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1. 发明授权

US06529619B2 Inspection data analyzing system 失效
标题翻译：检验数据分析系统
公开(公告)号：US06529619B2
公开(公告)日：2003-03-04
申请号：US09893889
申请日：2001-06-29
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.
摘要翻译：本发明分别提供用于探测器和自动粒子检测机的数据分析台。并且在数据分析站中，以产品为基础描述芯片的配置的坐标与描述缺陷的位置的坐标相同。此外，该站提供确定每个缺陷属于哪个芯片的功能。这些数据分析站通过通信线连接。本发明能够基于芯片分析数据，从而能够掌握每个芯片上的缺陷引起的芯片与芯片的产品特性之间的关系。

2. 发明授权

US06339653B1 Inspection data analyzing system 失效
标题翻译：检验数据分析系统
公开(公告)号：US06339653B1
公开(公告)日：2002-01-15
申请号：US09523380
申请日：2000-03-10
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.
摘要翻译：本发明分别提供用于探测器和自动粒子检测机的数据分析台。并且，在数据分析站中，以产品为基础描述芯片的配置的坐标与描述缺陷的位置的坐标相同。此外，该站提供确定每个缺陷属于哪个芯片的功能。这些数据分析站通过通信线连接。本发明能够基于芯片分析数据，从而能够掌握每个芯片上的缺陷引起的芯片与芯片的产品特性之间的关系。

3. 发明授权

US06628817B2 Inspection data analyzing system 失效
公开(公告)号：US06628817B2
公开(公告)日：2003-09-30
申请号：US09752674
申请日：2001-01-03
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

4. 发明授权

US06330352B1 Inspection data analyzing system 失效
公开(公告)号：US06330352B1
公开(公告)日：2001-12-11
申请号：US09525527
申请日：2000-03-15
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

5. 发明授权

US06185322B2 Inspection system and method using separate processors for processing different information regarding a workpiece such as an electronic device 失效
标题翻译：检查系统和方法使用单独的处理器来处理关于诸如电子设备的工件的不同信息
公开(公告)号：US06185322B2
公开(公告)日：2001-02-06
申请号：US08958095
申请日：1997-10-27
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： G06K900
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002 , H01L2924/00
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.
摘要翻译：本发明分别提供用于探测器和自动粒子检测机的数据分析台。并且，在数据分析站中，以产品为基础描述芯片的配置的坐标与描述缺陷的位置的坐标相同。此外，该站提供确定每个缺陷属于哪个芯片的功能。这些数据分析站通过通信线连接。本发明能够基于芯片分析数据，从而能够掌握每个芯片上的缺陷引起的芯片与芯片的产品特性之间的关系。

6. 发明授权

US5841893A Inspection data analyzing system 失效
公开(公告)号：US5841893A
公开(公告)日：1998-11-24
申请号：US908550
申请日：1992-06-30
申请人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
发明人： Seiji Ishikawa , Masao Sakata , Jun Nakazato , Sadao Shimoyashiro , Hiroto Nagatomo , Yuzo Taniguchi , Osamu Satou , Tsutomu Okabe , Yuzaburo Sakamoto , Kimio Muramatsu , Kazuhiko Matsuoka , Taizo Hashimoto , Yuichi Ohyama , Yutaka Ebara , Isao Miyazaki , Shuichi Hanashima
IPC分类号： H01L21/66 , G01N21/88 , G01N21/956 , G06K9/00
CPC分类号： G01N21/88 , G01N21/956 , H01L22/20 , H01L2924/0002
摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

7. 发明授权

US06404911B2 Semiconductor failure analysis system 失效
标题翻译：半导体故障分析系统
公开(公告)号：US06404911B2
公开(公告)日：2002-06-11
申请号：US09731745
申请日：2000-12-08
申请人： Kazuko Ishihara , Seiji Ishikawa , Masao Sakata , Isao Miyazaki , Yoshiyuki Miyamoto , Jun Nakazato
发明人： Kazuko Ishihara , Seiji Ishikawa , Masao Sakata , Isao Miyazaki , Yoshiyuki Miyamoto , Jun Nakazato
IPC分类号： G06K900
CPC分类号： H01L22/20 , G01N21/88 , G01N21/956
摘要： A semiconductor failure analysis system and method therefor facilitated by a failure information collection unit for collection, by bit, failure information of a semiconductor, an inspection unit for examining relations between various types of inspection data obtained by inspection of the semiconductor and for examining relations between the inspection data and failure information, a storage unit for storing design information of the semiconductor, an analysis unit for analyzing the failure information from the failure information collection unit, from the inspection unit and design information stored in the storage unit, a display unit for displaying at least one of the result of analysis from the analysis unit and the failure information, a failure cause estimation unit for estimating a cause of the failure information, and a unit for feeding the estimated cause of the failure information back to a process in which the failure has occurred.
摘要翻译：一种半导体故障分析系统及其方法，由用于收集半导体的故障信息的故障信息收集单元，用于检查通过半导体检查获得的各种检查数据之间的关系的检查单元以及用于检查检查数据和故障信息，用于存储半导体的设计信息的存储单元，用于从故障信息收集单元分析故障信息的分析单元和存储在存储单元中的设计信息的显示单元，显示来自分析单元的分析结果和故障信息中的至少一个;故障原因估计单元，用于估计故障信息的原因;以及单元，用于将故障信息的估计原因反馈到其中发生故障。

