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    • 2. 发明授权
    • Semiconductor device having body contact through gate and method of fabricating the same
    • 具有通过栅极接触的半导体器件及其制造方法
    • US07473590B2
    • 2009-01-06
    • US11177447
    • 2005-07-07
    • Jae-Hun JeongHoon LimHoo-Sung Cho
    • Jae-Hun JeongHoon LimHoo-Sung Cho
    • H01L21/00
    • H01L21/76838H01L21/8221H01L27/0688
    • According to an embodiment of the invention, a lower transistor is formed on a semiconductor substrate, and an upper thin film transistor is formed on the lower transistor. A body contact plug is formed to penetrate an upper gate electrode of the upper thin film transistor and a body pattern, and to electrically connect with a lower gate electrode of the lower transistor. The body contact plug uses a contact hole to apply an electrical signal to the upper gate electrode of the upper thin film transistor, so additional volume is not necessary. Since the upper gate electrode is electrically connected to the body pattern through the body contact plug, the floating body effect of the upper thin film transistor can be improved. Therefore, a semiconductor device is provided with the high performance required to realize a highly-integrated semiconductor device.
    • 根据本发明的一个实施例,在半导体衬底上形成一个下部晶体管,并且在该较低晶体管上形成上部薄膜晶体管。 形成体接触插塞以穿透上薄膜晶体管的上栅电极和主体图案,并与下晶体管的下栅极电连接。 身体接触插头使用接触孔将电信号施加到上部薄膜晶体管的上部栅电极,因此不需要额外的体积。 由于上部栅电极通过主体接触插塞电连接到主体图案,所以可以提高上部薄膜晶体管的浮体效应。 因此,半导体器件具有实现高度集成的半导体器件所需的高性能。
    • 6. 发明授权
    • Methods of forming nand-type nonvolatile memory devices
    • 形成非易失性存储器件的方法
    • US07709323B2
    • 2010-05-04
    • US12474896
    • 2009-05-29
    • Hoo-Sung ChoSoon-Moon JungWon-Seok ChoJong-Hyuk KimJae-Hun JeongJae-Hoon Jang
    • Hoo-Sung ChoSoon-Moon JungWon-Seok ChoJong-Hyuk KimJae-Hun JeongJae-Hoon Jang
    • H01L21/336
    • H01L27/11524H01L27/0688H01L27/11551
    • Methods of forming a NAND-type nonvolatile memory device include: forming first common drains and first common sources alternatively in an active region which is defined in a semiconductor substrate and extends one direction, forming a first insulating layer covering an entire surface of the semiconductor substrate, patterning the first insulating layer to form seed contact holes which are arranged at regular distance and expose the active region, forming a seed contact structure filling each of the seed contact holes and a semiconductor layer disposed on the first insulating layer and contacting the seed contact structures, patterning the semiconductor layer to form a semiconductor pattern which extends in the one direction and is disposed over the active region, forming second common drains and second common sources disposed alternatively in the semiconductor pattern in the one direction, forming a second insulating layer covering an entire surface of the semiconductor substrate, forming a source line pattern continuously penetrating the second insulating layer, the semiconductor pattern and the first insulating layer, the source line pattern being connected with the first and second common sources, wherein a grain boundary of the semiconductor layer is positioned at a center between the one pair of seed contact structures adjacent to each other, and is positioned over the first common drain or the first common source.
    • 形成NAND型非易失性存储器件的方法包括:在半导体衬底中限定的有源区域中交替形成第一公共漏极和第一公共源,并延伸一个方向,形成覆盖半导体衬底的整个表面的第一绝缘层 图案化第一绝缘层以形成以规则距离布置的暴露有源区域的种子接触孔,形成填充每个种子接触孔的种子接触结构以及设置在第一绝缘层上并接触种子接触的半导体层 结构,图案化所述半导体层以形成在所述一个方向上延伸并设置在所述有源区上方的半导体图案,形成沿所述一个方向交替设置在所述半导体图案中的第二公共漏极和第二公共源,形成第二绝缘层覆盖层 半导体衬底的整个表面 使源极线图案连续地穿过第二绝缘层,半导体图案和第一绝缘层,源极线图案与第一和第二共用源连接,其中半导体层的晶界位于第二绝缘层之间的中心 一对种子接触结构彼此相邻,并且位于第一公共漏极或第一公共源的上方。
    • 7. 发明申请
    • METHODS OF FORMING NAND-TYPE NONVOLATILE MEMORY DEVICES
    • 形成NAND型非易失性存储器件的方法
    • US20090233405A1
    • 2009-09-17
    • US12474896
    • 2009-05-29
    • Hoo-Sung ChoSoon-Moon JungWon-Seok ChoJong-Hyuk KimJae-Hun JeongJae-Hoon Jang
    • Hoo-Sung ChoSoon-Moon JungWon-Seok ChoJong-Hyuk KimJae-Hun JeongJae-Hoon Jang
    • H01L21/336
    • H01L27/11524H01L27/0688H01L27/11551
    • Methods of forming a NAND-type nonvolatile memory device include: forming first common drains and first common sources alternatively in an active region which is defined in a semiconductor substrate and extends one direction, forming a first insulating layer covering an entire surface of the semiconductor substrate, patterning the first insulating layer to form seed contact holes which are arranged at regular distance and expose the active region, forming a seed contact structure filling each of the seed contact holes and a semiconductor layer disposed on the first insulating layer and contacting the seed contact structures, patterning the semiconductor layer to form a semiconductor pattern which extends in the one direction and is disposed over the active region, forming second common drains and second common sources disposed alternatively in the semiconductor pattern in the one direction, forming a second insulating layer covering an entire surface of the semiconductor substrate, forming a source line pattern continuously penetrating the second insulating layer, the semiconductor pattern and the first insulating layer, the source line pattern being connected with the first and second common sources, wherein a grain boundary of the semiconductor layer is positioned at a center between the one pair of seed contact structures adjacent to each other, and is positioned over the first common drain or the first common source.
    • 形成NAND型非易失性存储器件的方法包括:在半导体衬底中限定的有源区域中交替形成第一公共漏极和第一公共源,并延伸一个方向,形成覆盖半导体衬底的整个表面的第一绝缘层 图案化第一绝缘层以形成以规则距离布置的暴露有源区域的种子接触孔,形成填充每个种子接触孔的种子接触结构以及设置在第一绝缘层上并接触种子接触的半导体层 结构,图案化所述半导体层以形成在所述一个方向上延伸并设置在所述有源区上方的半导体图案,形成沿所述一个方向交替设置在所述半导体图案中的第二公共漏极和第二公共源,形成第二绝缘层覆盖层 半导体衬底的整个表面 使源极线图案连续地穿过第二绝缘层,半导体图案和第一绝缘层,源极线图案与第一和第二共用源连接,其中半导体层的晶界位于第二绝缘层之间的中心 一对种子接触结构彼此相邻,并且位于第一公共漏极或第一公共源的上方。