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    • 1. 发明授权
    • Test socket
    • 测试插座
    • US06204680B1
    • 2001-03-20
    • US09139543
    • 1998-08-25
    • Mark A. SwartCharles J. JohnstonGordon A. VintherSteve B. SargeantRoy W. Green
    • Mark A. SwartCharles J. JohnstonGordon A. VintherSteve B. SargeantRoy W. Green
    • G01R3102
    • G01R1/06722G01R1/0483
    • A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
    • 一种用于集成电路封装的测试插座,其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔,并且在上壳体的基部中包括孔,以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内,位于插座柱塞下方,以提供弹簧力,以将插座柱塞向上朝向集成电路封装偏置。 非导电推杆位于弹簧和柱塞的斜边之间,并且非导电帽位于负载板上方以用于高频测试信号。 对于紧密间隔的测试位置,较薄的子板通过负载板上的孔与负载板电连接。 然后将测试插座定位在子板上。
    • 5. 发明授权
    • Test socket
    • 测试插座
    • US6084421A
    • 2000-07-04
    • US44874
    • 1998-03-20
    • Mark A. SwartCharles J. JohnstonGordon A. VintherSteve B. Sargeant
    • Mark A. SwartCharles J. JohnstonGordon A. VintherSteve B. Sargeant
    • G01R31/26G01R1/04G01R1/073G01R31/02H01L21/66H01L21/822H01L23/32H01L27/04H01R12/16H01R33/76
    • G01R1/0483
    • A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger. Electrically conductive cylindrical eyelets or plated through holes are positioned within the holes in the load board to guide the travel of the socket plungers and to transfer the test signals from the socket plungers to the load board.
    • 一种用于集成电路封装的测试插座,其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔,并且在上壳体的基部中包括孔,以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内,位于插座柱塞下方,以提供弹簧力,以将插座柱塞向上朝向集成电路封装偏置。 一个球定位在弹簧与柱塞的斜边之间,有助于偏压柱塞。 导电圆柱形孔眼或电镀通孔位于负载板的孔内,以引导插座柱塞的行进,并将测试信号从插座柱塞传输到负载板。
    • 7. 发明授权
    • Self-retained spring probe
    • 自保持弹簧探头
    • US06462567B1
    • 2002-10-08
    • US09614422
    • 2000-07-12
    • Gordon A. VintherCharles J. JohnstonScott D. ChabineauBrian L. Crisp
    • Gordon A. VintherCharles J. JohnstonScott D. ChabineauBrian L. Crisp
    • G01R3102
    • G01R1/06722G01R1/06733
    • An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact component is in contact with the first contact component. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.
    • 提供外部弹簧探针,其具有相对于彼此延伸和压缩的第一部分和第二部分。 第一部分由一端的尖端和与尖端相对的第一接触部件组成。 凸缘在尖端和第一接触部件之间径向向外延伸。 第二部分包括在一端的尖端和与尖端相对的第二接触部件。 第二接触部件与第一接触部件接触。 凸缘在第二部分尖端和第二接触部件之间径向向外延伸。 弹簧被夹在围绕两个接触部件的两个凸缘之间。 第一和第二接触部件在压缩和延伸两部分期间保持彼此接触。
    • 8. 发明授权
    • Self-closing spring probe
    • 自闭式弹簧探头
    • US06396293B1
    • 2002-05-28
    • US09253320
    • 1999-02-18
    • Gordon A. VintherScott D. ChabineauCharles J. Johnston
    • Gordon A. VintherScott D. ChabineauCharles J. Johnston
    • G01R3102
    • G01R1/06722
    • An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact tip is in contact with the first contact tip. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.
    • 提供外部弹簧探针,其具有相对于彼此延伸和压缩的第一部分和第二部分。 第一部分由一端的尖端和与尖端相对的第一接触部件组成。 凸缘在尖端和第一接触部件之间径向向外延伸。 第二部分包括在一端的尖端和与尖端相对的第二接触部件。 第二接触尖端与第一接触尖端接触。 凸缘在第二部分尖端和第二接触部件之间径向向外延伸。 弹簧被夹在围绕两个接触部件的两个凸缘之间。 第一和第二接触部件在压缩和延伸两部分期间保持彼此接触。
    • 10. 发明授权
    • Compliant electrical contact assembly
    • 符合电气接触组件
    • US07126062B1
    • 2006-10-24
    • US11390002
    • 2006-03-27
    • Gordon A. VintherSergio Diaz
    • Gordon A. VintherSergio Diaz
    • H05K1/16H05K1/11
    • G01R1/06716G01R1/06733H01R13/2414H01R13/2421H01R13/33
    • A compliant electrical contact assembly for temporarily interfacing two electrical devices. The assembly includes a contact having loops with axes forming with a closed coil with opposed contact points. The axes is angled from the direction of the compression force holding the assembly sandwiched between the electrical devices. The electrically shorted loops of the coil slide on the surfaces of one another as the compression force is applied, providing compliance. The contact can be made extremely small such that pitches in the micrometer range can be achieved with very low inductance values. The contact is installed in a through aperture in a dielectric panel such that the contact points extend from opposed openings of the aperture. Optionally, the aperture is filled with a compliant, conductive elastomer.
    • 用于临时连接两个电气设备的兼容电接触组件。 该组件包括具有环的接触件,其轴线形成有具有相对接触点的闭合线圈。 轴线夹持夹在电气设备之间的组件的压缩方向成角度。 当施加压缩力时,线圈的电短路环在彼此的表面上滑动,提供顺应性。 可以使接触极小,使得可以以非常低的电感值实现微米范围的间距。 接触件安装在电介质面板的通孔中,使得接触点从孔的相对的开口延伸。 可选地,孔被柔顺导电弹性体填充。