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    • 2. 发明授权
    • Multi-step removal of excess emitter material in fabricating
electron-emitting device
    • 在制造电子发射器件时多步去除过量的发射极材料
    • US6027632A
    • 2000-02-22
    • US904967
    • 1997-07-30
    • N. Johan KnallDuane A. HavenRoger W. BartonWilliam H. CreelChristopher J. Spindt
    • N. Johan KnallDuane A. HavenRoger W. BartonWilliam H. CreelChristopher J. Spindt
    • B81C1/00C25F3/14H01J9/02C25F3/02
    • H01J9/025
    • Excess emitter material (52B) is removed in multiple steps during the fabrication of an electron-emitting device. A structure is initially provided in which a dielectric layer (44) overlies a non-insulating region (42), control electrodes (80 or 46/80) overlie the dielectric layer, openings (48/50) extend through the control electrodes and dielectric layer, electron-emissive elements (52A) formed with emitter material are situated in the openings, and an excess layer (52B) of the emitter material overlies the control electrodes and the dielectric layer. Portions of the excess emitter material overlying the dielectric layer in the spaces between the control electrodes are initially removed, preferably with etchant that directly attacks the emitter material. Portions (52C) of the excess emitter material overlying the control electrodes above the electron-emissive elements are subsequently removed to expose the electron-emissive elements.
    • 在制造电子发射器件期间,多个发射极材料(52B)被多个步骤去除。 首先提供一种结构,其中介电层(44)覆盖在非绝缘区域(42)上,控制电极(80或46/80)覆盖在电介质层上,开口(48/50)延伸穿过控制电极和电介质 由发射体材料形成的层,电子发射元件(52A)位于开口中,发射极材料的过剩层(52B)覆盖在控制电极和电介质层上。 最初除去在控制电极之间的空间中覆盖电介质层的多余发射体材料的部分,最好用直接攻击发射极材料的蚀刻剂。 随后去除覆盖电子发射元件上方的控制电极的过量发射体材料的部分(52℃)以露出电子发射元件。
    • 8. 发明授权
    • Fabrication of gated electron-emitting devices utilizing distributed particles to define gate openings, typically in combination with lift-off of excess emitter material
    • 使用分布式颗粒来限定栅极开口的门控电子发射器件的制造,通常结合多余的发射极材料的剥离
    • US06187603B1
    • 2001-02-13
    • US08660536
    • 1996-06-07
    • Duane A. HavenN. Johan KnallPaul N. LudwigJohn M. Macaulay
    • Duane A. HavenN. Johan KnallPaul N. LudwigJohn M. Macaulay
    • H01L2100
    • H01J9/025H01J2329/00
    • An electron-emitting device is fabricated by a process in which particles (46) are distributed over an initial structure. The particles are utilized in defining primary openings (52, 64, or 78) that extend through a primary layer (50A, 62A, or 72) provided over a gate layer (48A, 60A, or 60B) formed over an insulating layer (44) and in defining corresponding gate openings (54, 66, or 80) that extend through the gate layer. The insulating layer is etched through the primary and gate openings to form corresponding dielectric openings (56 or 68) through the insulating layer down to a lower non-insulating region (42). Electron-emissive elements (58A or 70A) are formed over the lower non-insulating region so that each electron-emissive element is at least partially situated in one dielectric opening. Formation of the electron-emissive elements, typically in the shape of cones, normally entails depositing emitter material over the primary layer, through the primary and gate openings, and into the dielectric openings and then removing the primary layer so as to remove any emitter material accumulated over the primary layer.
    • 通过其中颗粒(46)分布在初始结构上的过程制造电子发射器件。 这些颗粒用于限定主开口(52,64或78),其延伸穿过形成在绝缘层(44)上的栅极层(48A,60A或60B)上的初级层(50A,62A或72) )并且限定延伸穿过栅极层的对应的栅极开口(54,66或80)。 通过初级和栅极开口蚀刻绝缘层,以形成穿过绝缘层的相应电介质开口(56或68),直到下部非绝缘区域(42)。 电子发射元件(58A或70A)形成在下部非绝缘区域上,使得每个电子发射元件至少部分地位于一个电介质开口中。 电子发射元件的形成(通常为锥形)通常需要在初级层上通过初级和栅极开口沉积发射极材料,并将其沉积到电介质开口中,然后去除主层以除去任何发射体材料 累积在主层上。