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1. 发明授权

US06844935B2 Multi-function opto-electronic detection apparatus 有权
标题翻译：多功能光电检测仪
公开(公告)号：US06844935B2
公开(公告)日：2005-01-18
申请号：US10761116
申请日：2004-01-20
申请人： Chih-Kung Lee , Shuen-Chen Shiue , Shu-Sheng Lee , Jiun-Yan Wu , Chii-Wann Lin , Shiming Lin
发明人： Chih-Kung Lee , Shuen-Chen Shiue , Shu-Sheng Lee , Jiun-Yan Wu , Chii-Wann Lin , Shiming Lin
IPC分类号： G01B11/00 , G01B9/02
CPC分类号： G01B11/00
摘要： A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.
摘要翻译：一种用于检测试样的分子特性的多功能光电检测装置。该装置包括功能模式子系统，包括用于产生用于照亮测试样本的采样光束的检测光源子系统; 用于将采样光束对准到测试样品的操纵光学子系统; 目标信号处理子系统，用于分析从采样光束的照明产生的从测试样本出射的目标光束; 以及用于保持测试样本的样本固定子系统。检测光源子系统，操作光学子系统和目标信号处理子系统被组合成用于测试样本的检测特性的几种可能的光学采样设置之一。功能模式设置至少包括椭圆计，共焦图像扫描仪，光子隧道扫描显微镜和干涉仪。

2. 发明授权

US06590667B1 Method and an apparatus for measuring the flying height with sub-nanometer resolution 有权
标题翻译：用亚纳米分辨率测量飞行高度的方法和装置
公开(公告)号：US06590667B1
公开(公告)日：2003-07-08
申请号：US09624685
申请日：2000-07-24
申请人： Jau-Hu Lee , Chih-Kung Lee , Shuen-Chen Shiue , Shu-Sheng Lee , Jiun-Yan Wu
发明人： Jau-Hu Lee , Chih-Kung Lee , Shuen-Chen Shiue , Shu-Sheng Lee , Jiun-Yan Wu
IPC分类号： G01B1102
CPC分类号： G11B7/1387 , G01B11/14 , G11B5/6011 , G11B7/122 , G11B7/22
摘要： A method and apparatus is claimed for measuring the distance between a slider and a transparent disk with sub-nanometer resolution. The flying height is measured by applying ellipsometry. The measurement is done by: providing a sampling light beam with adjustable initial polarization state by phase modulation, and with variable incident angles relative to the air film and reflecting the sampling light off of the specimen at a detection site forming a reflected light beam that is then reflected at the detection site again and then guided to both detectors for detecting the intensity and phase change of the light beam to determine the gap's thickness as well as passing some light to a microscope used for observation of the detecting site on the specimen.
摘要翻译：要求的方法和装置用于测量滑块和具有亚纳米分辨率的透明盘之间的距离。飞行高度通过应用椭偏仪测量。测量是通过以下方式完成的：通过相位调制提供具有可调初始极化状态的采样光束，并且相对于空气膜具有可变的入射角，并在形成反射光束的检测位置处反射取样光，然后再次在检测部位反射，然后引导到两个检测器，用于检测光束的强度和相位变化，以确定间隙的厚度，以及将一些光通过用于观察样品上检测部位的显微镜。

3. 发明授权

US06288841B1 Optical mechanism for precisely controlling the angle of an incident light beam within a large incident angle range 有权
标题翻译：用于在大的入射角度范围内精确地控制入射光束的角度的光学机构
公开(公告)号：US06288841B1
公开(公告)日：2001-09-11
申请号：US09475001
申请日：1999-12-30
申请人： Solomon J. H. Lee , Chih-Kung Lee , Tony C. H. Lin , Shih-Jui Chen , Shu-Sheng Lee , Shuen-Chen Shiue
发明人： Solomon J. H. Lee , Chih-Kung Lee , Tony C. H. Lin , Shih-Jui Chen , Shu-Sheng Lee , Shuen-Chen Shiue
IPC分类号： G02B2710
CPC分类号： G01N21/211 , G01N2021/214 , G01N2201/0636 , G01N2201/0637 , G02B21/08 , G02B26/0816
摘要： An optical path overlapping type incident angle changeable optical mechanism according to the invention allows an incident light beam to be incident onto a measured range of a sample within a large incident angle range. The optical mechanism includes a reflecting prism reflecting the incident light beam to generate a reflected light beam having an angle of 90° with respect to the incident light beam; a concave parabolic cylindric mirror guiding the reflected light beam coming from the reflecting prism to a measured range of a detect-waiting sample to thereby be further reflected to generate a detect-waiting light beam; a concave cylindric mirror used to make the detect-waiting light beam incident onto/reflected by the reflecting prism so as to overlap with the incident light beam; and a light beam splitting means used to separate the detect-waiting light beam from the incident light beam.
摘要翻译：根据本发明的光路重叠型入射角可变光学机构允许入射光束入射到大的入射角范围内的样品的测量范围。光学机构包括反射入射光束的反射棱镜，以产生相对于入射光束具有90°角的反射光束; 将来自反射棱镜的反射光束引导到检测等待样本的测量范围的凹面抛物线圆柱镜，从而进一步反射以产生检测等待光束; 用于使入射到反射棱镜/反射的检测等待光束与入射光束重叠的凹圆柱镜; 以及用于将检测等待光束与入射光束分离的光束分离装置。

