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1. 发明授权

US07047593B2 Vacuum cleaner capable of compressing dirt 失效
标题翻译：吸尘器能够压缩污垢
公开(公告)号：US07047593B2
公开(公告)日：2006-05-23
申请号：US10214203
申请日：2002-08-08
申请人： Hidenori Kitamura , Saburo Kajikawa , Masakazu Onda , Seiji Ishikawa , Yasunori Tsuzaki , Masashi Okushima , Tetsuharu Nomachi , Koji Yamamura , Hirokazu Nagaoka
发明人： Hidenori Kitamura , Saburo Kajikawa , Masakazu Onda , Seiji Ishikawa , Yasunori Tsuzaki , Masashi Okushima , Tetsuharu Nomachi , Koji Yamamura , Hirokazu Nagaoka
IPC分类号： A47L9/10
CPC分类号： A47L9/165 , A47L9/108 , A47L9/1658 , Y10S55/03
摘要： A vacuum cleaner includes a main body having an electric blower for generating a suction air flow, a dirt collecting case for centrifugally separating and collecting dirt, and a compression assembly for compressing dirt collected in the dirt collecting case to reduce a volume thereof. The dirt collecting case has a separation chamber for centrifugally separating dirt from the dirt containing air and a dirt collecting chamber in communication with the separation chamber for accumulating the dirt separated by the separation chamber. The compression assembly has a first air intake member provided in the separation chamber and communicating with the electric blower, a second air intake member provided in the dirt collecting chamber and communicating with the electric blower, a shielding plate for selectively opening the first and the second air intake member and an actuator for driving the shielding plate.
摘要翻译：真空吸尘器包括具有用于产生吸气流的电动鼓风机的主体，用于离心分离和收集污物的污物收集箱，以及用于压缩收集在污物收集箱中的污垢以减小其体积的压缩组件。污物收集箱具有分离室，用于将污物与含有污物的空气离心分离，并且与分离室连通的污物收集室用于积聚由分离室分离的污物。压缩组件具有设置在分离室中并与电动鼓风机连通的第一进气构件，设置在集尘室中并与电动鼓风机连通的第二进气构件，用于选择性地打开第一和第二进气件和用于驱动屏蔽板的致动器。

2. 发明授权

US08434363B2 Support member of vibrator 有权
标题翻译：支持振动器的成员
公开(公告)号：US08434363B2
公开(公告)日：2013-05-07
申请号：US12840619
申请日：2010-07-21
申请人： Seiji Ishikawa , Takayuki Kikuchi , Shigeki Hayashi
发明人： Seiji Ishikawa , Takayuki Kikuchi , Shigeki Hayashi
IPC分类号： G01C19/56 , H01L41/00
CPC分类号： G01C19/5621 , G01C19/5628 , G01C19/5783
摘要： The present invention provides, in a physical quantity measuring system using a vibrator, a supporting structure of a vibrator for reducing the zero-point temperature drift of detection signal. It is provided a supporting member for supporting a vibrator with bonding wires. The supporting member has a supporting plate with an opening formed therein to be positioned direct under a vibrator, and a bonding wire comprising a bonding end to be bonded with the vibrator, a fixed portion fixed on the supporting plate and a bent portion direct under the opening. A distance “L1” between the bent portion and a position where the bonding wire starts to protrude from the supporting plate is 10 percent or more of a distance “L2” of the bent portion and the bonding end.
摘要翻译：本发明在使用振动器的物理量测量系统中提供一种用于减小检测信号的零点温度漂移的振动器的支撑结构。设置有用于用键合线支撑振动器的支撑构件。支撑构件具有形成在其中的开口的支撑板，直接位于振动器的下方，并且接合线包括与振动器接合的接合端，固定在支撑板上的固定部分和直接在振动器下方的弯曲部分开放弯曲部和接合线从支撑板开始突出的位置之间的距离“L1”为弯曲部和接合端的距离“L2”的10％以上。

