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1. 发明授权

US06271672B1 Biased BGA contactor probe tip 失效
标题翻译：偏置BGA接触器探针尖
公开(公告)号：US06271672B1
公开(公告)日：2001-08-07
申请号：US09140220
申请日：1998-08-26
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther
IPC分类号： G01R3106
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.
摘要翻译：一种弹簧探针，用于在具有定位在镜筒内的柱塞的电气装置上进行测试，并且包括位于所述镜筒内的与所述柱塞相邻的弹簧以对所述柱塞施加弹簧力。柱塞包括具有成角度的表面的接触端，用于接触电气装置以将侧向负载施加到筒体;以及接触端中的槽，用于在与电气装置接触时分开弹簧力。

2. 外观设计

USD400811S Test probe plunger tip 失效
公开(公告)号：USD400811S
公开(公告)日：1998-11-10
申请号：US79957
申请日：1997-11-21
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther
设计人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther

3. 发明授权

US5781023A Hollow plunger test probe 失效
标题翻译：空心柱塞试验探头
公开(公告)号：US5781023A
公开(公告)日：1998-07-14
申请号：US792658
申请日：1997-01-31
申请人： Mark A. Swart , Gordon A. Vinther , Byron C. Sanderson , Charles J. Johnston
发明人： Mark A. Swart , Gordon A. Vinther , Byron C. Sanderson , Charles J. Johnston
IPC分类号： G01R1/067 , G01R31/28 , G01R31/02
CPC分类号： G01R1/06722
摘要： A hollow plunger spring probe assembly for performing tests on an electrical device including a probe receptacle for receipt of the hollow plunger. The plunger includes a tip at one end of the plunger for contacting the electrical device and a spring positioned within the opening in the plunger between the tip and a receptacle post having a head portion extending into the plunger through a second end. The post is rigidly attached to the receptacle. The plunger includes an attachment mechanism for releasably attaching the plunger to the head portion of the post.
摘要翻译：一种用于在包括用于接收中空柱塞的探针插座的电气装置上进行测试的中空柱塞弹簧探针组件。柱塞包括在柱塞的一端处的用于接触电气装置的尖端和位于柱塞内的开口之间的弹簧，该弹簧位于尖端和插座柱之间，其具有通过第二端延伸到柱塞中的头部。该柱刚性地附接到容器。柱塞包括用于将柱塞可释放地附接到柱的头部的附接机构。

4. 发明授权

US06204680B1 Test socket 失效
标题翻译：测试插座
公开(公告)号：US06204680B1
公开(公告)日：2001-03-20
申请号：US09139543
申请日：1998-08-25
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant , Roy W. Green
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant , Roy W. Green
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
摘要翻译：一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。非导电推杆位于弹簧和柱塞的斜边之间，并且非导电帽位于负载板上方以用于高频测试信号。对于紧密间隔的测试位置，较薄的子板通过负载板上的孔与负载板电连接。然后将测试插座定位在子板上。

5. 发明授权

US5801544A Spring probe and method for biasing 失效
标题翻译：弹簧探头和偏置方法
公开(公告)号：US5801544A
公开(公告)日：1998-09-01
申请号：US783467
申请日：1997-01-16
申请人： Mark A. Swart , Gordon A. Vinther
发明人： Mark A. Swart , Gordon A. Vinther
IPC分类号： G01R1/067 , G01R31/02
CPC分类号： G01R1/06722
摘要： A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.
摘要翻译：用于对电气设备进行测试的弹簧式接触探头。探针包括细长的柱塞，其具有保持在筒内的凸形表面的端部。用于施加轴向载荷的弹簧定位在筒内，并且将尺寸设定为将一部分轴向力转化为侧面加载力的球定位在弹簧和柱塞的凸形表面之间。该弹簧具有紧紧缠绕的线圈，用于将球保持在枪管上。

6. 发明授权

US6084421A Test socket 失效
标题翻译：测试插座
公开(公告)号：US6084421A
公开(公告)日：2000-07-04
申请号：US44874
申请日：1998-03-20
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , G01R31/02 , H01L21/66 , H01L21/822 , H01L23/32 , H01L27/04 , H01R12/16 , H01R33/76
CPC分类号： G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger. Electrically conductive cylindrical eyelets or plated through holes are positioned within the holes in the load board to guide the travel of the socket plungers and to transfer the test signals from the socket plungers to the load board.
摘要翻译：一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。一个球定位在弹簧与柱塞的斜边之间，有助于偏压柱塞。导电圆柱形孔眼或电镀通孔位于负载板的孔内，以引导插座柱塞的行进，并将测试信号从插座柱塞传输到负载板。

