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    • 1. 发明授权
    • Multi-function opto-electronic detection apparatus
    • 多功能光电检测仪
    • US06844935B2
    • 2005-01-18
    • US10761116
    • 2004-01-20
    • Chih-Kung LeeShuen-Chen ShiueShu-Sheng LeeJiun-Yan WuChii-Wann LinShiming Lin
    • Chih-Kung LeeShuen-Chen ShiueShu-Sheng LeeJiun-Yan WuChii-Wann LinShiming Lin
    • G01B11/00G01B9/02
    • G01B11/00
    • A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
    • 一种用于检测试样的分子特性的多功能光电检测装置。 该装置包括功能模式子系统,包括用于产生用于照亮测试样本的采样光束的检测光源子系统; 用于将采样光束对准到测试样品的操纵光学子系统; 目标信号处理子系统,用于分析从采样光束的照明产生的从测试样本出射的目标光束; 以及用于保持测试样本的样本固定子系统。 检测光源子系统,操作光学子系统和目标信号处理子系统被组合成用于测试样本的检测特性的几种可能的光学采样设置之一。 功能模式设置至少包括椭圆计,共焦图像扫描仪,光子隧道扫描显微镜和干涉仪。
    • 4. 发明授权
    • Device for measuring the complex refractive index and thin film thickness of a sample
    • 用于测量样品的复折射率和薄膜厚度的装置
    • US06483584B1
    • 2002-11-19
    • US09549738
    • 2000-04-14
    • Solomon J. H. LeeChih-Kung LeeShu-Sheng LeeYang Yun-ChangLin Chan-ChingShuen-Chen Shiue
    • Solomon J. H. LeeChih-Kung LeeShu-Sheng LeeYang Yun-ChangLin Chan-ChingShuen-Chen Shiue
    • G01J400
    • G01N21/21G01N21/41G01N21/8422
    • An ellipsometer for measuring the complex refractive index of a sample and thin film thickness according to the invention. The ellipsometer includes a linear polarized light source, a reference analyzer, a polarization analyzer and a light direction controller. The linear polarized light source used to generate a measuring beam for detecting the sample. The phase modulator used to control the phase of the measuring beam thereby to generate a sampling beam. The reference analyzer used to generate a reference beam according to part of the sampling beam thereby to adjust the intensity of the sampling beam. The polarization analyzer used to analyze the phase, polarization and intensity of the sampling beam after the sampling beam is reflected by the sample. The light direction controller used to control the angle and direction of the sampling beam with respect to the sample, wherein the sampling beam is reflected by the sample to enter the light direction controller, and thereafter the sampling beam is reflected by the light direction controller and re-reflected by the sample to enter the polarization analyzer along an original optical path, but toward an opposite direction.
    • 用于测量样品的复合折射率的椭偏仪和根据本发明的薄膜厚度。 椭偏仪包括线偏振光源,参考分析仪,偏振分析仪和光方向控制器。 用于产生用于检测样品的测量光束的线偏振光源。 相位调制器用于控制测量光束的相位,从而产生采样光束。 参考分析仪用于根据采样束的一部分产生参考光束,从而调整采样光束的强度。 用于分析采样光束后的采样光束的相位,极化和强度的偏振分析器被样品反射。 用于控制采样光束相对于样本的角度和方向的光方向控制器,其中采样光束被样本反射以进入光方向控制器,此后采样光束被光方向控制器反射, 由样品重新反射,沿着原始光路进入偏振分析器,但朝向相反的方向。
    • 7. 发明授权
    • Polarization splitting backlight module
    • 极化分离背光模块
    • US06688751B2
    • 2004-02-10
    • US09908061
    • 2001-07-18
    • Chih-Kung LeeJiun-Yan WuShu-Sheng LeeChing-Heng Tang
    • Chih-Kung LeeJiun-Yan WuShu-Sheng LeeChing-Heng Tang
    • F21V914
    • G02B6/0038G02B5/305G02B6/0051G02B6/0056G02B27/283G02F1/133615G02F1/13362
    • A polarization splitting backlight module for efficiently converting a non-polarized light beam emitted from the light source into a single polarization state is disclosed. The polarization splitting backlight module of the present invention comprises an under plate with a ridged lower surface, a light source, a special reflection film, a scattering structure, a substrate and a polarization splitting film. The light beam emitted from the light source is introduced into the scattering structure between the under plate and the substrate. After a series of processes, such as scattering, reflection, phase retardation and polarization beam-splitting, the light beam will pass through the polarization splitting film being of a single polarization state such that it could be utilized by electro-optical systems, such as liquid crystal displays. The present invention converts light beams into a single polarization state, and the efficiency thus is higher than that of a conventional backlight module. The present invention achieves brightness levels that are almost twice that of conventional backlight module.
    • 公开了一种用于将从光源发射的非偏振光束有效地转换成单极化状态的偏振分束背光模块。 本发明的偏振分束背光模块包括具有带脊下表面的底板,光源,特殊反射膜,散射结构,基板和偏振分束膜。 从光源发射的光束被引入到底板和基板之间的散射结构中。 在诸如散射,反射,相位延迟和偏振光束分裂的一系列处理之后,光束将通过偏振分束膜为单一极化状态,使得其可以被电光系统使用,例如 液晶显示器。 本发明将光束转换成单极化状态,因此效率高于常规背光模块的效率。 本发明实现的亮度水平几乎是传统背光模块的两倍。