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1. 发明申请

US20070225958A1 Charge-based circuit analysis 失效
标题翻译：充电电路分析
公开(公告)号：US20070225958A1
公开(公告)日：2007-09-27
申请号：US11355342
申请日：2006-02-16
申请人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven Walker
发明人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven Walker
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A solution for analyzing a circuit using initial charge information is provided. In particular, one or more nodes in a design for the circuit is initialized with an initial charge. The charge can comprise a non-equilibrium charge, thereby simulating the history effect, the impact of a charged particle, electro-static discharge (ESD), and/or the like. Operation of the circuit is then simulated over the set of input cycles based on the initial charge(s). To this extent, the non-equilibrium initial condition solution enables the state of the circuit to be controlled and solves the initial system based on these values. This capability is very useful to condition the circuit at a worst-case, best-case, and/or the like, status. Further, in one embodiment of the invention, a set of equations are provided to implement the non-equilibrium initial charge analysis, which provide a more efficient initialization of the circuit than current solutions.
摘要翻译：提供了使用初始电荷信息分析电路的解决方案。特别地，用于电路的设计中的一个或多个节点用初始电荷初始化。电荷可以包括非平衡电荷，从而模拟历史效应，带电粒子的影响，静电放电（ESD）等。然后基于初始充电在该组输入周期上模拟电路的操作。在这种程度上，非平衡初始条件解决方案使得能够控制电路的状态并且基于这些值来解决初始系统。该功能对于在最坏情况，最佳情况和/或类似状态下调节电路非常有用。此外，在本发明的一个实施例中，提供一组方程以实现非平衡初始电荷分析，其提供电路比当前解决方案更有效的初始化。

2. 发明授权

US08290760B2 Charge-based circuit analysis 有权
标题翻译：充电电路分析
公开(公告)号：US08290760B2
公开(公告)日：2012-10-16
申请号：US12163318
申请日：2008-06-27
申请人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven G. Walker
发明人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven G. Walker
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A solution for analyzing a circuit using initial charge information is provided. In particular, one or more nodes in a design for the circuit is initialized with an initial charge. The charge can comprise a non-equilibrium charge, thereby simulating the history effect, the impact of a charged particle, electro-static discharge (ESD), and/or the like. Operation of the circuit is then simulated over a set of input cycles based on the initial charge(s). To this extent, the non-equilibrium initial condition solution enables the state of the circuit to be controlled and solves the initial system based on these values. This capability is very useful to condition the circuit at a worst-case, best-case, and/or the like, status. Further, in one embodiment of the invention, a set of equations are provided to implement the non-equilibrium initial charge analysis, which provide a more efficient initialization of the circuit than current solutions.
摘要翻译：提供了使用初始电荷信息分析电路的解决方案。特别地，用于电路的设计中的一个或多个节点用初始电荷初始化。电荷可以包括非平衡电荷，从而模拟历史效应，带电粒子的影响，静电放电（ESD）等。然后基于初始电荷在一组输入周期上模拟电路的操作。在这种程度上，非平衡初始条件解决方案使得能够控制电路的状态并且基于这些值来解决初始系统。该功能对于在最坏情况，最佳情况和/或类似状态下调节电路非常有用。此外，在本发明的一个实施例中，提供一组方程以实现非平衡初始电荷分析，其提供电路比当前解决方案更有效的初始化。

3. 发明申请

US20090192776A1 CHARGE-BASED CIRCUIT ANALYSIS 有权
标题翻译：基于费率的电路分析
公开(公告)号：US20090192776A1
公开(公告)日：2009-07-30
申请号：US12163318
申请日：2008-06-27
申请人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven G. Walker
发明人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven G. Walker
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A solution for analyzing a circuit using initial charge information is provided. In particular, one or more nodes in a design for the circuit is initialized with an initial charge. The charge can comprise a non-equilibrium charge, thereby simulating the history effect, the impact of a charged particle, electro-static discharge (ESD), and/or the like. Operation of the circuit is then simulated over a set of input cycles based on the initial charge(s). To this extent, the non-equilibrium initial condition solution enables the state of the circuit to be controlled and solves the initial system based on these values. This capability is very useful to condition the circuit at a worst-case, best-case, and/or the like, status. Further, in one embodiment of the invention, a set of equations are provided to implement the non-equilibrium initial charge analysis, which provide a more efficient initialization of the circuit than current solutions.
摘要翻译：提供了使用初始电荷信息分析电路的解决方案。特别地，用于电路的设计中的一个或多个节点用初始电荷初始化。电荷可以包括非平衡电荷，从而模拟历史效应，带电粒子的影响，静电放电（ESD）等。然后基于初始电荷在一组输入周期上模拟电路的操作。在这种程度上，非平衡初始条件解决方案使得能够控制电路的状态并且基于这些值来解决初始系统。该功能对于在最坏情况，最佳情况和/或类似状态下调节电路非常有用。此外，在本发明的一个实施例中，提供一组方程以实现非平衡初始电荷分析，其提供电路比当前解决方案更有效的初始化。