4. 发明授权

US06483584B1 Device for measuring the complex refractive index and thin film thickness of a sample 有权
$Device for measuring the complex refractive index and thin film thickness of a sample$
标题翻译：用于测量样品的复折射率和薄膜厚度的装置
公开(公告)号：US06483584B1
公开(公告)日：2002-11-19
申请号：US09549738
申请日：2000-04-14
申请人： Solomon J. H. Lee , Chih-Kung Lee , Shu-Sheng Lee , Yang Yun-Chang , Lin Chan-Ching , Shuen-Chen Shiue
发明人： Solomon J. H. Lee , Chih-Kung Lee , Shu-Sheng Lee , Yang Yun-Chang , Lin Chan-Ching , Shuen-Chen Shiue
IPC分类号： G01J400
CPC分类号： G01N21/21 , G01N21/41 , G01N21/8422
摘要： An ellipsometer for measuring the complex refractive index of a sample and thin film thickness according to the invention. The ellipsometer includes a linear polarized light source, a reference analyzer, a polarization analyzer and a light direction controller. The linear polarized light source used to generate a measuring beam for detecting the sample. The phase modulator used to control the phase of the measuring beam thereby to generate a sampling beam. The reference analyzer used to generate a reference beam according to part of the sampling beam thereby to adjust the intensity of the sampling beam. The polarization analyzer used to analyze the phase, polarization and intensity of the sampling beam after the sampling beam is reflected by the sample. The light direction controller used to control the angle and direction of the sampling beam with respect to the sample, wherein the sampling beam is reflected by the sample to enter the light direction controller, and thereafter the sampling beam is reflected by the light direction controller and re-reflected by the sample to enter the polarization analyzer along an original optical path, but toward an opposite direction.
摘要翻译：用于测量样品的复合折射率的椭偏仪和根据本发明的薄膜厚度。椭偏仪包括线偏振光源，参考分析仪，偏振分析仪和光方向控制器。用于产生用于检测样品的测量光束的线偏振光源。相位调制器用于控制测量光束的相位，从而产生采样光束。参考分析仪用于根据采样束的一部分产生参考光束，从而调整采样光束的强度。用于分析采样光束后的采样光束的相位，极化和强度的偏振分析器被样品反射。用于控制采样光束相对于样本的角度和方向的光方向控制器，其中采样光束被样本反射以进入光方向控制器，此后采样光束被光方向控制器反射，由样品重新反射，沿着原始光路进入偏振分析器，但朝向相反的方向。

5. 发明授权

US06688751B2 Polarization splitting backlight module 失效
标题翻译：极化分离背光模块
公开(公告)号：US06688751B2
公开(公告)日：2004-02-10
申请号：US09908061
申请日：2001-07-18
申请人： Chih-Kung Lee , Jiun-Yan Wu , Shu-Sheng Lee , Ching-Heng Tang
发明人： Chih-Kung Lee , Jiun-Yan Wu , Shu-Sheng Lee , Ching-Heng Tang
IPC分类号： F21V914
CPC分类号： G02B6/0038 , G02B5/305 , G02B6/0051 , G02B6/0056 , G02B27/283 , G02F1/133615 , G02F1/13362
摘要： A polarization splitting backlight module for efficiently converting a non-polarized light beam emitted from the light source into a single polarization state is disclosed. The polarization splitting backlight module of the present invention comprises an under plate with a ridged lower surface, a light source, a special reflection film, a scattering structure, a substrate and a polarization splitting film. The light beam emitted from the light source is introduced into the scattering structure between the under plate and the substrate. After a series of processes, such as scattering, reflection, phase retardation and polarization beam-splitting, the light beam will pass through the polarization splitting film being of a single polarization state such that it could be utilized by electro-optical systems, such as liquid crystal displays. The present invention converts light beams into a single polarization state, and the efficiency thus is higher than that of a conventional backlight module. The present invention achieves brightness levels that are almost twice that of conventional backlight module.
摘要翻译：公开了一种用于将从光源发射的非偏振光束有效地转换成单极化状态的偏振分束背光模块。本发明的偏振分束背光模块包括具有带脊下表面的底板，光源，特殊反射膜，散射结构，基板和偏振分束膜。从光源发射的光束被引入到底板和基板之间的散射结构中。在诸如散射，反射，相位延迟和偏振光束分裂的一系列处理之后，光束将通过偏振分束膜为单一极化状态，使得其可以被电光系统使用，例如液晶显示器。本发明将光束转换成单极化状态，因此效率高于常规背光模块的效率。本发明实现的亮度水平几乎是传统背光模块的两倍。