7. 发明授权

US5898314A Translator fixture with force applying blind pins 失效
标题翻译：转换器夹具用力施加盲针
公开(公告)号：US5898314A
公开(公告)日：1999-04-27
申请号：US606593
申请日：1996-02-26
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R1/06 , G01R1/073 , G01R31/02 , H05K3/00 , H05K10/00
CPC分类号： G01R1/07371
摘要： A translator fixture for a printed circuit board tester has a pattern of test probes on a base upon which the translator fixture is mounted. The translator fixture includes a plurality of essentially parallel and vertically spaced apart rigid translator plates supported in a fixed position in the translator fixture. Selected patterns of holes are aligned in the translator plates for containing and supporting translator pins extending through the translator plates and for positioning the translator pins for contacting test points under pressure on a printed circuit board supported in an essentially horizontal position between the translator plates. The pins translate electrical test signals between the test points on the printed circuit board and the test probes on the base of the tester. The fixture includes a plurality of blind pins positioned in a top plate of the fixture for non-electrically applying a balancing force to the printed circuit board. The blind pins are positioned in blind holes in the top plate adjacent a surface of the printed circuit board at locations where no test points are located and opposite to a surface on the printed circuit board having the translator pins applying pressure to the test points.
摘要翻译：用于印刷电路板测试器的翻译夹具具有安装转换器夹具的底座上的测试探针的图案。翻译器固定装置包括多个基本上平行和垂直间隔开的刚性平移板，其被支撑在转动夹具中的固定位置。孔的选定图案在平移板中对准，用于容纳和支撑延伸穿过平移板的平移销，并且用于定位用于在支撑在平移板之间的基本水平位置的印刷电路板上的压力下接触测试点的平移销。引脚在印刷电路板上的测试点和测试仪基座上的测试探针之间转换电气测试信号。固定装置包括定位在固定装置的顶板中的多个盲针，用于对印刷电路板不施加平衡力。盲引脚定位在邻近印刷电路板的表面的顶板中的盲孔中，在没有测试点的位置处并且与印刷电路板上具有向测试点施加压力的印刷电路板上的表面相对的位置。

8. 发明授权

US5744948A Printed circuit board handling device 失效
标题翻译：印刷电路板处理装置
公开(公告)号：US5744948A
公开(公告)日：1998-04-28
申请号：US515455
申请日：1995-08-15
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07307
摘要： A test fixture assembly releasably retains a printed circuit board on a test fixture and facilitates transfer of the board to and removal of the board from the fixture during a sequential test operation in which circuit boards under test are held in a test position, tested by a printed circuit board test apparatus, removed from the test position, and unloaded from the fixture, followed by receiving further boards in sequence for testing. The test fixture includes conductive test pins aligned with circuits on the board to be tested, and at least one board retaining assembly mounted to the fixture. The board retaining assembly includes a board retaining device positioned adjacent a surface of the test fixture and affixed to a free end of an elongated support member rigidly connected to the fixture. The free end of the support member moves angularly in response to a lateral force applied by the edge of the board moving over a cam surface of the board retaining device and into releasable engagement with a retaining section of the device. The support member mounts the board retaining device in a first position releasably engaging an edge of the circuit board to firmly hold the board on the test fixture. A subsequent lateral force applied to the board retaining device moves the retaining section of the device to a second position released from engagement with the edge of the board to thereby facilitate removal of the board from the test fixture.
摘要翻译：测试夹具组件将印刷电路板可释放地保持在测试夹具上，并且有助于在连续测试操作期间将板传送到固定装置并将其从装置移除，其中被测电路板保持在测试位置，由印刷电路板测试装置，从测试位置移除，并从夹具中卸载，然后依次接收进一步的板进行测试。测试夹具包括与要测试的板上的电路对准的导电测试引脚，以及安装到固定装置上的至少一个板保持组件。板保持组件包括邻近测试夹具的表面定位并固定到刚性地连接到固定装置的细长支撑构件的自由端的板保持装置。支撑构件的自由端响应于由板的边缘施加的横向力在板保持装置的凸轮表面上移动并且与装置的保持部分可释放地接合而移动。支撑构件将板保持装置安装在可释放地接合电路板的边缘的第一位置，以将板牢固地保持在测试夹具上。施加到板保持装置的随后的横向力将装置的保持部分移动到与板的边缘接合脱离的第二位置，从而有助于将板从测试夹具移除。