3. 发明申请

US20090262319A1 MASKLESS EXPOSURE METHOD 有权
标题翻译： MASKLESS曝光方法
公开(公告)号：US20090262319A1
公开(公告)日：2009-10-22
申请号：US12390687
申请日：2009-02-23
申请人： Hiroyasu Matsuura , Seiji Ishikawa , Tadamichi Wachi , Toshimasa Ishigaki
发明人： Hiroyasu Matsuura , Seiji Ishikawa , Tadamichi Wachi , Toshimasa Ishigaki
IPC分类号： G03B27/42
CPC分类号： G03F7/70791 , G03F7/70433
摘要： A maskless exposure method of drawing a circuit pattern includes: moving a substrate with respect to a projection optical system; scanning, by the projection optical system, the substrate in a first direction; shifting a scanning region in a second direction; scanning the substrate in the first direction so that an overlapping part is formed. A plurality of marks different from the circuit pattern are exposed in a vicinity of the overlapping part. The plurality of marks are a set of marks at least including two marks disposed on one side of the overlapping part and two marks disposed on another side of the overlapping part. Deviations between the pair of the scanning regions, an inclination of exposing light, and a yawing angle of a stage are analyzed by measuring deviations of distances among the plurality of marks. Calibration data are obtained from a result of the analyzing.
摘要翻译：绘制电路图案的无掩模曝光方法包括：相对于投影光学系统移动基板; 通过投影光学系统沿第一方向扫描基板; 沿第二方向移动扫描区域; 在第一方向扫描基板，从而形成重叠部分。与电路图案不同的多个标记在重叠部分附近露出。多个标记是至少包括设置在重叠部分的一侧上的两个标记和设置在重叠部分的另一侧上的两个标记的一组标记。通过测量多个标记之间的距离的偏差来分析一对扫描区域之间的偏差，曝光的倾斜度和舞台的偏航角度。校准数据是从分析结果中获得的。

4. 发明申请

US20090165909A1 PNEUMATIC TIRE 有权
标题翻译：气动轮胎
公开(公告)号：US20090165909A1
公开(公告)日：2009-07-02
申请号：US12295425
申请日：2007-03-30
申请人： Fumio Takahashi , Seiji Ishikawa
发明人： Fumio Takahashi , Seiji Ishikawa
IPC分类号： B60C11/13
CPC分类号： B60C11/0306 , B60C11/0318 , B60C11/0332 , B60C11/04
摘要： In a pneumatic tire provided on a groove surface with at least one main groove continuously extending in the circumferential direction of the tire, the air column resonance noise is effectively reduced without reducing the volume of the main groove, and the design flexibility is enhanced in consideration of the entire property of the tire. A pneumatic tire of the present invention is provided on a tread surface 1 with a main groove 2 continuously extending in the circumferential direction of the tire and a sub groove 4 having two ends open to the common main groove 2 and a portion between the ends deviously extending in a common land portion, and characterized in that the sub groove 4 is configured to extend to be entirely included in a ground contact area of the tread when the tire mounted to an applicable rim is inflated with the maximum air pressure and is postured to be applied by a load corresponding to 80% of a defined mass.
摘要翻译：在具有沿轮胎周向连续延伸的至少一个主槽的槽面上设置的充气轮胎中，在不减小主槽体积的情况下，有效地降低了气柱谐振噪声，考虑到设计灵活性的提高的轮胎的整个财产。本发明的充气轮胎设置在胎面1上，主槽2在轮胎的周向上连续延伸，而副槽4具有向公共主槽2敞开的两个端部和两端之间的一部分，在公共陆地部分延伸，其特征在于，当安装在适用的轮辋上的轮胎以最大的空气压力膨胀时，副槽4被构造成完全包括在胎面的接地区域中，并被贴合到通过对应于定义质量的80％的负载施加。

