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    • 4. 发明申请
    • TEMPERATURE COMPENSATION CIRCUIT
    • 温度补偿电路
    • US20100176869A1
    • 2010-07-15
    • US12686613
    • 2010-01-13
    • Koji HorieMinoru Nagata
    • Koji HorieMinoru Nagata
    • H01L37/00
    • H03F1/302H03F3/195H03F3/245H03F2200/447H03F2200/451
    • A temperature compensation circuit according to an embodiment of the present invention includes a bias circuit configured to output a bias current having a current value increasing in proportion to an absolute temperature in a low-temperature region in which a temperature is lower than a predetermined temperature, and having a greater current value than the current value proportional to the absolute temperature in a high-temperature region in which the temperature is equal to or greater than the predetermined temperature, and a transistor having a control terminal supplied with the bias current. The bias circuit includes a first current generating circuit configured to generate a first current increasing in proportion to the absolute temperature, a second current generating circuit configured to generate a second current that does not flow in the low-temperature region and flows in the high-temperature region, and a control circuit configured to control the second current and having a connection terminal capable of being connected with an external resistor for adjusting a magnitude of the second current, and is configured to generate a third current by adding the first current to the second current, and output the bias current depending on or equal to the third current.
    • 根据本发明实施例的温度补偿电路包括:偏置电路,被配置为输出与温度低于预定温度的低温区域中的绝对温度成比例地增加的电流值的偏置电流, 并且具有比在温度等于或大于预定温度的高温区域中与绝对温度成比例的电流值的电流值更大的电流值,以及具有提供偏置电流的控制端子的晶体管。 偏置电路包括:第一电流产生电路,被配置为产生与绝对温度成比例的第一电流;第二电流产生电路,被配置为产生不在低温区域中流动并在高温区域中流动的第二电流; 温度区域和控制电路,被配置为控制第二电流并具有能够与外部电阻器连接的连接端子,用于调整第二电流的大小,并且被配置为通过将第一电流加到第一电流中来产生第三电流 并且根据或等于第三电流输出偏置电流。
    • 7. 发明授权
    • Threshold voltage fluctuation compensation circuit for FETS
    • FETS的阈值电压波动补偿电路
    • US4857769A
    • 1989-08-15
    • US143385
    • 1988-01-13
    • Nobuo KoteraKiichi YamashitaTaizo KinoshitaHirotoshi TanakaSatoshi TanakaMinoru Nagata
    • Nobuo KoteraKiichi YamashitaTaizo KinoshitaHirotoshi TanakaSatoshi TanakaMinoru Nagata
    • H03K19/003
    • H03K19/00384
    • This invention relates to a threshold voltage detection circuit for detecting the threshold voltage of field effect transistors (FETs) and to a semiconductor circuit capable of a stable operation irrespective of the fluctuation of the threshold voltage by utilizing this threshold voltage detection circuit. The source-drain path of first FET is connected in series with that of second FET having substantially the same threshold voltage as that of the first FET and the conductances of these first and second FETs are set to a predetermined ratio to generate a voltage drop associated with the threshold voltage in the first FET. This voltage drop can be used for detecting the threshold voltage and for level-shifting. The output of the series connection of the first and second FETs is applied to the gate of a constant current FET having the same threshold voltage as that of the first and second FETs and the drain current of the constant current FET can thus be set irrespective of the fluctuation of the threshold voltage.
    • 本发明涉及一种阈值电压检测电路,用于通过利用该阈值电压检测电路来检测场效应晶体管(FET)的阈值电压和能够稳定工作的半导体电路,而与阈值电压的波动无关。 第一FET的源极 - 漏极路径与具有与第一FET基本相同的阈值电压的第二FET的源极 - 漏极路径串联连接,并且将这些第一和第二FET的电导设置为预定的比率以产生相关的电压降 与第一FET中的阈值电压。 该电压降可用于检测阈值电压和电平转换。 第一和第二FET的串联连接的输出被施加到具有与第一和第二FET相同的阈值电压的恒流FET的栅极,因此可以设定恒定电流FET的漏极电流,而不管 阈值电压的波动。
    • 9. 发明授权
    • Current mirror circuit
    • 电流镜电路
    • US08456227B2
    • 2013-06-04
    • US13046953
    • 2011-03-14
    • Kenichi HirashikiNorio HagiwaraTsutomu NakashimaMinoru Nagata
    • Kenichi HirashikiNorio HagiwaraTsutomu NakashimaMinoru Nagata
    • G05F1/10
    • G05F3/262
    • In one embodiment, a current mirror circuit includes first to fourth insulated gate field effect transistors (FETs), and a bias circuit. The gate electrodes of the first and second FETs are connected to each other. The source electrode of the third FET is connected to the drain electrode of the first FET, and the drain electrode of the third FET is connected to the gate electrodes of the first and second FETs and a current input terminal. The gate electrode of the fourth FET is connected to the gate electrode of the third FET, the source electrode of the fourth FET is connected to the drain electrode of the second FET, and the drain electrode of the fourth FET becomes a current output terminal. The bias circuit is configured to provide a bias voltage to the gate electrodes of the third and fourth FETs.
    • 在一个实施例中,电流镜电路包括第一至第四绝缘栅场效应晶体管(FET)和偏置电路。 第一和第二FET的栅电极彼此连接。 第三FET的源电极连接到第一FET的漏电极,第三FET的漏电极连接到第一和第二FET的栅电极以及电流输入端。 第四FET的栅电极与第三FET的栅电极连接,第四FET的源电极与第二FET的漏极连接,第四FET的漏极成为电流输出端。 偏置电路被配置为向第三和第四FET的栅电极提供偏置电压。
    • 10. 发明申请
    • CURRENT DETECTION CIRCUIT AND INFORMATION TERMINAL
    • 电流检测电路和信息终端
    • US20110234311A1
    • 2011-09-29
    • US13047000
    • 2011-03-14
    • Kenichi HirashikiMinoru Nagata
    • Kenichi HirashikiMinoru Nagata
    • H03H11/00
    • G01R19/0092
    • According to one embodiment, a current detection circuit is provided with: a NMOS transistor, whose control signal is given to a gate electrode, whose source electrode is connected to a ground line, and whose drain electrode is connected to an input/output terminal; a first PMOS transistor, in which the control signal is given to a gate electrode, and whose drain electrode is connected to the input/output terminal and the drain electrode of the NMOS transistor; and a second PMOS transistor, whose drain electrode is connected to the source electrode of the first PMOS transistor, and a first supply voltage is given to a source electrode. A detection section detects whether or not a current has changed at the input/output terminal from a change in current flowing through the second PMOS transistor.
    • 根据一个实施例,电流检测电路具有:NMOS晶体管,其控制信号被提供给栅电极,源电极连接到接地线,其漏电极连接到输入/输出端; 第一PMOS晶体管,其中控制信号被提供给栅电极,并且其漏电极连接到NMOS晶体管的输入/输出端子和漏电极; 以及第二PMOS晶体管,其漏极连接到第一PMOS晶体管的源电极,并且向源电极提供第一电源电压。 检测部分检测在流过第二PMOS晶体管的电流的变化中电流是否在输入/输出端子处改变。