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1. 发明授权

US06204680B1 Test socket 失效
标题翻译：测试插座
公开(公告)号：US06204680B1
公开(公告)日：2001-03-20
申请号：US09139543
申请日：1998-08-25
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant , Roy W. Green
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant , Roy W. Green
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
摘要翻译：一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。非导电推杆位于弹簧和柱塞的斜边之间，并且非导电帽位于负载板上方以用于高频测试信号。对于紧密间隔的测试位置，较薄的子板通过负载板上的孔与负载板电连接。然后将测试插座定位在子板上。

2. 发明授权

US06271672B1 Biased BGA contactor probe tip 失效
标题翻译：偏置BGA接触器探针尖
公开(公告)号：US06271672B1
公开(公告)日：2001-08-07
申请号：US09140220
申请日：1998-08-26
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther
IPC分类号： G01R3106
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.
摘要翻译：一种弹簧探针，用于在具有定位在镜筒内的柱塞的电气装置上进行测试，并且包括位于所述镜筒内的与所述柱塞相邻的弹簧以对所述柱塞施加弹簧力。柱塞包括具有成角度的表面的接触端，用于接触电气装置以将侧向负载施加到筒体;以及接触端中的槽，用于在与电气装置接触时分开弹簧力。

3. 外观设计

USD400811S Test probe plunger tip 失效
公开(公告)号：USD400811S
公开(公告)日：1998-11-10
申请号：US79957
申请日：1997-11-21
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther
设计人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther

4. 发明授权

US5781023A Hollow plunger test probe 失效
标题翻译：空心柱塞试验探头
公开(公告)号：US5781023A
公开(公告)日：1998-07-14
申请号：US792658
申请日：1997-01-31
申请人： Mark A. Swart , Gordon A. Vinther , Byron C. Sanderson , Charles J. Johnston
发明人： Mark A. Swart , Gordon A. Vinther , Byron C. Sanderson , Charles J. Johnston
IPC分类号： G01R1/067 , G01R31/28 , G01R31/02
CPC分类号： G01R1/06722
摘要： A hollow plunger spring probe assembly for performing tests on an electrical device including a probe receptacle for receipt of the hollow plunger. The plunger includes a tip at one end of the plunger for contacting the electrical device and a spring positioned within the opening in the plunger between the tip and a receptacle post having a head portion extending into the plunger through a second end. The post is rigidly attached to the receptacle. The plunger includes an attachment mechanism for releasably attaching the plunger to the head portion of the post.
摘要翻译：一种用于在包括用于接收中空柱塞的探针插座的电气装置上进行测试的中空柱塞弹簧探针组件。柱塞包括在柱塞的一端处的用于接触电气装置的尖端和位于柱塞内的开口之间的弹簧，该弹簧位于尖端和插座柱之间，其具有通过第二端延伸到柱塞中的头部。该柱刚性地附接到容器。柱塞包括用于将柱塞可释放地附接到柱的头部的附接机构。

5. 发明授权

US6084421A Test socket 失效
标题翻译：测试插座
公开(公告)号：US6084421A
公开(公告)日：2000-07-04
申请号：US44874
申请日：1998-03-20
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant
IPC分类号： G01R31/26 , G01R1/04 , G01R1/073 , G01R31/02 , H01L21/66 , H01L21/822 , H01L23/32 , H01L27/04 , H01R12/16 , H01R33/76
CPC分类号： G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A ball is positioned between the spring and a beveled edge of the plunger to aid in biasing the plunger. Electrically conductive cylindrical eyelets or plated through holes are positioned within the holes in the load board to guide the travel of the socket plungers and to transfer the test signals from the socket plungers to the load board.
摘要翻译：一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。一个球定位在弹簧与柱塞的斜边之间，有助于偏压柱塞。导电圆柱形孔眼或电镀通孔位于负载板的孔内，以引导插座柱塞的行进，并将测试信号从插座柱塞传输到负载板。

6. 发明授权

US5801544A Spring probe and method for biasing 失效
标题翻译：弹簧探头和偏置方法
公开(公告)号：US5801544A
公开(公告)日：1998-09-01
申请号：US783467
申请日：1997-01-16
申请人： Mark A. Swart , Gordon A. Vinther
发明人： Mark A. Swart , Gordon A. Vinther
IPC分类号： G01R1/067 , G01R31/02
CPC分类号： G01R1/06722
摘要： A spring-loaded contact probe for performing tests on an electrical device. The probe includes an elongated plunger having an end with a convex surface retained within a barrel. A spring for applying an axial load is positioned within the barrel and a ball sized to translate a portion of the axial force into a side loading force is positioned between the spring and the convex surface of the plunger. The spring has a tightly wound coil adjacent the ball for maintaining the ball against the barrel.
摘要翻译：用于对电气设备进行测试的弹簧式接触探头。探针包括细长的柱塞，其具有保持在筒内的凸形表面的端部。用于施加轴向载荷的弹簧定位在筒内，并且将尺寸设定为将一部分轴向力转化为侧面加载力的球定位在弹簧和柱塞的凸形表面之间。该弹簧具有紧紧缠绕的线圈，用于将球保持在枪管上。