5. 发明授权

US07456554B2 Support member of vibrator 有权
标题翻译：支持振动器的成员
公开(公告)号：US07456554B2
公开(公告)日：2008-11-25
申请号：US11430531
申请日：2006-05-09
申请人： Seiji Ishikawa , Takayuki Kikuchi , Shigeki Hayashi
发明人： Seiji Ishikawa , Takayuki Kikuchi , Shigeki Hayashi
IPC分类号： H01L41/00
CPC分类号： G01C19/5621 , G01C19/5628 , G01C19/5783
摘要： The present invention provides, in a physical quantity measuring system using a vibrator, a supporting structure of a vibrator for reducing the zero-point temperature drift of detection signal. It is provided a supporting member 22 for supporting a vibrator 1A with bonding wires 26. The supporting member 22 has a supporting plate 40 with an opening 25 formed therein to be positioned direct under a vibrator 1A, and a bonding wire 26 comprising a bonding end 29 to be bonded with the vibrator 1A, a fixed portion 26a fixed on the supporting plate 40 and a bent portion 28 direct under the opening 25. A distance “L1” between the bent portion 28 and a position 39 where the bonding wire 26 starts to protrude from the supporting plate 40 is 10 percent or more of a distance “L2” of the bent portion 28 and the bonding end 29.
摘要翻译：本发明在使用振动器的物理量测量系统中提供一种用于减小检测信号的零点温度漂移的振动器的支撑结构。设置有用于用接合线26支撑振动器1A的支撑构件22。支撑构件22具有形成在其中的开口25的支撑板40，其直接位于振动器1A的下方，以及接合线26，其包括与振动器1A接合的接合端29，固定部26a固定在支撑板40上，弯曲部28直接位于开口25的下方。弯曲部28与接合线26从支撑板40开始突出的位置39之间的距离“L 1”为弯曲部28和接合端29的距离“L 2”的10％以上。

6. 发明申请

US20060267458A1 Support member of vibrator 有权
标题翻译：支持振动器的成员
公开(公告)号：US20060267458A1
公开(公告)日：2006-11-30
申请号：US11430531
申请日：2006-05-09
申请人： Seiji Ishikawa , Takayuki Kikuchi , Shigeki Hayashi
发明人： Seiji Ishikawa , Takayuki Kikuchi , Shigeki Hayashi
IPC分类号： H01L41/00
CPC分类号： G01C19/5621 , G01C19/5628 , G01C19/5783
摘要： The present invention provides, in a physical quantity measuring system using a vibrator, a supporting structure of a vibrator for reducing the zero-point temperature drift of detection signal. It is provided a supporting member 22 for supporting a vibrator 1A with bonding wires 26. The supporting member 22 has a supporting plate 40 with an opening 25 formed therein to be positioned direct under a vibrator 1A, and a bonding wire 26 comprising a bonding end 29 to be bonded with the vibrator 1A, a fixed portion 26a fixed on the supporting plate 40 and a bent portion 28 direct under the opening 25. A distance “L1” between the bent portion 28 and a position 39 where the bonding wire 26 starts to protrude from the supporting plate 40 is 10 percent or more of a distance “L2” of the bent portion 28 and the bonding end 29.
摘要翻译：本发明在使用振动器的物理量测量系统中提供一种用于减小检测信号的零点温度漂移的振动器的支撑结构。设置有用于用接合线26支撑振动器1A的支撑构件22。支撑构件22具有形成在其中的开口25的支撑板40，其直接位于振动器1A的下方，以及接合线26，其包括与振动器1A接合的接合端29，固定部26a固定在支撑板40上，弯曲部28直接位于开口25的下方。弯曲部28与接合线26从支撑板40开始突出的位置39之间的距离“L 1”为弯曲部28和接合端29的距离“L 2”的10％以上。