4. 发明授权

US07519526B2 Charge-based circuit analysis 失效
标题翻译：充电电路分析
公开(公告)号：US07519526B2
公开(公告)日：2009-04-14
申请号：US11355342
申请日：2006-02-16
申请人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven G. Walker
发明人： Emrah Acar , Bhavna Agrawal , Peter Feldmann , Ying Liu , Steven G. Walker
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A solution for analyzing a circuit using initial charge information is provided. In particular, one or more nodes in a design for the circuit is initialized with an initial charge. The charge can comprise a non-equilibrium charge, thereby simulating the history effect, the impact of a charged particle, electro-static discharge (ESD), and/or the like. Operation of the circuit is then simulated over the set of input cycles based on the initial charge(s). To this extent, the non-equilibrium initial condition solution enables the state of the circuit to be controlled and solves the initial system based on these values. This capability is very useful to condition the circuit at a worst-case, best-case, and/or the like, status. Further, in one embodiment of the invention, a set of equations are provided to implement the non-equilibrium initial charge analysis, which provide a more efficient initialization of the circuit than current solutions.
摘要翻译：提供了使用初始电荷信息分析电路的解决方案。特别地，用于电路的设计中的一个或多个节点用初始电荷初始化。电荷可以包括非平衡电荷，从而模拟历史效应，带电粒子的影响，静电放电（ESD）等。然后基于初始充电在该组输入周期上模拟电路的操作。在这种程度上，非平衡初始条件解决方案使得能够控制电路的状态并且基于这些值来解决初始系统。该功能对于在最坏情况，最佳情况和/或类似状态下调节电路非常有用。此外，在本发明的一个实施例中，提供一组方程以实现非平衡初始电荷分析，其提供电路比当前解决方案更有效的初始化。

5. 发明授权

US06842714B1 Method for determining the leakage power for an integrated circuit 失效
标题翻译：确定集成电路漏电功率的方法
公开(公告)号：US06842714B1
公开(公告)日：2005-01-11
申请号：US10646426
申请日：2003-08-22
申请人： Emrah Acar , Anirudh Devgan , Ying Liu , Sani R. Nassif , Haihua Su
发明人： Emrah Acar , Anirudh Devgan , Ying Liu , Sani R. Nassif , Haihua Su
IPC分类号： G01R31/30 , G01R21/00 , G06F15/00 , G06F19/00
CPC分类号： G01R31/3004 , G01R31/3008
摘要： A method for determining full chip leakage power first estimates leakage power and dynamic power for each circuit macro. The power supply voltage to each macro is first assumed to be nominal. The power dissipation for each macro is modeled as a current source whose value is the estimated power divided by the nominal power supply voltage. The power distribution network is modeled as a resistive grids. The thermal environment of the IC and its electronic package are modeled as multi dimensional grids of thermal elements. Algebraic multi-grid (AMG) methods are used to calculate updated circuit macro voltages and temperatures. The macro voltages and temperatures are updated and updated leakage and dynamic power dissipation are calculated. Iterations are continued until leakage power converges to a final value.
摘要翻译：用于确定全芯片泄漏功率的方法首先估计每个电路宏的泄漏功率和动态功率。首先假设每个宏的电源电压为标称值。每个宏的功耗被建模为电流源，其值是估计功率除以标称电源电压。配电网被建模为电阻网格。 IC及其电子封装的热环境被模拟为热元件的多维栅格。代数多网格（AMG）方法用于计算更新的电路宏观电压和温度。更新宏电压和温度，并计算泄漏和动态功耗。直到泄漏功率收敛到最终值为止，继续进行迭代。