6. 发明授权

US6115126A Optical wavefront analyzer and method using a single wave shifter 有权
标题翻译：光波分析仪和使用单波移位器的方法
公开(公告)号：US6115126A
公开(公告)日：2000-09-05
申请号：US235874
申请日：1999-01-22
申请人： Yi-Chun Chen , Shu-Sheng Lee , Chung-Min Lee , Ching-Wei Chen , Heui-Yung Chang , Gym-Bin Yeh , Chih-Kung Lee , Shih-Tsong Lin , Chi-Tang Hsieh , Wei-Liang Chen
发明人： Yi-Chun Chen , Shu-Sheng Lee , Chung-Min Lee , Ching-Wei Chen , Heui-Yung Chang , Gym-Bin Yeh , Chih-Kung Lee , Shih-Tsong Lin , Chi-Tang Hsieh , Wei-Liang Chen
IPC分类号： G01J9/02 , G01B9/02
CPC分类号： G01J9/0215
摘要： An optical wavefront analyzer based on the phase-shearing interferometry technique for measuring a wavefront of a light beam is disclosed. The analyzer includes a single phase shifter, a driving device, a pattern receiving device, and a phase reconstructing device. A method of measuring a wavefront of a light beam is also provided for solving the problems of two-axial focusing and phase inconsistency encountered the prior art by employing phase-shearing and phase-shifting techniques to improve the method of optical wavefront mesurement. A non-iterative, path-independent unwrapping methodology is used to deal with a complicated wavefront.
摘要翻译：公开了一种基于用于测量光束的波前的相位剪切干涉技术的光学波前分析器。该分析器包括单个移相器，驱动装置，模式接收装置和相位重建装置。还提供了一种测量光束的波前的方法，用于通过采用相位剪切和相移技术来改进光波前测量的方法来解决现有技术中遇到的双轴向聚焦和相位不一致的问题。非迭代的路径独立展开方法用于处理复杂的波前。

7. 发明授权

US06587275B2 Light beam polarization converter for converting an illumination light source 失效
标题翻译：用于转换照明光源的光束偏振转换器
公开(公告)号：US06587275B2
公开(公告)日：2003-07-01
申请号：US09765948
申请日：2001-01-19
申请人： Chih-Kung Lee , Chih-Ting Lin , Shu-Sheng Lee , Ching-Heng Tang
发明人： Chih-Kung Lee , Chih-Ting Lin , Shu-Sheng Lee , Ching-Heng Tang
IPC分类号： G02B2716
CPC分类号： G02B27/285 , G02B5/3025 , G02B27/286
摘要： A light beam polarization converter converts non-polarized light beams of an illumination source having a plurality of polarization states into a single polarization state. The light beams from the bottom converged by the lower surface of the under plate and further parallelized by the upper surface thereof enter the converter. After a series of optical processes of polarization splitting, reflection or total reflection, and phase retardation within the converter, the light beams will pass through the converter as light beams of a single polarization state.
摘要翻译：光束偏振转换器将具有多个偏振态的照明源的非偏振光束转换成单极化状态。由底板的下表面收敛并进一步与其上表面平行的光束进入转换器。经过一系列偏振分离，反射或全反射的光学过程和转换器内的相位延迟，光束将以单极化状态的光束通过转换器。

8. 发明申请

US20100053625A1 SURFACE PLASMON RESONANCE METER 有权
标题翻译：表面质子共振仪
公开(公告)号：US20100053625A1
公开(公告)日：2010-03-04
申请号：US12422891
申请日：2009-04-13
申请人： Chih-Kung Lee , Shu-Sheng Lee , Chih-Hsiang Sung , Yi-Hao Chen
发明人： Chih-Kung Lee , Shu-Sheng Lee , Chih-Hsiang Sung , Yi-Hao Chen
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： A surface plasmon resonance meter is provided, including a backlight module, a line-slot plate, a parabolic mirror, a linear polarizer, a sensing chip, a prism and a photo detector array. The line-slot plate includes a light outlet. A light beam travels in the backlight module, and leaves the backlight module through the light outlet. The position of the line-slot plate is matched on a predetermined focal point of the parabolic mirror. The light beam is reflected by the parabolic mirror to be a parallel light beam, and travels trough the linear polarizer to the prism. The prism includes a light entering surface, a detection surface and a light exiting surface. The light beam enters the prism through the light entering surface, contacts the sensing chip with total internal reflection, and finally leaves the prism through the light exiting surface to be received by the photo detector array.
摘要翻译：提供了表面等离子体共振仪，包括背光模块，线槽板，抛物面镜，线性偏振器，感测芯片，棱镜和光电检测器阵列。线槽板包括一个灯出口。光束在背光模块中传播，并使背光模块通过灯泡出口。线槽板的位置在抛物面镜的预定焦点上匹配。光束被抛物面镜反射成平行光束，并且通过线性偏振器行进到棱镜。棱镜包括光入射表面，检测表面和光出射表面。光束通过光进入表面进入棱镜，与全内反射接触感测芯片，最后通过光出射表面离开棱镜，以被光电检测器阵列接收。