9. 发明授权

US5557211A Vacuum test fixture for printed circuit boards 失效
标题翻译：印刷电路板真空测试夹具
公开(公告)号：US5557211A
公开(公告)日：1996-09-17
申请号：US462229
申请日：1995-06-05
申请人： Mary E. Ferrer , Gary F. St. Onge , Charles J. Johnston , Mark A. Swart
发明人： Mary E. Ferrer , Gary F. St. Onge , Charles J. Johnston , Mark A. Swart
IPC分类号： G01R31/02 , G01R1/073 , G01R31/28
CPC分类号： G01R1/07328
摘要： A test fixture for testing circuit boards has a vacuum chamber between a stationary probe plate and a movable top plate. Separate adjustable linear bearings located in quadrants of the fixture provide parallel alignment between the top plate and the probe plate. A continuous vacuum seal between the probe plate and top plate bypasses the bearings so the bearings are outside the vacuum area. Spring loaded test probes in the probe plate extend through holes in the top plate for access to a circuit board under test. The probes contact the board when the top plate moves down toward the probes under a vacuum. The top plate is secured to the probe plate by separate quick-release latch pins extending through the linear bearings. The moving top plate carries fixed tooling pins for mounting the board to the top plate. Movable bearing blocks support the bearings. The top plate is movable for aligning the board with the test probes. The top plate, latch pins, bearings and bearing blocks are movable as a unit relative to the probe plate. After the top plate is aligned with the probes to compensate for art shift among circuit board lots, the quick-release latches are engaged to retain the alignment. The latches can comprise part of a guide post assembly for guiding vertical travel of the top plate during vacuum cycling of the test fixture. An optical alignment system in combination with the movable bearings provides a quick and easy means of aligning the board and the probes with extremely high accuracy.
摘要翻译：用于测试电路板的测试夹具在固定探针板和可移动顶板之间具有真空室。位于夹具象限中的可分离的可调直线轴承提供顶板和探针板之间的平行对准。探头板和顶板之间的连续真空密封件绕过轴承，因此轴承位于真空区域之外。探针板中的弹簧加载的测试探针延伸穿过顶板中的孔，用于进入被测电路板。当顶板在真空下向下移动探针时，探针接触板。顶板通过延伸穿过直线轴承的单独的快速释放闩锁销固定到探针板上。移动的顶板承载用于将板安装到顶板的固定工具销。可移动轴承座支撑轴承。顶板可移动以使板与测试探针对准。顶板，闩锁销，轴承和轴承座可作为相对于探针板的单元移动。在顶板与探针对准以补偿电路板批次之间的技术偏移之后，快速释放闩锁被接合以保持对准。闩锁可以包括用于在测试夹具的真空循环期间引导顶板的垂直行进的导柱组件的一部分。与可移动轴承结合的光学对准系统提供了一种快速且简便的方法，可以极高的精度对准电路板和探头。

10. 发明申请

US20110175636A1 TERMINAL FOR FLAT TEST PROBE 有权
标题翻译：平板测试探头终端
公开(公告)号：US20110175636A1
公开(公告)日：2011-07-21
申请号：US12968023
申请日：2010-12-14
申请人： Mark A. Swart , Kenneth R. Snyder
发明人： Mark A. Swart , Kenneth R. Snyder
IPC分类号： G01R1/067
CPC分类号： G01R1/06722 , G01R1/07371 , H01R13/2421 , H01R2201/20
摘要： A terminal end for a flat test probe having tapered cam surfaces providing a lead-in angle on the tail of the terminal end which extend to a sharp rear angle to engage detents or projections within a receptacle. The tapered cam surfaces and shape rear angles allow the probe to be inserted into the receptacle with minimal force to retain the flat test probe within the receptacle.
摘要翻译：用于具有锥形凸轮表面的平坦测试探针的终端，其在终端的尾部上提供引入角度，其延伸到锐利的后角以接合容器内的棘爪或突起。锥形凸轮表面和形状后角允许探针以最小的力插入到容器中，以将平面测试探针保持在容器内。

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