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1. 发明授权

US06797112B2 Plasma treatment apparatus and method of producing semiconductor device using the apparatus 失效
标题翻译：等离子体处理装置及使用该装置的半导体装置的制造方法
公开(公告)号：US06797112B2
公开(公告)日：2004-09-28
申请号：US10408242
申请日：2003-04-08
申请人： Naoshi Itabashi , Naoyuki Kofuji , Yasunori Goto
发明人： Naoshi Itabashi , Naoyuki Kofuji , Yasunori Goto
IPC分类号： H05H100
CPC分类号： H01J37/32284 , H01J37/32192 , H01L21/32137
摘要： A plasma treatment apparatus which introduces electromagnetic waves from a dielectric window into a chamber evacuated to low pressure has a standing wave controlling part provided near the periphery part of the dielectric window with the portions other than the entrance thereof being surrounded by conductor, and having shape and size thereof equivalent to depth d=l/4+l/2×(n−1)±l/8: (n=positive integer, l=c(light velocity)/f/{square root over (&egr;)}) in terms of the characteristic length.
摘要翻译：将电介质窗口的电磁波引入到低压室的等离子体处理装置具有设置在电介质窗口的周边部附近的驻波控制部，除了入口以外的部分被导体包围，具有形状和等于深度d = 1/4 + 1 / 2x（n-1）±1/8的尺寸：（n =正整数，l = c（光速）/ f / {平方根超过（ε）}）在特征长度方面。

2. 发明授权

US06480574B2 X-ray diagnostic apparatus 有权
标题翻译： X光诊断仪
公开(公告)号：US06480574B2
公开(公告)日：2002-11-12
申请号：US10097959
申请日：2002-03-15
申请人： Yasunori Goto
发明人： Yasunori Goto
IPC分类号： G21K100
CPC分类号： A61B6/583 , A61B6/06 , A61B6/4233 , A61B6/4291 , A61B6/4441 , A61B6/5258 , A61B6/588
摘要： An X-ray tube and an X-ray detector are supported by an arm in such a manner that a distance between the X-ray tube and an image reception plane of the X-ray detector can be changed. A grid is arranged on the image reception plane of the X-ray detector. The arm is supported by an arm support apparatus in such a manner that an angle of the arm can be changed. Moire image data files obtained by the grid are stored in a storage device in association with the distance between the X-ray tube and the image reception plane of the X-ray detector and the angle of the arm. Image data outputted from the X-ray detector is corrected by the moire correction circuit based on the moire image data selectively read from the storage device in accordance with the distance and the angle.
摘要翻译： X射线管和X射线检测器由臂支撑，使得可以改变X射线管与X射线检测器的图像接收平面之间的距离。格栅布置在X射线检测器的图像接收平面上。臂由臂支撑装置支撑，使得臂的角度可以改变。由栅格获得的莫尔图像数据文件与X射线检测器的X射线管和图像接收平面之间的距离以及臂的角度相关联地存储在存储装置中。基于从存储装置选择性地读取的莫尔图像数据，通过莫尔校正电路根据距离和角度，校正从X射线检测器输出的图像数据。

3. 发明授权

US5773437A Alkylenediamine derivatives 失效
标题翻译：烷二胺衍生物
公开(公告)号：US5773437A
公开(公告)日：1998-06-30
申请号：US722112
申请日：1996-09-30
申请人： Mitsuo Masaki , Norihisa Miyake , Atsushi Tendo , Michiko Ishida , Haruhiko Shinozaki , Yutaka Nomura , Yasunori Goto
发明人： Mitsuo Masaki , Norihisa Miyake , Atsushi Tendo , Michiko Ishida , Haruhiko Shinozaki , Yutaka Nomura , Yasunori Goto
IPC分类号： C07D275/06 , C07D279/02 , C07D417/06 , A61K31/54
CPC分类号： C07D275/06 , C07D279/02 , C07D279/08 , C07D417/06
摘要： The present invention relates to alkylenediamine derivatives which relieve urinating contraction and therefore are of value as active ingredients of therapeutic agents for treating dysuria.
摘要翻译： PCT No.PCT / JP95 / 00632 Sec。 371日期1996年9月30日 102（e）日期1996年9月30日PCT提交1995年3月31日PCT公布。第WO95 / 26959号公报日期1995年10月12日本发明涉及缓解小便收缩的亚烷基二胺衍生物，因此具有治疗排尿困难的治疗剂的有效成分的价值。