9. 发明授权

US07791730B2 Surface plasmon resonance meter 有权
标题翻译：表面等离子体共振仪
公开(公告)号：US07791730B2
公开(公告)日：2010-09-07
申请号：US12422891
申请日：2009-04-13
申请人： Chih-Kung Lee , Shu-Sheng Lee , Chih-Hsiang Sung , Yi-Hao Chen
发明人： Chih-Kung Lee , Shu-Sheng Lee , Chih-Hsiang Sung , Yi-Hao Chen
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： A surface plasmon resonance meter is provided, including a backlight module, a line-slot plate, a parabolic mirror, a linear polarizer, a sensing chip, a prism and a photo detector array. The line-slot plate includes a light outlet. A light beam travels in the backlight module, and leaves the backlight module through the light outlet. The position of the line-slot plate is matched on a predetermined focal point of the parabolic mirror. The light beam is reflected by the parabolic mirror to be a parallel light beam, and travels trough the linear polarizer to the prism. The prism includes a light entering surface, a detection surface and a light exiting surface. The light beam enters the prism through the light entering surface, contacts the sensing chip with total internal reflection, and finally leaves the prism through the light exiting surface to be received by the photo detector array.
摘要翻译：提供了表面等离子体共振仪，包括背光模块，线槽板，抛物面镜，线性偏振器，感测芯片，棱镜和光电检测器阵列。线槽板包括一个灯出口。光束在背光模块中传播，并使背光模块通过灯泡出口。线槽板的位置在抛物面镜的预定焦点上匹配。光束被抛物面镜反射成平行光束，并且通过线性偏振器行进到棱镜。棱镜包括光入射表面，检测表面和光出射表面。光束通过光进入表面进入棱镜，与全内反射接触感测芯片，最后通过光出射表面离开棱镜，以被光电检测器阵列接收。

10. 发明授权

US06919561B2 Diffraction laser encoder apparatus 有权
$Diffraction laser encoder apparatus$
标题翻译：衍射激光编码器装置
公开(公告)号：US06919561B2
公开(公告)日：2005-07-19
申请号：US10775857
申请日：2004-02-09
申请人： Chih-Kung Lee , Liang-Bin Yu , Chyan-Chyi Wu , Shu-Sheng Lee , Wen-Jong Wu , Ming-Hua Wen , Shih-Jui Chen , Giin-Yuan Wu
发明人： Chih-Kung Lee , Liang-Bin Yu , Chyan-Chyi Wu , Shu-Sheng Lee , Wen-Jong Wu , Ming-Hua Wen , Shih-Jui Chen , Giin-Yuan Wu
IPC分类号： G01D5/38 , H01J3/14 , H01J5/16 , H01J40/14
CPC分类号： G01D5/38
摘要： A diffraction laser encoder apparatus for positional and movement information measurement of a target made with a diffraction grating. The diffraction laser encoder has a laser light source for generating a source beam. A polarization beam splitter assembly comprises a polarization beam splitter for receiving the source beam for splitting a P-polarization component and an S-polarization component of the source beam into parallel and offset beams. A focusing lens focuses the P-polarization component and the S-polarization component beams onto the target diffraction grating and returning diffracted P-polarization and diffracted S-polarization beams back into the polarization beam splitter for generating a detector beam coaxially containing the diffracted P-polarization and the diffracted S-polarization beams. A detector assembly receives the detector beam for electrical processing and analysis for resolving the positional and movement information. In the process, phase information contained in the diffraction signal returned by the target is analyzed.
摘要翻译：一种用衍射光栅制作的靶的位置和运动信息测量的衍射激光编码器装置。衍射激光编码器具有用于产生源光束的激光光源。偏振分束器组件包括偏振分束器，用于接收源光束，用于将源极光束的P偏振分量和S偏振分量分离成平行和偏移光束。聚焦透镜将P偏振分量和S偏振分量光束聚焦到目标衍射光栅上，并将衍射的P偏振和衍射S偏振光束返回到偏振分束器中，以产生同轴地包含衍射P- 偏振和衍射S偏振光束。检测器组件接收用于电处理和分析的检测器束，用于解析位置和运动信息。在该过程中，分析由目标返回的衍射信号中包含的相位信息。

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