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    • 5. 发明授权
    • Phase locked loop circuit having automatic range setting logic
    • 锁相环电路具有自动量程设定逻辑
    • US5764712A
    • 1998-06-09
    • US634504
    • 1996-04-18
    • Mark William BranstadPhilip Lynn LeichtyBrian Andrew Schuelke
    • Mark William BranstadPhilip Lynn LeichtyBrian Andrew Schuelke
    • H03L7/10H03L7/113
    • H03L7/10H03L7/113Y10S331/02
    • A method for setting a locking frequency operating range of the phase locked loop (PLL) circuit and a phase locked loop (PLL) circuit are provided with range select logic for detecting an unknown reference clock frequency and for setting a locking frequency operating range of the phase locked loop. First a bypass mode for the phase locked loop (PLL) circuit is set. An unknown reference clock frequency is applied to a first counter. A known oscillator clock frequency is applied to a second counter. The first and second counters are reset and a timeout value of the second counter is identified. A first counter count value is compared with precalculated constant values. A set of range bits are latched responsive to said compared values. Two consecutive sets of latched range bits are compared and the steps repeated until a match of two consecutive sets of latched range bits is identified. The matching latched range bits are applied to a programmable range select input of the phase locked loop (PLL) circuit.
    • 用于设置锁相环(PLL)电路和锁相环(PLL)电路的锁定频率工作范围的方法设置有用于检测未知参考时钟频率的范围选择逻辑,并且用于设置锁相环 锁相环。 首先设置锁相环(PLL)电路的旁路模式。 将未知的参考时钟频率应用于第一个计数器。 已知的振荡器时钟频率被施加到第二计数器。 第一和第二计数器被复位,并且识别出第二计数器的超时值。 将第一计数器计数值与预先计算的常数值进行比较。 响应于所述比较值而锁存一组范围位。 比较两个连续的锁存范围比特组,并重复步骤,直到两个连续的锁存范围比特组的匹配被识别。 匹配的锁存范围位被应用于锁相环(PLL)电路的可编程范围选择输入。
    • 6. 发明授权
    • Electronic device initialization with dynamic selection of access time for non-volatile memory
    • 电子设备初始化,动态选择非易失性存储器的访问时间
    • US06519716B1
    • 2003-02-11
    • US09400587
    • 1999-09-22
    • Mark William Branstad
    • Mark William Branstad
    • G06F1122
    • G11C29/028G06F11/2284G11C16/04G11C16/20G11C29/50G11C29/50012
    • A circuit arrangement and method of initializing an electronic device dynamically test a non-volatile memory prior to retrieving initialization program code to select an operational access time at which the initialization program code can be reliably retrieved from the non-volatile memory. Specifically, at least one test access is performed with the non-volatile memory to determine a satisfactory access time at which the non-volatile memory correctly processes the test access. Thereafter, initialization program code is retrieved from the non-volatile memory using an operational access time selected based upon the determined satisfactory access time. As such, through judicious selection of an appropriate operational access time, non-volatile memory devices having differing performance capabilities can be accessed in an optimal manner using the same memory control logic design, and without the need for specific customization or program code modifications.
    • 初始化电子设备的电路装置和方法在检索初始化程序代码之前动态测试非易失性存储器,以选择可以从非易失性存储器可靠地检索初始化程序代码的操作访问时间。 具体地,使用非易失性存储器执行至少一个测试访问以确定非易失性存储器正确处理测试访问的令人满意的访问时间。 此后,使用基于所确定的令人满意的访问时间选择的操作访问时间,从非易失性存储器检索初始化程序代码。 因此,通过适当地选择适当的操作访问时间,可以以最佳方式使用相同的存储器控​​制逻辑设计来访问具有不同性能能力的非易失性存储器件,并且不需要特定的定制或程序代码修改。