7. 发明授权

US06462567B1 Self-retained spring probe 有权
标题翻译：自保持弹簧探头
公开(公告)号：US06462567B1
公开(公告)日：2002-10-08
申请号：US09614422
申请日：2000-07-12
申请人： Gordon A. Vinther , Charles J. Johnston , Scott D. Chabineau , Brian L. Crisp
发明人： Gordon A. Vinther , Charles J. Johnston , Scott D. Chabineau , Brian L. Crisp
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/06733
摘要： An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact component is in contact with the first contact component. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.
摘要翻译：提供外部弹簧探针，其具有相对于彼此延伸和压缩的第一部分和第二部分。第一部分由一端的尖端和与尖端相对的第一接触部件组成。凸缘在尖端和第一接触部件之间径向向外延伸。第二部分包括在一端的尖端和与尖端相对的第二接触部件。第二接触部件与第一接触部件接触。凸缘在第二部分尖端和第二接触部件之间径向向外延伸。弹簧被夹在围绕两个接触部件的两个凸缘之间。第一和第二接触部件在压缩和延伸两部分期间保持彼此接触。

8. 发明授权

US06396293B1 Self-closing spring probe 有权
标题翻译：自闭式弹簧探头
公开(公告)号：US06396293B1
公开(公告)日：2002-05-28
申请号：US09253320
申请日：1999-02-18
申请人： Gordon A. Vinther , Scott D. Chabineau , Charles J. Johnston
发明人： Gordon A. Vinther , Scott D. Chabineau , Charles J. Johnston
IPC分类号： G01R3102
CPC分类号： G01R1/06722
摘要： An external spring probe is provided having a first section and a second section which extend and compress relative to each other. The first section consists of a tip at one end and a first contact component opposite the tip. A flange extends radially outward between the tip and the first contact component. The second section consists of a tip at one end and a second contact component opposite the tip. The second contact tip is in contact with the first contact tip. A flange extends radially outward between the second section tip and the second contact component. A spring is sandwiched between the two flanges surrounding the two contact components. The first and second contact components remain in contact with each other during compression and extension of the two sections.
摘要翻译：提供外部弹簧探针，其具有相对于彼此延伸和压缩的第一部分和第二部分。第一部分由一端的尖端和与尖端相对的第一接触部件组成。凸缘在尖端和第一接触部件之间径向向外延伸。第二部分包括在一端的尖端和与尖端相对的第二接触部件。第二接触尖端与第一接触尖端接触。凸缘在第二部分尖端和第二接触部件之间径向向外延伸。弹簧被夹在围绕两个接触部件的两个凸缘之间。第一和第二接触部件在压缩和延伸两部分期间保持彼此接触。

9. 发明授权

US5704724A Sheet of paper clips with tablets 失效
标题翻译：平板电脑片夹
公开(公告)号：US5704724A
公开(公告)日：1998-01-06
申请号：US493329
申请日：1995-06-21
申请人： Robert G. Karlis , Gordon A. Vinther
发明人： Robert G. Karlis , Gordon A. Vinther
IPC分类号： B42F1/06 , B42F1/10 , B43M99/00 , B42F3/00
CPC分类号： B43M99/009 , B42F1/06 , B42F1/10 , Y10S206/82 , Y10T24/20 , Y10T24/205 , Y10T24/44786
摘要： For mounting in a notebook having outer covers and a spine, a sheet of clips comprises: a frame having inner and outer side rims and top and bottom cross rims; a set of paper clips integrally connected to the frame via the rims; each of the clips including an outer retainer, an inner retainer and a yoke connecting the outer retainer and the inner retainer; a rupturable junction extending between the frame and the yoke.
摘要翻译：为了安装在具有外盖和脊柱的笔记本中，一片夹具包括：具有内侧和外侧边缘以及顶部和底部交叉边缘的框架; 一组通过边缘整体连接到框架上的回形针; 每个夹具包括外保持器，内保持器和连接外保持器和内保持器的轭; 在框架和轭之间延伸的可破裂结。

10. 发明授权

US07126062B1 Compliant electrical contact assembly 有权
标题翻译：符合电气接触组件
公开(公告)号：US07126062B1
公开(公告)日：2006-10-24
申请号：US11390002
申请日：2006-03-27
申请人： Gordon A. Vinther , Sergio Diaz
发明人： Gordon A. Vinther , Sergio Diaz
IPC分类号： H05K1/16 , H05K1/11
CPC分类号： G01R1/06716 , G01R1/06733 , H01R13/2414 , H01R13/2421 , H01R13/33
摘要： A compliant electrical contact assembly for temporarily interfacing two electrical devices. The assembly includes a contact having loops with axes forming with a closed coil with opposed contact points. The axes is angled from the direction of the compression force holding the assembly sandwiched between the electrical devices. The electrically shorted loops of the coil slide on the surfaces of one another as the compression force is applied, providing compliance. The contact can be made extremely small such that pitches in the micrometer range can be achieved with very low inductance values. The contact is installed in a through aperture in a dielectric panel such that the contact points extend from opposed openings of the aperture. Optionally, the aperture is filled with a compliant, conductive elastomer.
摘要翻译：用于临时连接两个电气设备的兼容电接触组件。该组件包括具有环的接触件，其轴线形成有具有相对接触点的闭合线圈。轴线夹持夹在电气设备之间的组件的压缩方向成角度。当施加压缩力时，线圈的电短路环在彼此的表面上滑动，提供顺应性。可以使接触极小，使得可以以非常低的电感值实现微米范围的间距。接触件安装在电介质面板的通孔中，使得接触点从孔的相对的开口延伸。可选地，孔被柔顺导电弹性体填充。

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