)位导致开关的布置,以提供总负载电容的非线性变化,从而导致fp与ATR位之间的线性关系。 温度传感器模块耦合到晶体以测量至少晶体的温度。 A / D转换器耦合到温度传感器,用于输出代表晶体温度的数字温度信号。 DSP引擎接收数字温度信号并计算校正频率不准确所需的频率校正,并确定包括适合于实现频率校正的ATR位的比特序列。