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    • 4. 发明申请
    • Selectively conductive structure
    • 选择导电结构
    • US20060261800A1
    • 2006-11-23
    • US11355626
    • 2006-02-16
    • Harsh ChopraZonglu HuaMatthew SullivanJason Armstrong
    • Harsh ChopraZonglu HuaMatthew SullivanJason Armstrong
    • G01R13/04
    • G01R33/093B82Y25/00G01R33/09
    • The invention includes a conductor with a first side and a second side. The conductor may be sized to have a cross-section diameter substantially similar to a Fermi wavelength of electrons in the conductor, the cross-section diameter being taken substantially perpendicular to a primary direction in which current could flow through the conductor. The conductor size may be selected so that when a magnetic field less than a threshold value is applied to the conductor, the first side of the conductor has a first magnetic state and the second side of the conductor has a second magnetic state. However, when a magnetic field of sufficient strength is applied to the magnetic conductor the first side and the second side will be caused to have the same magnetic state. The material of the conductor may be selected from those for which magnetoresistance magnitude of the material oscillates as a function of the material's cross-sectional area, and the cross-sectional area of the conductor may be selected to correspond to a peak of the function.
    • 本发明包括具有第一侧和第二侧的导体。 导体的尺寸可以具有与导体中的电子的费米波长基本相似的截面直径,其截面直径基本上垂直于电流可以流过导体的主要方向。 可以选择导体尺寸,使得当小于阈值的磁场被施加到导体时,导体的第一侧具有第一磁状态,并且导体的第二侧具有第二磁状态。 然而,当向磁导体施加足够强度的磁场时,将使第一侧和第二侧具有相同的磁状态。 导体的材料可以选自材料的磁阻大小作为材料的横截面积的函数振荡的材料,并且导体的横截面面积可以被选择为对应于功能的峰值。
    • 6. 发明申请
    • Metrology Probe and Method of Configuring a Metrology Probe
    • 计量探头和配置计量探头的方法
    • US20120110707A1
    • 2012-05-03
    • US13322568
    • 2010-05-28
    • Harsh Deep ChopraJason N. ArmstrongZonglu Hua
    • Harsh Deep ChopraJason N. ArmstrongZonglu Hua
    • G01Q10/02
    • G01Q10/02G01Q10/04G01Q70/02
    • A metrology probe capable of measurements of a broad range of physical properties of individual samples of nano- or sub-nanometer dimensions is provided. The probe comprises a probe body, a substrate connected to the probe body, and a tip proximate the substrate. The probe further comprises a coarse piezoelectric actuator having an electrical input. The coarse piezo is configured to cause the tip and/or the substrate to move relative to each other when a first electrical signal is provided to the electrical input. The probe further comprises a low-pass filter in electrical communication with the electrical input of the coarse piezo. The probe further comprises a fine piezoelectric actuator having an electrical input configured to cause the tip and/or the substrate to move relative to each other when a second electrical signal is provided to the electrical input.
    • 提供了能够测量纳米或亚纳米尺寸的单个样品的宽范围物理性质的计量探针。 探针包括探针体,连接到探针体的基底和靠近基底的尖端。 探头还包括具有电输入的粗压电致动器。 粗电压被配置为当第一电信号被提供给电输入端时,尖端和/或衬底相对于彼此移动。 探头还包括与粗压电体的电输入端电连通的低通滤波器。 该探头还包括精细的压电致动器,其具有电输入,该电输入被配置成当向电输入提供第二电信号时使尖端和/或基板相对于彼此移动。
    • 8. 发明授权
    • Metrology probe and method of configuring a metrology probe
    • 测量探针和配置测量探针的方法
    • US08397311B2
    • 2013-03-12
    • US13322568
    • 2010-05-28
    • Harsh Deep ChopraJason N. ArmstrongZonglu Hua
    • Harsh Deep ChopraJason N. ArmstrongZonglu Hua
    • G01Q10/02G01Q10/04G01N23/00
    • G01Q10/02G01Q10/04G01Q70/02
    • A metrology probe capable of measurements of a broad range of physical properties of individual samples of nano- or sub-nanometer dimensions is provided. The probe comprises a probe body, a substrate connected to the probe body, and a tip proximate the substrate. The probe further comprises a coarse piezoelectric actuator having an electrical input. The coarse piezo is configured to cause the tip and/or the substrate to move relative to each other when a first electrical signal is provided to the electrical input. The probe further comprises a low-pass filter in electrical communication with the electrical input of the coarse piezo. The probe further comprises a fine piezoelectric actuator having an electrical input configured to cause the tip and/or the substrate to move relative to each other when a second electrical signal is provided to the electrical input.
    • 提供了能够测量纳米或亚纳米尺寸的单个样品的宽范围物理性质的计量探针。 探针包括探针体,连接到探针体的基底和靠近基底的尖端。 探头还包括具有电输入的粗压电致动器。 粗电压被配置为当第一电信号被提供给电输入端时,尖端和/或衬底相对于彼此移动。 探头还包括与粗压电体的电输入端电连通的低通滤波器。 该探头还包括精细的压电致动器,其具有电输入,该电输入被配置成当向电输入提供第二电信号时使尖端和/或基板相对于彼此移动。
    • 9. 发明授权
    • Selectively conductive structure wherein a magnetic conductor is sized to have a cross-section diameter similar to a Fermi wavelength of electrons
    • 选择导电结构,其中磁性导体的尺寸设计成具有与电子的费米波长相似的横截面直径
    • US07425826B2
    • 2008-09-16
    • US11355626
    • 2006-02-16
    • Harsh Deep ChopraZonglu HuaMatthew R. SullivanJason N. Armstrong
    • Harsh Deep ChopraZonglu HuaMatthew R. SullivanJason N. Armstrong
    • G01R33/02G01R33/12
    • G01R33/093B82Y25/00G01R33/09
    • The invention includes a conductor with a first side and a second side. The conductor may be sized to have a cross-section diameter substantially similar to a Fermi wavelength of electrons in the conductor, the cross-section diameter being taken substantially perpendicular to a primary direction in which current could flow through the conductor. The conductor size may be selected so that when a magnetic field less than a threshold value is applied to the conductor, the first side of the conductor has a first magnetic state and the second side of the conductor has a second magnetic state. However, when a magnetic field of sufficient strength is applied to the magnetic conductor the first side and the second side will be caused to have the same magnetic state. The material of the conductor may be selected from those for which magnetoresistance magnitude of the material oscillates as a function of the material's cross-sectional area, and the cross-sectional area of the conductor may be selected to correspond to a peak of the function.
    • 本发明包括具有第一侧和第二侧的导体。 导体的尺寸可以具有与导体中的电子的费米波长基本相似的截面直径,其截面直径基本上垂直于电流可以流过导体的主要方向。 可以选择导体尺寸,使得当小于阈值的磁场被施加到导体时,导体的第一侧具有第一磁状态,并且导体的第二侧具有第二磁状态。 然而,当向磁导体施加足够强度的磁场时,将使第一侧和第二侧具有相同的磁状态。 导体的材料可以选自材料的磁阻大小作为材料的横截面积的函数振荡的材料,并且导体的横截面面积可以被选择为对应于功能的峰值。