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    • 4. 发明授权
    • System, apparatus, and method for executing a query including boolean and conditional expressions
    • 用于执行包括布尔和条件表达式的查询的系统,设备和方法
    • US09213759B2
    • 2015-12-15
    • US14006233
    • 2011-06-03
    • Shinsuke HamadaYasuhiro TaharaKouji Kimura
    • Shinsuke HamadaYasuhiro TaharaKouji Kimura
    • G06F17/30
    • G06F17/30678G06F17/30483G06F17/30542G06F17/30595
    • A DBMS is configured to identify a Boolean expression and conditional expressions from a search query, and to extract for each of the identified conditional expressions the value of a record ID conforming to a conditional expression. The DBMS is configured to change a conformity result value corresponding to the extracted record ID and conditional expression to a first value signifying conformity, in Boolean expression determination information, which is information that includes a determination set having a record ID value and a plurality of conformity result values respectively corresponding to a plurality of conditional expressions, and, on the basis of the Boolean expression, to perform logical operations on the plurality of conformity result values of a determination set, for each determination set in the Boolean expression determination information.
    • DBMS配置为从搜索查询中识别布尔表达式和条件表达式,并为每个识别的条件表达式提取符合条件表达式的记录ID的值。 DBMS被配置为在布尔表达式确定信息中将与提取的记录ID和条件表达式相对应的一致性结果值更改为表示一致性的第一值,该布尔表达式确定信息是包括具有记录ID值和多个符合性的确定集合的信息 分别对应于多个条件表达式的结果值,并且基于布尔表达式,针对布尔表达式确定信息中设置的每个确定,对确定集合的多个一致性结果值执行逻辑运算。
    • 8. 发明授权
    • Scanning electron microscope
    • 扫描电子显微镜
    • US06894277B2
    • 2005-05-17
    • US10615531
    • 2003-07-08
    • Hirotami KoikeKouji Kimura
    • Hirotami KoikeKouji Kimura
    • G01B15/00G01Q30/02H01J37/141H01J37/153H01J37/20H01J37/28H01L21/66
    • H01J37/28H01J2237/0492H01J2237/04922
    • A scanning electron microscope in the present invention includes an electron source 1 to radiate an electron beam, an objective lens system 9 to focus the radiated electron beam on a sample 10, scanning systems 5, 8 to scan the focused electron beam on the sample, secondary electron detection systems 3,4 to detect secondary electrons emitted from the sample 10, and a secondary electron image displaying system 13 to display a secondary electron image of the sample 10 with a secondary electron detection signal from the secondary electron detection system.The objective lens 9 is composed of first and second objective lenses 11, 12. The first objective lens 11 is mainly excited when using in a wide visual field mode and the second objective lens 12 is mainly excited when using in a high resolution mode.
    • 本发明的扫描电子显微镜包括:放射电子束的电子源1,将辐射电子束聚焦在样品10上的物镜系统9,扫描系统5,8扫描样品上的聚焦电子束, 用于检测从样品10发射的二次电子的二次电子检测系统3,4;以及二次电子图像显示系统13,用二次电子检测系统的二次电子检测信号显示样品10的二次电子图像。 物镜9由第一和第二物镜11,12组成。 当在宽视场模式下使用时,第一物镜11主要被激发,并且当以高分辨率模式使用时主要激发第二物镜12。