7. 发明授权

US06757621B2 Process management system 失效
标题翻译：流程管理系统
公开(公告)号：US06757621B2
公开(公告)日：2004-06-29
申请号：US10342871
申请日：2003-01-16
申请人： Fumio Mizuno , Seiji Isogai , Kenji Watanabe , Yasuhiro Yoshitake , Terushige Asakawa , Yuichi Ohyama , Hidekuni Sugimoto , Seiji Ishikawa , Masataka Shiba , Jun Nakazato , Makoto Ariga , Tetsuji Yokouchi , Toshimitsu Hamada , Ikuo Suzuki , Masami Ikota , Mari Nozoe , Isao Miyazaki , Yoshiharu Shigyo
发明人： Fumio Mizuno , Seiji Isogai , Kenji Watanabe , Yasuhiro Yoshitake , Terushige Asakawa , Yuichi Ohyama , Hidekuni Sugimoto , Seiji Ishikawa , Masataka Shiba , Jun Nakazato , Makoto Ariga , Tetsuji Yokouchi , Toshimitsu Hamada , Ikuo Suzuki , Masami Ikota , Mari Nozoe , Isao Miyazaki , Yoshiharu Shigyo
IPC分类号： H01L2166
CPC分类号： H01L22/20 , G01N21/9501 , G01R31/2894 , G01R33/06 , H01L2223/54466 , H01L2924/0002 , H01L2924/00
摘要： A process management system in accordance with the present invention includes inspection apparatuses for inspecting defects on a wafer, the inspection apparatuses being connected through a communication network, inspection information and image information obtained from these inspection apparatuses being collected to construct a data base and an image file, therein definition of defects is given by combinations of elements which characterize the defect based on the inspection information and the image information obtained from the inspection apparatuses. By giving definition of the defect, characteristics of the defect can be subdivided and known. Therefore, the cause of a defect can be studied.
摘要翻译：根据本发明的处理管理系统包括用于检查晶片上的缺陷的检查装置，通过通信网络连接的检查装置，从这些检查装置获得的检查信息和图像信息被收集以构建数据库和图像文件，其中缺陷的定义通过基于检查信息和从检查装置获得的图像信息来表征缺陷的元件的组合来给出。通过给出缺陷的定义，可以细分和知道缺陷的特征。因此，可以研究缺陷的原因。

8. 发明授权

US06628817B2 Inspection data analyzing system 失效
公开(公告)号：US06628817B2
公开(公告)日：2003-09-30
申请号：US09752674
申请日：2001-01-03
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

9. 发明授权

US06468639B2 Single-application polyimidosiloxane-based coating material and cured film 有权
标题翻译：单应用聚酰亚胺硅氧烷基涂料和固化膜
公开(公告)号：US06468639B2
公开(公告)日：2002-10-22
申请号：US09295883
申请日：1999-04-21
申请人： Seiji Ishikawa , Shigeru Yamamoto , Yoshiaki Watanabe
发明人： Seiji Ishikawa , Shigeru Yamamoto , Yoshiaki Watanabe
IPC分类号： B32B300
CPC分类号： H01L23/3185 , C09D179/08 , C09D183/10 , H01L23/293 , H01L2224/50 , Y10T428/24917 , Y10T428/251 , Y10T428/256 , Y10T428/258 , Y10T428/259 , Y10T428/31663 , Y10T428/31681 , Y10T428/31721 , C08L63/00 , C08L2666/14 , C08L2666/54
摘要： A single-application polyimidosiloxane coating material comprising a uniformly mixed solution composition of a polyimidosiloxane with an epoxy resin-reactive group in the molecule, an epoxy resin and a fine inorganic filler in a solvent. The coating material has satisfactory storage stability and printing properties, and its cured films also have satisfactory properties and allow single-application printing.
摘要翻译：在分子中包含聚酰亚胺硅氧烷与环氧树脂反应性基团的均匀混合溶液组合物，溶剂中的环氧树脂和细无机填料的单应用聚亚硅氧烷涂料。涂料具有令人满意的储存稳定性和印刷性能，其固化膜也具有令人满意的性能，并允许单次印刷。

10. 发明授权

US06330352B1 Inspection data analyzing system 失效
公开(公告)号：US06330352B1
公开(公告)日：2001-12-11
申请号：US09525527
申请日：2000-03-15
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

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