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    • 5. 发明授权
    • High output semiconductor laser device utilizing a mesa-stripe optical
confinement region
    • 利用台面条状光限制区域的高输出半导体激光器件
    • US4602371A
    • 1986-07-22
    • US571578
    • 1984-01-17
    • Toshihiro KawanoTsukuru OhtoshiNaoki ChinoneTakashi KajimuraMichiharu Nakamura
    • Toshihiro KawanoTsukuru OhtoshiNaoki ChinoneTakashi KajimuraMichiharu Nakamura
    • H01S5/20H01S5/227H01S5/32H01S3/19
    • H01S5/227H01S5/2081H01S5/2275H01S5/3213
    • A semiconductor laser device is provided with an optical confinement region constituted by first, second, third and fourth semiconductor layers provided on the upper part of a predetermined semiconductor substrate in contact with each other successively. The first and fourth semiconductor layers are smaller in refractive index than the second and third semiconductor layers, and the third semiconductor layer is larger in refractive index than the second semiconductor layer. On the other hand, the second and fourth semiconductor layers are larger in forbidden bandwidth than the third semiconductor layer. At least the first and fourth semiconductor layers are opposite in conductivity type to each other. In addition to this, the optical confinement region is formed into a mesa-stripe, and both side walls of this mesa-stripe which are substantially parallel to the traveling direction of a laser beam are embedded with a fifth semiconductor layer. Also, the width of the second semiconductor layer in a section perpendicular to the traveling direction of the laser beam and in the direction parallel to a junction within the optical confinement region is made larger than that of the third semiconductor layer. Accordingly, by virtue of this structure, a large output is ensured by this semiconductor laser device.
    • 半导体激光装置设置有由第一,第二,第三和第四半导体层构成的光限制区域,该第一,第二,第三和第四半导体层依次相互接触地设置在预定半导体衬底的上部。 第一和第四半导体层的折射率小于第二和第三半导体层,并且第三半导体层的折射率比第二半导体层大。 另一方面,第二和第四半导体层的禁带宽度大于第三半导体层。 至少第一和第四半导体层的导电类型彼此相反。 除此之外,光限制区域形成为台面条状,并且基本上平行于激光束的行进方向的该台面条的两个侧壁都嵌有第五半导体层。 此外,第二半导体层在与激光束的行进方向垂直的部分的宽度以及与光限制区域内的结的平行方向的宽度大于第三半导体层的宽度。 因此,通过这种结构,通过该半导体激光器件确保了大的输出。
    • 7. 发明授权
    • Planar elongational viscosity measuring method and planar elongational viscosity measuring apparatus
    • 平面伸长粘度测量方法和平面伸长粘度测量仪
    • US07890275B2
    • 2011-02-15
    • US12161444
    • 2006-12-27
    • Tsutomu TakahashiMasataka ShirakashiToshihiro Kawano
    • Tsutomu TakahashiMasataka ShirakashiToshihiro Kawano
    • G01N11/00
    • G01N11/10G01N11/14
    • A planar elongational viscosity measuring method and apparatus which can advance analysis of planar elongational viscosities for high-viscosity and low-viscosity fluids. As a bomb-shell like bob 2 is pushed into a container 6, a non-Newtonian fluid 9 reaches a planar elongation state in a side space G, counterforce F applied to the bomb-shell like bob 2 at this time is measured, planar elongation stress σ is calculated using the counterforce F and conditions input by a user based on push-up force, the counterforce F, and the horizontal cross-sectional area of the side space G, and the planar elongation stress is divided by a planar elongation speed ε′, thereby acquiring a planar elongational viscosity ηPE. Accordingly, it becomes possible to acquire planar elongational viscosities of not only a high-viscosity non-Newtonian fluid, but also a low-viscosity non-Newtonian fluid which is not likely to be solidified, resulting in an advancement of analysis of planar elongational viscosities for high-viscosity and low-viscosity fluids.
