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    • 1. 发明申请
    • Camera module and manufacturing method for such a camera module
    • 相机模块及其制造方法
    • US20070126912A1
    • 2007-06-07
    • US10577295
    • 2004-10-19
    • Leendert De BruinArjen Van Der Sijde
    • Leendert De BruinArjen Van Der Sijde
    • H04N5/225
    • H04N5/2254H01L31/0203H01L31/02325H04N5/2253
    • The invention relates to a camera module (10) which comprises a semiconductor housing (1) that contains a solid-state image sensor (2) with a radiation-sensitive surface area (3), and an optical element (4) located above the solid-state sensor (2) and which forms a shield against laterally scattered radiation, comprising a disk-shaped body with a primary radiation-opaque area and a secondary radiation-transparent area located within the primary area, of which a surface close to the sensor (2) is smaller than a surface more remote from the sensor (2). According to the invention the optical element (4) comprises at least one plate (4) of transparent material of which two sides are covered with a radiation-opaque layer (41,42) which is provided with an aperture, in which the aperture in the layer (41) close to the sensor (2) has a smaller surface than the aperture in the layer (42) located remote from the sensor (2), and in which the primary and secondary areas are defined respectively by portions of the at least one plate (40) sandwiched between the opaque layers (41,42) and the apertures therein. Such a module (10) is particularly well-suited to wafer-scale manufacturing. The invention also comprises a method for manufacturing such a module (10).
    • 本发明涉及一种相机模块(10),其包括含有具有辐射敏感表面积(3)的固态图像传感器(2)的半导体外壳(1)和位于 固体传感器(2),并且其形成防侧向散射辐射的屏蔽,包括具有主辐射不透明区域的盘形主体和位于主要区域内的次要辐射透明区域,其中接近 传感器(2)小于远离传感器(2)的表面。 根据本发明,光学元件(4)包括至少一个透明材料板(4),其两侧被不透光层(41,42)覆盖,所述不透光层设置有孔,其中孔 靠近传感器(2)的层(41)具有比位于远离传感器(2)的层(42)中的开口小的表面,并且其中主区域和次区域分别由位于 夹在不透明层(41,42)之间的至少一个板(40)和其中的孔。 这种模块(10)特别适用于晶片级制造。 本发明还包括一种用于制造这种模块(10)的方法。
    • 9. 发明授权
    • Method of forming a configuration of interconnections on a semiconductor
device having a high integration density
    • 在具有高积分密度的半导体器件上形成互连结构的方法
    • US4936950A
    • 1990-06-26
    • US339029
    • 1989-04-14
    • Trung T. DoanLeendert De BruinMalcolm K. GriefHarald Godon
    • Trung T. DoanLeendert De BruinMalcolm K. GriefHarald Godon
    • H01L21/3205H01L21/768H01L23/52
    • H01L21/76877
    • A method of the kind consisting in that a contact is obtained with an active zone (11) carried by a semiconductor substrate (10) by means of conductive contact studs (18a) located in the contact openings (16c) of an isolating layer (12) and in that then a metallic configuration of interconnections (22) is formed establishing the conductive connection with the conductive contact studs (18a). A separation layer (13) is provided between the isolating layer (12) and the conductive layer (18), which can be eliminated selectively with respect to the isolating layer (12). Thus, the isolating layer (12) retains its original flatness and the conductive contact studs (18a) have an upper level (20) exceeding slightly the level (21) of the isolating layer (12), thus favoring the contact between these contact studs (18a) and the metallic configuration of interconnections (22). Application in microcircuits having a high integration density.
    • 一种方法,其特征在于,通过位于隔离层(12)的接触开口(16c)中的导电接触柱(18a),通过由半导体衬底(10)承载的有源区(11)获得接触, ),然后形成互连(22)的金属构造,以与导电触头柱(18a)建立导电连接。 隔离层(13)设置在隔离层(12)和导电层(18)之间,可以相对于隔离层(12)选择性去除。 因此,绝缘层(12)保持其原始平坦度,并且导电触头柱(18a)具有超过隔离层(12)的水平面(21)的上部水平(20),因此有利于这些触头柱之间的接触 (18a)和互连(22)的金属构造。 应用于具有高集成密度的微电路。