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    • 6. 发明授权
    • Apparatus and a method for cleaning a dielectric film
    • 用于清洁电介质膜的装置和方法
    • US07658802B2
    • 2010-02-09
    • US11284775
    • 2005-11-22
    • Xinyu FuJohn ForsterWei W. Wang
    • Xinyu FuJohn ForsterWei W. Wang
    • B08B6/00
    • H01L21/02063H01J37/32357H01J37/32422H01J37/3266
    • An apparatus and a method of cleaning a dielectric film are provided in the present invention. In one embodiment, an apparatus of cleaning a dielectric film the apparatus includes a chamber body adapted to support a substrate therein, a remote plasma source adapted to provide a plurality of reactive radicals to the chamber body, a passage coupling the remote plasma source to the chamber body, and at least one magnet disposed adjacent the passage. In another embodiment, a method of cleaning a dielectric film that includes providing a substrate having an at least partially exposed dielectric layer disposed in a process chamber, generating a plurality of reactive radicals in a remote plasma source, flowing the reactive radicals from the remote plasma source into the process chamber through a passage having at least one magnet disposed adjacent the passage, and magnetically filtering the reactive radicals passing through the passage.
    • 在本发明中提供了一种清洁电介质膜的装置和方法。 在一个实施例中,一种清洁电介质膜的装置包括适于在其中支撑衬底的室主体,适于向室主体提供多个反应性基团的远程等离子体源,将远程等离子体源耦合到 室主体,以及邻近通道设置的至少一个磁体。 在另一个实施例中,一种清洁电介质膜的方法,该方法包括提供具有设置在处理室中的至少部分暴露的电介质层的衬底,在远程等离子体源中产生多个反应性基团,使来自远端等离子体的反应性基团 通过具有邻近通道设置的至少一个磁体的通道进入处理室,并对穿过通道的反应性基团进行磁过滤。
    • 7. 发明申请
    • Apparatus and a method for cleaning a dielectric film
    • 用于清洁电介质膜的装置和方法
    • US20070113868A1
    • 2007-05-24
    • US11284775
    • 2005-11-22
    • Xinyu FuJohn ForsterWei Wang
    • Xinyu FuJohn ForsterWei Wang
    • B08B6/00
    • H01L21/02063H01J37/32357H01J37/32422H01J37/3266
    • An apparatus and a method of cleaning a dielectric film are provided in the present invention. In one embodiment, an apparatus of cleaning a dielectric film the apparatus includes a chamber body adapted to support a substrate therein, a remote plasma source adapted to provide a plurality of reactive radicals to the chamber body, a passage coupling the remote plasma source to the chamber body, and at least one magnet disposed adjacent the passage. In another embodiment, a method of cleaning a dielectric film that includes providing a substrate having an at least partially exposed dielectric layer disposed in a process chamber, generating a plurality of reactive radicals in a remote plasma source, flowing the reactive radicals from the remote plasma source into the process chamber through a passage having at least one magnet disposed adjacent the passage, and magnetically filtering the reactive radicals passing through the passage.
    • 在本发明中提供了一种清洁电介质膜的装置和方法。 在一个实施例中,一种清洁电介质膜的装置包括适于在其中支撑衬底的室主体,适于向室主体提供多个反应性基团的远程等离子体源,将远程等离子体源耦合到 室主体,以及邻近通道设置的至少一个磁体。 在另一个实施例中,一种清洁电介质膜的方法,该方法包括提供具有设置在处理室中的至少部分暴露的电介质层的衬底,在远程等离子体源中产生多个反应性基团,使来自远端等离子体的反应性基团 通过具有邻近通道设置的至少一个磁体的通道进入处理室,并对穿过通道的反应性基团进行磁过滤。
    • 9. 发明授权
    • Method for removing native oxide and associated residue from a substrate
    • 从底物中除去天然氧化物和相关残留物的方法
    • US08772162B2
    • 2014-07-08
    • US13906543
    • 2013-05-31
    • Bo ZhengArvind SundarrajanXinyu Fu
    • Bo ZhengArvind SundarrajanXinyu Fu
    • H01L21/44
    • H01L21/02063H01J37/32082H01L21/02057H01L21/0206H01L21/28518H01L21/28556H01L21/28568H01L21/743H01L21/768
    • Native oxides and associated residue are removed from surfaces of a substrate by sequentially performing two plasma cleaning processes on the substrate in a single processing chamber. The first plasma cleaning process removes native oxide formed on a substrate surface by generating a cleaning plasma from a mixture of ammonia (NH3) and nitrogen trifluoride (NF3) gases, condensing products of the cleaning plasma on the native oxide to form a thin film that contains ammonium hexafluorosilicate ((NH4)2SiF6), and subliming the thin film off of the substrate surface. The second plasma cleaning process removes remaining residues of the thin film by generating a second cleaning plasma from nitrogen trifluoride gas. Products of the second cleaning plasma react with a few angstroms of the bare silicon present on the surface, forming silicon tetrafluoride (SiF4) and lifting off residues of the thin film.
    • 通过在单个处理室中在衬底上依次执行两个等离子体清洗工艺,从衬底的表面除去天然氧化物和相关残留物。 第一等离子体清洁工艺通过从氨(NH 3)和三氟化氮(NF 3)气体的混合物中产生清洁等离子体,从而将清洁等离子体的产物冷凝在天然氧化物上,从而去除在基底表面上形成的天然氧化物,形成薄膜, 含有六氟硅酸铵((NH 4)2 SiF 6),并将薄膜从衬底表面上升华。 通过从三氟化氮气体产生第二清洗等离子体,第二等离子体清洗工艺去除剩余的薄膜残留物。 第二清洗等离子体的产物与表面上存在的裸硅几埃反应,形成四氟化硅(SiF4)并提取薄膜的残留物。
    • 10. 发明授权
    • Plasma treatment of substrates prior to deposition
    • 在沉积之前对衬底进行等离子体处理
    • US08580354B2
    • 2013-11-12
    • US13209760
    • 2011-08-15
    • Xinyu FuJick M. Yu
    • Xinyu FuJick M. Yu
    • C23C14/02C23C14/16C23C14/58B05D3/06H05H1/24H05H1/46C23C14/18
    • C23C16/0245H01J37/32357
    • A plasma processing chamber particularly useful for pre-treating low-k dielectric films and refractory metal films subject to oxidation prior to deposition of other layers. A remote plasma source (RPS) excites a processing gas into a plasma and delivers it through a supply tube to a manifold in back of a showerhead faceplate. The chamber is configured for oxidizing and reducing plasmas in the same or different processes when oxygen and hydrogen are selectively supplied to the RPS. The supply tube and showerhead may be formed of dielectric oxides which may be passivated by a water vapor plasma from the remote plasma source. In one novel process, a protective hydroxide coating is formed on refractory metals by alternating neutral plasmas of hydrogen and oxygen.
    • 一种等离子体处理室,特别适用于在沉积其它层之前预处理低k电介质膜和难以处理的金属薄膜。 远程等离子体源(RPS)将处理气体激发到等离子体中并将其通过供应管输送到喷头面板背面的歧管。 当氧气和氢气选择性地供应给RPS时,该室被配置用于在相同或不同的过程中氧化和还原等离子体。 供应管和喷头可以由介电氧化物形成,其可以由远程等离子体源的水蒸汽等离子体钝化。 在一个新颖的方法中,通过交替的氢和氧的中性等离子体在难熔金属上形成保护性氢氧化物涂层。