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    • 3. 发明授权
    • Multi-step removal of excess emitter material in fabricating
electron-emitting device
    • 在制造电子发射器件时多步去除过量的发射极材料
    • US6027632A
    • 2000-02-22
    • US904967
    • 1997-07-30
    • N. Johan KnallDuane A. HavenRoger W. BartonWilliam H. CreelChristopher J. Spindt
    • N. Johan KnallDuane A. HavenRoger W. BartonWilliam H. CreelChristopher J. Spindt
    • B81C1/00C25F3/14H01J9/02C25F3/02
    • H01J9/025
    • Excess emitter material (52B) is removed in multiple steps during the fabrication of an electron-emitting device. A structure is initially provided in which a dielectric layer (44) overlies a non-insulating region (42), control electrodes (80 or 46/80) overlie the dielectric layer, openings (48/50) extend through the control electrodes and dielectric layer, electron-emissive elements (52A) formed with emitter material are situated in the openings, and an excess layer (52B) of the emitter material overlies the control electrodes and the dielectric layer. Portions of the excess emitter material overlying the dielectric layer in the spaces between the control electrodes are initially removed, preferably with etchant that directly attacks the emitter material. Portions (52C) of the excess emitter material overlying the control electrodes above the electron-emissive elements are subsequently removed to expose the electron-emissive elements.
    • 在制造电子发射器件期间,多个发射极材料(52B)被多个步骤去除。 首先提供一种结构,其中介电层(44)覆盖在非绝缘区域(42)上,控制电极(80或46/80)覆盖在电介质层上,开口(48/50)延伸穿过控制电极和电介质 由发射体材料形成的层,电子发射元件(52A)位于开口中,发射极材料的过剩层(52B)覆盖在控制电极和电介质层上。 最初除去在控制电极之间的空间中覆盖电介质层的多余发射体材料的部分,最好用直接攻击发射极材料的蚀刻剂。 随后去除覆盖电子发射元件上方的控制电极的过量发射体材料的部分(52℃)以露出电子发射元件。
    • 7. 发明授权
    • Field emitter fabrication using open circuit electrochemical lift off
    • 使用开路电化学剥离的场发射体制造
    • US5863233A
    • 1999-01-26
    • US848338
    • 1997-04-30
    • John D. PorterGabriela S. ChakarovaN. Johan KnallChristopher J. Spindt
    • John D. PorterGabriela S. ChakarovaN. Johan KnallChristopher J. Spindt
    • C25F3/02B81C1/00C25F3/14H01J9/02
    • H01J9/025
    • A method for forming a field emitter structure. In one embodiment, the present invention creates a structure having a cavity formed into an insulating layer overlying a first electrically conductive layer. The present invention also creates a second electrically conductive layer with an opening formed above the cavity in the insulating layer. The present embodiment deposits a layer of electron emissive material directly onto the second electrically conductive layer without first depositing an underlying lift-off layer such that the electron emissive material covers the opening in the second electrically conductive layer and forms an electron emissive element within the cavity. The present invention applies a first potential to the first electrically conductive layer, such that the first potential is imparted to the electron emissive element formed within the cavity. The present invention also applies a second potential to the second electrically conductive layer, such that the second potential is imparted to the closure layer of electron emissive material. In the present embodiment, the second potential comprises an open circuit potential. The present invention then exposes the field emitter structure to an electrochemical etchant wherein the electrochemical etchant etches electron emissive material which is biased at the open circuit potential. In so doing, the layer of electron emissive material is removed from above the second electrically conductive layer without etching the electron emissive element formed within the cavity.
    • 一种形成场致发射结构的方法。 在一个实施例中,本发明产生了一种结构,其具有形成为覆盖在第一导电层上的绝缘层的空腔。 本发明还产生了在绝缘层中形成在空腔上方的开口的第二导电层。 本实施例将电子发射材料层直接沉积到第二导电层上,而不首先沉积下面的剥离层,使得电子发射材料覆盖第二导电层中的开口并在腔内形成电子发射元件 。 本发明将第一电位施加到第一导电层,使得第一电位被赋予形成在空腔内的电子发射元件。 本发明还将第二电位施加到第二导电层,使得第二电位被赋予电子发射材料的封闭层。 在本实施例中,第二电位包括开路电位。 然后,本发明将场发射器结构暴露于电化学蚀刻剂,其中电化学蚀刻剂蚀刻以开路电位偏置的电子发射材料。 在这样做时,电子发射材料层从第二导电层上方去除,而不蚀刻在腔内形成的电子发射元件。