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    • 6. 发明申请
    • TEST SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES
    • 用于测试电子设备的测试系统和方法
    • US20110156734A1
    • 2011-06-30
    • US12979159
    • 2010-12-27
    • Tommie E. BerryKeith J. BreinlingerEric D. HobbsMarc LorangerAlexander H. SlocumAdrian S. Wilson
    • Tommie E. BerryKeith J. BreinlingerEric D. HobbsMarc LorangerAlexander H. SlocumAdrian S. Wilson
    • G01R31/00
    • G01R31/2891
    • Devices under test (DUTs) can be tested in a test system that includes an aligner and test cells. A DUT can be moved into and clamped in an aligned position on a carrier in the aligner. In the align position, electrically conductive terminals of the DUT can be in a predetermined position with respect to carrier alignment features of the carrier. The DUT/carrier combination can then be moved from the aligner into one of the test cells, where alignment features of the carrier are mechanically coupled with alignment features of a contactor in the test cell. The mechanical coupling automatically aligns terminals of the DUT with probes of the contactor. The probes thus contact and make electrical connections with the terminals of the DUT. The DUT is then tested. The aligner and each of the test cells can be separate and independent devices so that a DUT can be aligned in the aligner while other DUTs, having previously been aligned to a carrier in the aligner, are tested in a test cell.
    • 被测设备(DUT)可以在包括对准器和测试单元的测试系统中进行测试。 DUT可以被移动并被夹持在对准器中的载体上的对准位置。 在对准位置,DUT的导电端子可以相对于载体的载体对准特征处于预定位置。 然后可以将DUT /载体组合从对准器移动到测试单元之一中,其中载体的对准特征与测试单元中的接触器的对准特征机械耦合。 机械联轴器将DUT的端子自动对准接触器的探头。 探头因此与DUT的端子接触并进行电气连接。 然后测试DUT。 对准器和每个测试单元可以是分离和独立的器件,使得DUT可以在对准器中对准,而在测试单元中测试已经与对准器中的载体对准的其它DUT。
    • 9. 发明授权
    • Variable electronic circuit component
    • 可变电子电路组件
    • US06914785B1
    • 2005-07-05
    • US10683569
    • 2003-10-10
    • Alexander H. SlocumJeffrey LangJames R. WhiteHong MaXueen Yang
    • Alexander H. SlocumJeffrey LangJames R. WhiteHong MaXueen Yang
    • H01G5/16H03J3/20H05K1/18
    • H01G5/18H03J3/20H03J2200/39
    • A circuit component has an elastically deformable first structure, a second structure, and a support structure coupling the first and second structures, wherein the support structure acts a fulcrum about which the first structure can be variably deformed in response to a variable force, to provide either a variable capacitor or a variable tank circuit having a variable capacitor and an inductor. In one particular embodiment, the circuit component includes a zipper actuator for elastically deforming the first structure. A method of making a circuit component includes forming an elastically deformable first structure, forming a second structure, and forming a support structure coupling the first and second structures, to provide either a variable capacitor or a variable tank circuit having a variable capacitor and an inductor. In one particular embodiment, the method includes forming a zipper actuator for elastically deforming the first structure.
    • 电路部件具有可弹性变形的第一结构,第二结构和联接第一和第二结构的支撑结构,其中支撑结构作用于支点,第一结构可响应于可变的力而变形,以提供 可变电容器或具有可变电容器和电感器的可变电容器电路。 在一个特定实施例中,电路部件包括用于使第一结构弹性变形的拉链致动器。 制造电路部件的方法包括形成可弹性变形的第一结构,形成第二结构,以及形成连接第一和第二结构的支撑结构,以提供具有可变电容器和电感器的可变电容器或可变电容器电路 。 在一个具体实施例中,该方法包括形成用于使第一结构弹性变形的拉链致动器。