6. 发明授权

US07441213B2 Method for testing the validity of initial-condition statements in circuit simulation, and correcting inconsistencies thereof 有权
标题翻译：用于测试电路仿真中初始条件语句的有效性的方法，以及校正其不一致性
公开(公告)号：US07441213B2
公开(公告)日：2008-10-21
申请号：US11307894
申请日：2006-02-27
申请人： Timothy S. Lehner , Richard D. Kimmel , Ali Sadigh , Emrah Acar , Ying Liu , Ivan L. Wemple
发明人： Timothy S. Lehner , Richard D. Kimmel , Ali Sadigh , Emrah Acar , Ying Liu , Ivan L. Wemple
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A method and a system for validating initial conditions (ICs) generally provided by a user when simulating a VLSI circuit are described. Inconsistent ICs sets are detected and replaced by consistent subsets thereof. The method selects the resistance and source values in a Norton or Thevenin circuit used to enforce the IC, and detects when specified ICs are inconsistent while preserving critical or fragile ICs when a two DC-pass approach is used. It further correlates the set of consistent ICs thus obtained with an equivalent circuit and simultaneously provides an input for future use. This allows a user to be notified and given a measure of how bad the inconsistencies are. Detecting inconsistencies is achieved either by measuring the holding current or by measuring the voltage drift if the two DC-pass approach is used.
摘要翻译：描述用于在模拟VLSI电路时通常由用户提供的用于验证初始条件（IC）的方法和系统。检测不一致的IC集合，并由其一致的子集替换。该方法选择用于强制IC的Norton或Thevenin电路中的电阻和源值，并在使用两个DC-pass方法时检测指定的IC是否不一致，同时保留关键或易碎IC。它进一步将由此获得的一组一致的IC与等效电路相关联，并同时提供用于将来使用的输入。这允许用户被通知，并给出了不一致的程度。通过测量保持电流或通过使用两个直流通路的方法测量电压漂移来实现检测不一致。

7. 发明申请

US20070204244A1 METHOD FOR TESTING THE VALIDITY OF INITIAL-CONDITION STATEMENTS IN CIRCUIT SIMULATION, AND CORRECTING INCONSISTENCIES THEREOF 有权
标题翻译：用于测试电路仿真中初始状态声明的有效性的方法，并对其中的失效进行校正
公开(公告)号：US20070204244A1
公开(公告)日：2007-08-30
申请号：US11307894
申请日：2006-02-27
申请人： Timothy Lehner , Richard Kimmel , Ali Sadigh , Emrah Acar , Ying Liu , Ivan Wemple
发明人： Timothy Lehner , Richard Kimmel , Ali Sadigh , Emrah Acar , Ying Liu , Ivan Wemple
IPC分类号： G06F17/50
CPC分类号： G06F17/5036
摘要： A method and a system for validating initial conditions (ICs) generally provided by a user when simulating a VLSI circuit are described. Inconsistent ICs sets are detected and replaced by consistent subsets thereof. The method selects the resistance and source values in a Norton or Thevenin circuit used to enforce the IC, and detects when specified ICs are inconsistent while preserving critical or fragile ICs when a two DC-pass approach is used. It further correlates the set of consistent ICs thus obtained with an equivalent circuit and simultaneously provides an input for future use. This allows a user to be notified and given a measure of how bad the inconsistencies are. Detecting inconsistencies is achieved either by measuring the holding current or by measuring the voltage drift if the two DC-pass approach is used.
摘要翻译：描述用于在模拟VLSI电路时通常由用户提供的用于验证初始条件（IC）的方法和系统。检测不一致的IC集合，并由其一致的子集替换。该方法选择用于强制IC的Norton或Thevenin电路中的电阻和源值，并在使用两个DC-pass方法时检测指定的IC是否不一致，同时保留关键或易碎的IC。它进一步将由此获得的一组一致的IC与等效电路相关联，并同时提供用于将来使用的输入。这允许用户被通知，并给出了不一致的程度。通过测量保持电流或通过使用两个直流通路的方法测量电压漂移来实现检测不一致。