4. 发明授权

US08905636B2 X-ray diagnostic apparatus 有权
标题翻译： X光诊断仪
公开(公告)号：US08905636B2
公开(公告)日：2014-12-09
申请号：US13731462
申请日：2012-12-31
申请人： Takeo Matsuzaki , Yasunori Goto , Rie Ochiai
发明人： Takeo Matsuzaki , Yasunori Goto , Rie Ochiai
IPC分类号： G01T1/00 , A61B6/00
CPC分类号： A61B6/586 , A61B6/4233
摘要： According to one embodiment, an end-of-life detection unit in an X-ray diagnostic apparatus is configured to detect an end of life of a detector on the basis of an output value in an X-ray image, and includes: a luminance-level-value computation unit configured to calculate an amount of X-ray irradiation of the detector on the basis of the output value in an area of interest which is set on any one of the X-ray image and the detector; an irradiation-amount accumulation unit configured to calculate an accumulated amount of irradiation in the area of interest by adding the amount of X-ray irradiation calculated by the luminance-level-value computation unit to a previous amount of X-ray irradiation in the area of interest; and an end-of-life judgment unit configured to make a judgment on the end of life of the detector on the basis of the accumulated amount of irradiation.
摘要翻译：根据一个实施例，X射线诊断装置中的寿命终止检测单元被配置为基于X射线图像中的输出值来检测检测器的寿命，并且包括：亮度 - 水平值计算单元，被配置为基于设置在所述X射线图像和所述检测器中的任一个上的感兴趣区域中的输出值来计算所述检测器的X射线照射量; 照射量累积单元，被配置为通过将由亮度水平值计算单元计算的X射线照射量相对于该区域中的先前X射线照射量来计算感兴趣区域中的照射的累积量出于兴趣; 以及结束判定单元，其构成为基于累积的照射量来判定检测器的寿命终止。

5. 发明申请

US20130259209A1 X-RAY DIAGNOSTIC SYSTEM 有权
标题翻译： X射线诊断系统
公开(公告)号：US20130259209A1
公开(公告)日：2013-10-03
申请号：US13991457
申请日：2012-01-19
申请人： Yasunori Goto , Hiroaki Sato
发明人： Yasunori Goto , Hiroaki Sato
IPC分类号： H05G1/02
CPC分类号： A61B6/4464 , A61B6/0407 , A61B6/4291 , A61B6/4452
摘要： An X-ray diagnostic system is provided that is capable of fitting the vertical position of the X-ray tube to each mode of photography without being affected by the height of the ceiling. The X-rays irradiated from the X-ray tube and transmitted through the subject are detected, and photographed images are captured based on the detected X-rays; the system comprises a supporting member, an arm member, and a height adjuster; the supporting member is provided on the ceiling of a room, formed in a pillar shape, and configured in such a way that the entire length is vertically extended and shortened. The arm member has a base end section connected to the lower end portion of the supporting member and a tip section on which the X-ray tube is mounted. The height adjuster adjusts the vertical position of the X-ray tube by moving the tip section of the arm member relative to the supporting member.
摘要翻译：提供一种X射线诊断系统，其能够将X射线管的垂直位置装配到每种摄影模式，而不受天花板的高度的影响。检测从X射线管照射并透过被检体的X射线，根据检测出的X射线拍摄拍摄图像; 该系统包括支撑构件，臂构件和高度调节器; 支撑构件设置在房间的天花板上，形成为柱状，并且构造成使得整个长度垂直延伸和缩短。臂构件具有连接到支撑构件的下端部的基端部和安装有X射线管的末端部。高度调节器通过相对于支撑构件移动臂构件的尖端部分来调节X射线管的垂直位置。

6. 发明申请

US20130121466A1 X-RAY DIAGNOSTIC APPARATUS 有权
标题翻译： X射线诊断装置
公开(公告)号：US20130121466A1
公开(公告)日：2013-05-16
申请号：US13731462
申请日：2012-12-31
申请人： Takeo Matsuzaki , Yasunori Goto , Rie Ochiai
发明人： Takeo Matsuzaki , Yasunori Goto , Rie Ochiai
IPC分类号： A61B6/00
CPC分类号： A61B6/586 , A61B6/4233
摘要： According to one embodiment, an end-of-life detection unit in an X-ray diagnostic apparatus is configured to detect an end of life of a detector on the basis of an output value in an X-ray image, and includes: a luminance-level-value computation unit configured to calculate an amount of X-ray irradiation of the detector on the basis of the output value in an area of interest which is set on any one of the X-ray image and the detector; an irradiation-amount accumulation unit configured to calculate an accumulated amount of irradiation in the area of interest by adding the amount of X-ray irradiation calculated by the luminance-level-value computation unit to a previous amount of X-ray irradiation in the area of interest; and an end-of-life judgment unit configured to make a judgment on the end of life of the detector on the basis of the accumulated amount of irradiation.
摘要翻译：根据一个实施例，X射线诊断装置中的寿命终止检测单元被配置为基于X射线图像中的输出值来检测检测器的寿命，并且包括：亮度 - 水平值计算单元，被配置为基于设置在所述X射线图像和所述检测器中的任一个上的感兴趣区域中的输出值来计算检测器的X射线照射量; 照射量累积单元，被配置为通过将由亮度水平值计算单元计算的X射线照射量相对于该区域中的先前X射线照射量来计算感兴趣区域中的照射的累积量出于兴趣; 以及结束判定单元，其构成为基于累积的照射量来判定检测器的寿命终止。