8. 发明授权

US06185324B2 Semiconductor failure analysis system 失效
标题翻译：半导体故障分析系统
公开(公告)号：US06185324B2
公开(公告)日：2001-02-06
申请号：US08381490
申请日：1995-01-31
申请人： Kazuko Ishihara , Seiji Ishikawa , Masao Sakata , Isao Miyazaki , Yoshiyuki Miyamoto , Jun Nakazato
发明人： Kazuko Ishihara , Seiji Ishikawa , Masao Sakata , Isao Miyazaki , Yoshiyuki Miyamoto , Jun Nakazato
IPC分类号： G06K900
CPC分类号： H01L22/20 , G01N21/88 , G01N21/956
摘要： A semiconductor failure analysis system which includes a failure information collection unit for collecting, by bit, failure information concerned with a failure of a semiconductor, an inspection unit for examining relations between various types of inspection data obtained by inspection of the semiconductor and for examining relations between said inspection data and the failure information, a storage unit for storing information concerned with design of said semiconductor, an analysis unit for analyzing the failure information on the basis of output information output from the failure information collection unit, output information output from the inspection unit and design information stored in the storage unit, a display unit for displaying at least one of the result of analysis output from the analysis unit and the failure information, a failure cause estimation unit for estimating a cause of said failure information, and an unit for feeding the estimated cause of said failure information back to a process in which the failure has occurred.
摘要翻译：一种半导体故障分析系统，包括故障信息收集单元，用于逐位地收集与半导体故障有关的故障信息;检查单元，用于检查通过半导体检查获得的各种检查数据与检查关系之间的关系在所述检查数据和故障信息之间，存储单元，用于存储与所述半导体的设计有关的信息;分析单元，用于基于从故障信息收集单元输出的输出信息分析故障信息，从检查输出的输出信息存储在存储单元中的单元和设计信息，用于显示从分析单元输出的分析结果和故障信息中的至少一个的显示单元，用于估计所述故障信息的原因的故障原因估计单元，以及单元用于喂养所述故障inf的估计原因还原到发生故障的过程。

9. 发明授权

US5319580A Diagnostic support system and diagnostic system of equipment 失效
标题翻译：诊断支持系统和设备诊断系统
公开(公告)号：US5319580A
公开(公告)日：1994-06-07
申请号：US796677
申请日：1991-11-25
申请人： Masao Sakata , Takemasa Iwasaki , Tsutomu Tsuyama , Sadao Shimoyashiro
发明人： Masao Sakata , Takemasa Iwasaki , Tsutomu Tsuyama , Sadao Shimoyashiro
IPC分类号： G01M99/00 , G07C3/00 , G05B23/02
CPC分类号： G07C3/00 , Y10S706/912
摘要： An equipment is diagnosed by monitoring a career of operations of the equipment necessary for diagnosing the equipment and a condition of the equipment during the operation, monitoring information on equipment operations and information on variations in operation of the equipment having started operation for a data gathering purpose, selecting some of the gathered data, classifying the selected data based on rules, computing characteristics of variations in equipment state during the operation of the equipment and diagnosing the data on the basis of criterion references for the characteristics prescribed by the rules as an equipment diagnostic procedure.
摘要翻译：通过监视设备运行所需的设备的运行情况和设备的运行状况，设备运行的监视信息以及开始运行的数据收集设备的运行变化的信息来诊断设备。，选择一些收集的数据，根据规则对所选择的数据进行分类，在设备运行期间计算设备状态变化的特征，并根据规则规定的特征的标准参考来诊断数据作为设备诊断程序。

10. 发明申请

US20100332127A1 Lane Judgement Equipment and Navigation System 审中-公开
标题翻译：车道判断设备和导航系统
公开(公告)号：US20100332127A1
公开(公告)日：2010-12-30
申请号：US12826159
申请日：2010-06-29
申请人： Masato Imai , Masatoshi Hoshino , Masao Sakata
发明人： Masato Imai , Masatoshi Hoshino , Masao Sakata
IPC分类号： G01C21/26
CPC分类号： B60W30/12 , B60W40/072 , B60W40/076 , B60W2520/10 , B60W2550/141 , B60W2550/402
摘要： There is provided lane judgement equipment that is capable of quickly and accurately judging the lane that a vehicle is traveling in on a road with plural lanes in each direction. Lane judgement equipment 100 detects reference positions 402, 502 that are set in advance at an entrance to road B with plural lanes in each direction, and judges which of lanes B1-B3 of road B with plural lanes in each direction a vehicle 400 is traveling in based on entry distance L from those reference positions 402, 502 and on map information.
摘要翻译：提供车道判断装置，其能够快速准确地判断车辆在具有多个车道的道路上行进的车道。车道判断装置100检测在每个方向上具有多个车道的道路B的入口处预先设定的基准位置402,502，并且判断在车辆400行驶的各方向上具有多个车道的道路B的车道B1-B3 基于距离这些参考位置402,502的入口距离L以及地图信息。

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