8. 发明授权

US08635483B2 Dynamically tune power proxy architectures 有权
标题翻译：动态调优电源代理架构
公开(公告)号：US08635483B2
公开(公告)日：2014-01-21
申请号：US13079842
申请日：2011-04-05
申请人： Emrah Acar , Pradip Bose , Bishop C. Brock , Alper Buyuktosunoglu , Michael S. Floyd , Maria L. Pesantez , Gregory S. Still
发明人： Emrah Acar , Pradip Bose , Bishop C. Brock , Alper Buyuktosunoglu , Michael S. Floyd , Maria L. Pesantez , Gregory S. Still
IPC分类号： G06F1/00 , G06F1/26 , G06F15/00 , G01R21/00 , G01R19/00
CPC分类号： G06F1/3243 , Y02D10/152
摘要： A mechanism is provided for automatically tuning power proxy architectures. Based on the set of conditions related to an application being executed on a microprocessor core, a weight factor to use for each activity in a set of activities being monitored for the microprocessor core is identified, thereby forming a set of weight factors. A power usage estimate value is generated using the set of activities and the set of weight factors. A determination is made as to whether the power usage estimate value is greater than a power proxy threshold value identifying a maximum power usage for the microprocessor core. Responsive to the power usage estimate value being greater than the power proxy threshold value, a set of signals is sent to one or more on-chip actuators in the power proxy unit associated with the microprocessor core and a set of operational parameters associated with the component are adjusted.
摘要翻译：提供了一种自动调整电源代理架构的机制。基于与在微处理器核心上执行的应用有关的条件集合，识别用于针对微处理器核心的一组活动中的每个活动的权重因子，从而形成一组权重因子。使用一组活动和一组权重因子生成用电量估计值。确定功率使用估计值是否大于识别微处理器核的最大功率使用的功率代理阈值。响应于功率使用估计值大于功率代理阈值，一组信号被发送到与微处理器核心相关联的功率代理单元中的一个或多个片上致动器，以及与组件相关联的一组操作参数被调整。

9. 发明申请

US20130320340A1 CIRCUIT TECHNIQUE TO ELECTRICALLY CHARACTERIZE BLOCK MASK SHIFTS 有权
公开(公告)号：US20130320340A1
公开(公告)日：2013-12-05
申请号：US13488532
申请日：2012-06-05
申请人： Emrah Acar , Aditya Bansal , Dureseti Chidambarrao , Liang-Teck Pang , Amith Singhee
发明人： Emrah Acar , Aditya Bansal , Dureseti Chidambarrao , Liang-Teck Pang , Amith Singhee
IPC分类号： H01L21/66 , H01L23/50
CPC分类号： H01L22/34 , H01L22/14 , H01L27/0203 , H01L27/1104 , H01L2924/0002 , H01L2924/00
摘要： A physical test integrated circuit has a plurality of repeating circuit portions corresponding to an integrated circuit design. A first of the portions is fabricated with a nominal block mask location, and additional ones of the portions are deliberately fabricated with predetermined progressive increased offset of the block mask location from the nominal block mask location. For each of the portions, the difference in threshold voltage between a first field effect transistor and a second field effect transistor is determined. The predetermined progressive increased offset of the block mask location is in a direction from the first field effect transistor to the second field effect transistor. The block mask overlay tolerance is determined at a value of the progressive increased offset corresponding to an inflection of the difference in threshold voltage from a zero difference. A method for on-chip monitoring, and corresponding circuits, are also disclosed.

10. 发明授权

US08594989B2 Compensating for variations in device characteristics in integrated circuit simulation 失效
标题翻译：补偿集成电路仿真中器件特性的变化
公开(公告)号：US08594989B2
公开(公告)日：2013-11-26
申请号：US12420910
申请日：2009-04-09
申请人： Emrah Acar , Kanak B. Agarwal , Damir Jamsek , Sani R. Nassif
发明人： Emrah Acar , Kanak B. Agarwal , Damir Jamsek , Sani R. Nassif
IPC分类号： G06F17/50 , G06G7/62
CPC分类号： G06F17/5036
摘要： According to a method of simulation data processing, a difference is determined between a simulated value of a characteristic for a simulated integrated circuit device and a corresponding empirical value of the characteristic for a fabricated integrated circuit device. A data structure containing a simulation model of the fabricated integrated circuit device is accessed, where the data structure includes a plurality of entries each accessed via a unique index and an index used to access the data structure is offset in accordance with the difference between the simulated value and the empirical value. Operation of the simulated integrated circuit device is then simulated utilizing a value obtained from one of the plurality of entries of the data structure. Results of the simulation are stored in a data storage medium.
摘要翻译：根据模拟数据处理的方法，在仿真集成电路器件的特性的模拟值与制造的集成电路器件的特性的对应经验值之间确定差异。访问包含制造的集成电路器件的仿真模型的数据结构，其中数据结构包括通过唯一索引访问的多个条目，并且用于访问数据结构的索引根据模拟的价值和经验价值。然后使用从数据结构的多个条目之一获得的值来模拟仿真集成电路器件的操作。模拟结果存储在数据存储介质中。

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