    • 可以推进高粘度和低粘度流体的平面伸长粘度分析的平面伸长粘度测量方法和装置。 由于像鲍勃2的炸弹壳被推入容器6中,所以非牛顿流体9在侧面空间G中达到平面伸长状态,此时测量应用于弹壳2的反作用力F,平面 伸长应力 使用反力F和用户基于上推力,反作用力F和侧面空间G的水平横截面积输入的条件来计算,并且将平面延伸应力除以平面延伸速度&egr; ',从而获得平面伸长粘度和PE。 因此,可以获得不仅高粘度非牛顿流体的平面伸长粘度,而且获得不易凝固的低粘度非牛顿流体的平面伸长粘度,导致平面伸长粘度分析的进展 用于高粘度和低粘度流体。
    • 9. 发明申请
    • FLUID ANALYSIS METHOD AND FLUID ANALYSIS DEVICE
    • 流体分析方法和流体分析装置
    • US20100274504A1
    • 2010-10-28
    • US12161639
    • 2006-12-27
    • Tsutomu TakahashiMasataka ShirakashiToshihiro Kawano
    • Tsutomu TakahashiMasataka ShirakashiToshihiro Kawano
    • G01N11/10
    • G01N11/10G01N2011/0026G01N2203/0676
    • There is provided a fluid analysis method and its device which are capable of easily analyzing a normal stress difference of a low-viscosity fluid in addition to that of a high-viscosity fluid. A shearing fluidity is applied to a non-Newtonian fluid within a lateral-side gap by pushing a cylindrical bob into a container. At that time, reactive force applied to the cylindrical bob is measured. Then, by practicing an arithmetic process in a given form using the reactive force and each of conditions input by a user, the normal stress difference of the low-viscosity non-Newtonian fluid which is hard to form in a solid state can be certainly determined. Thus, with respect to the low-viscosity non-Newtonian fluid in addition to the high-viscosity non-Newtonian fluid, the normal stress difference can be easily analyzed.
    • 提供了一种流体分析方法及其装置,其能够容易地分析除了高粘度流体之外的低粘度流体的正常应力差。 通过将圆柱形鲍勃推入容器中,剪切流动性被施加到侧向间隙内的非牛顿流体。 此时,测量施加到圆筒形凸起的反作用力。 然后,通过使用反作用力和用户输入的条件以给定形式实施运算处理,可以肯定地确定难以在固态形成的低粘度非牛顿流体的法向应力差 。 因此,除了高粘度非牛顿流体之外,对于低粘度的非牛顿流体,可以容易地分析法向应力差。
    • 10. 发明申请
    • PLANAR ELONGATIONAL VISCOSITY MEASURING METHOD AND PLANAR ELONGATIONAL VISCOSITY MEASURING APPARATUS
    • 平面伸缩粘度测量方法和平面伸缩粘度测量装置
    • US20100228504A1
    • 2010-09-09
    • US12161444
    • 2006-12-27
    • Tsutomu TakahashiMasataka ShirakashiToshihiro Kawano
    • Tsutomu TakahashiMasataka ShirakashiToshihiro Kawano
    • G01N11/00
    • G01N11/10G01N11/14
    • A planar elongational viscosity measuring method and apparatus which can advance analysis of planar elongational viscosities for high-viscosity and low-viscosity fluids. As a bomb-shell like bob 2 is pushed into a container 6, a non-Newtonian fluid 9 reaches a planar elongation state in a side space G, counterforce F applied to the bomb-shell like bob 2 at this time is measured, planar elongation stress τ is calculated using the counterforce F and conditions input by a user based on push-up force, the counterforce F, and the horizontal cross-sectional area of the side space G, and the planar elongation stress is divided by a planar elongation speed ε′, thereby acquiring a planar elongational viscosity ηPE. Accordingly, it becomes possible to acquire planar elongational viscosities of not only a high-viscosity non-Newtonian fluid, but also a low-viscosity non-Newtonian fluid which is not likely to be solidified, resulting in an advancement of analysis of planar elongational viscosities for high-viscosity and low-viscosity fluids.
    • 可以推进高粘度和低粘度流体的平面伸长粘度分析的平面伸长粘度测量方法和装置。 由于像鲍勃2的炸弹壳被推入容器6中,所以非牛顿流体9在侧面空间G中达到平面伸长状态,此时测量应用于弹壳2的反作用力F,平面 使用反作用力F和用户根据上推力,反力F和侧面空间G的水平横截面面积输入的条件计算伸长应力τ,并将平面伸长应力除以平面伸长率 速度“,从而获得平面伸长粘度和PE。 因此,可以获得不仅高粘度非牛顿流体的平面伸长粘度,而且获得不易凝固的低粘度非牛顿流体的平面伸长粘度,导致平面伸长粘度分析的进展 用于高粘度和低粘度流体。