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    • 3. 发明授权
    • Alignment system for particle beam lithography
    • 粒子束光刻对准系统
    • US4370554A
    • 1983-01-25
    • US183118
    • 1980-09-02
    • Harald BohlenJohann GreschnerWerner KulckePeter Nehmiz
    • Harald BohlenJohann GreschnerWerner KulckePeter Nehmiz
    • H01J37/304H01L21/68G01N23/00
    • H01J37/3174B82Y10/00B82Y40/00H01J37/3045H01L21/682
    • The mutual alignment of mask and substrate patterns of a specific semiconductor structure are attained by use of a plurality of individual marks in a specific geometric position with respect to each other. By the arrangement of openings in the alignment pattern of the mask, the broad electron beam is split into a multitude of individual beams which interact with alignment marks on the substrate. The interaction is used to generate a coincidence signal. The signal to noise ratio of this arrangement is determined by the overall current and is comparable to that of a thin concentrated electron beam. Registration is effected in a small amount of time and the disadvantageous effects of the high current density used in the raster process are not a factor. In a preferred embodiment, the alignment pattern of the mask is a matrix with center spacings of openings increasing upon advance in two directions perpendicular to each other such that no distance can be represented by the sum of smaller distances. Alignment signals are provided by detecting either absorbed or reflected electrons. A plurality of detectors in the mask are used to detect the reflected electrons.
    • 通过使用相对于彼此的特定几何位置中的多个单独的标记来获得特定半导体结构的掩模和衬底图案的相互对准。 通过在掩模的对准图案中布置开口,宽电子束被分成与基板上的对准标记相互作用的多个单独的光束。 该交互用于产生符合信号。 该布置的信噪比由总电流确定,并且与薄的集中电子束的信噪比相当。 注册在少量时间内进行,并且在光栅处理中使用的高电流密度的不利影响不是因素。 在优选实施例中,掩模的对准图案是矩阵,其中开口的中心间隔在彼此垂直的两个方向上预先增加,使得距离可以由较小距离的和表示。 通过检测吸收或反射的电子来提供对准信号。 掩模中的多个检测器用于检测反射的电子。
    • 8. 发明授权
    • Ion generator for ionographic print heads
    • 离子发生器用于离子印刷头
    • US6061074A
    • 2000-05-09
    • US778982
    • 1997-01-06
    • Johann BarthaFrank DruschkeGerhard ElsnerJohann Greschner
    • Johann BarthaFrank DruschkeGerhard ElsnerJohann Greschner
    • B41J2/415H01J3/04H01J27/26
    • B41J2/415H01J27/26H01J3/04
    • An ion generator for the generation of a plasma is assembled from module subassemblies. The first subassembly includes a dielectric plate 1, on the first surface 1a of which are located a large number of first electrodes 3, and the second surface 1b of which is coated with a structured conductive layer 2. The second subassembly includes an aperatured spacer plate with a large number of dielectric spacers with a second electrode 5 on the side facing away from the dielectric plate 1. In joining the subassemblies together, the aperatured spacer plate is connected to the dielectric plate 1 at its first surface 1a in such a way that cavities 6 for accommodating plasma are formed by the first electrodes 3, parts of the first surface 1a of the dielectric plate 1 and the spacers 4 with the second electrodes 5. The first set of electrodes 3 shield the points where the subassemblies are bonded together from plasma in the cavities.
    • 用于产生等离子体的离子发生器由模块子组件组装。 第一子组件包括电介质板1,其第一表面1a位于大量的第一电极3上,其第二表面1b涂覆有结构化导电层2.第二子组件包括温度分隔板 具有大量的电介质隔离物,其在背离电介质板1的一侧具有第二电极5.在将子组件接合在一起时,高温隔离板在其第一表面1a处以电连接板1连接到电介质板1, 用于容纳等离子体的空腔6由电介质板1的第一表面1a的一部分和具有第二电极5的间隔物4的第一电极3形成。第一组电极3将组件结合在一起的点 空腔中的等离子体。