7. 发明授权

US09681848B2 X-ray diagnostic system 有权
公开(公告)号：US09681848B2
公开(公告)日：2017-06-20
申请号：US13991457
申请日：2012-01-19
申请人： Yasunori Goto , Hiroaki Sato
发明人： Yasunori Goto , Hiroaki Sato
IPC分类号： A61B6/00 , A61B6/04
CPC分类号： A61B6/4464 , A61B6/0407 , A61B6/4291 , A61B6/4452
摘要： An X-ray diagnostic system is provided that is capable of fitting the vertical position of the X-ray tube to each mode of photography without being affected by the height of the ceiling. The X-rays irradiated from the X-ray tube and transmitted through the subject are detected, and photographed images are captured based on the detected X-rays; the system comprises a supporting member, an arm member, and a height adjuster; the supporting member is provided on the ceiling of a room, formed in a pillar shape, and configured in such a way that the entire length is vertically extended and shortened. The arm member has a base end section connected to the lower end portion of the supporting member and a tip section on which the X-ray tube is mounted. The height adjuster adjusts the vertical position of the X-ray tube by moving the tip section of the arm member relative to the supporting member.

8. 发明授权

US07394070B2 Method and apparatus for inspecting patterns 失效
标题翻译：检查模式的方法和装置
公开(公告)号：US07394070B2
公开(公告)日：2008-07-01
申请号：US11314020
申请日：2005-12-22
申请人： Mari Nozoe , Yasunori Goto , Zhaohui Cheng
发明人： Mari Nozoe , Yasunori Goto , Zhaohui Cheng
IPC分类号： G01N23/00 , G21K7/00 , G21K5/10
CPC分类号： H01J37/026 , G01R31/307 , H01J37/04 , H01J37/263 , H01J37/28 , H01J2237/0048 , H01J2237/24592 , H01J2237/2817
摘要： When the electrode potential of a charge control electrode above a wafer is reduced, image brightness is reduced. A point of change in the image brightness is a switching point between a positively charged state of the image and a negatively charged state of the image, showing the weakly charged state of the image. By setting this point of change as an inspecting condition, the amount of electric charges on the surface of the wafer can be reduced, and stable wafer inspection can be performed. It is estimated that an applied voltage V1 in FIG. 14 corresponds to the point of the change and is roughly included in the voltage range of a region enclosed by a broken line in the vicinity of the applied voltage V1. Within this voltage range, the influence of charge on an inspection under the inspecting condition can be reduced.
摘要翻译：当晶片上方的电荷控制电极的电极电位降低时，图像亮度降低。图像亮度的变化点是图像的带正电状态和图像的带负电状态之间的切换点，显示图像的弱电状态。通过将该变化点设定为检查条件，可以减少晶片表面上的电荷量，并且可以进行稳定的晶片检查。估计图1中的施加电压V 1。 14对应于变化点，并且大致包括在由施加电压V 1附近的由虚线包围的区域的电压范围内。在该电压范围内，可以减少充电对检查条件下的检查的影响。

9. 发明申请

US20060163477A1 Method and apparatus for inspecting patterns 失效
标题翻译：检查模式的方法和装置
公开(公告)号：US20060163477A1
公开(公告)日：2006-07-27
申请号：US11314020
申请日：2005-12-22
申请人： Mari Nozoe , Yasunori Goto , Zhaohui Cheng
发明人： Mari Nozoe , Yasunori Goto , Zhaohui Cheng
IPC分类号： G21K7/00
CPC分类号： H01J37/026 , G01R31/307 , H01J37/04 , H01J37/263 , H01J37/28 , H01J2237/0048 , H01J2237/24592 , H01J2237/2817
摘要： When the electrode potential of a charge control electrode above a wafer is reduced, image brightness is reduced. A point of change in the image brightness is a switching point between a positively charged state of the image and a negatively charged state of the image, showing the weakly charged state of the image. By setting this point of change as an inspecting condition, the amount of electric charges on the surface of the wafer can be reduced, and stable wafer inspection can be performed. It is estimated that an applied voltage V1 in FIG. 14 corresponds to the point of the change and is roughly included in the voltage range of a region enclosed by a broken line in the vicinity of the applied voltage V1. Within this voltage range, the influence of charge on an inspection under the inspecting condition can be reduced.
摘要翻译：当晶片上方的电荷控制电极的电极电位降低时，图像亮度降低。图像亮度的变化点是图像的带正电状态和图像的带负电状态之间的切换点，显示图像的弱电状态。通过将该变化点设定为检查条件，可以减少晶片表面上的电荷量，并且可以进行稳定的晶片检查。估计图1中的施加电压V 1。 14对应于变化点，并且大致包括在由施加电压V 1附近的由虚线包围的区域的电压范围内。在该电压范围内，可以减少充电对检查条件下的检查的影响。

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