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    • 1. 发明授权
    • Exposure method and apparatus using holographic techniques
    • 使用全息技术的曝光方法和装置
    • US5504596A
    • 1996-04-02
    • US169055
    • 1993-12-20
    • Akihiro GotoTakashi GemmaYutaka IchiharaNobutaka MagomeNaomasa ShiraishiHiroshi ShirasuToshio Matsuura
    • Akihiro GotoTakashi GemmaYutaka IchiharaNobutaka MagomeNaomasa ShiraishiHiroshi ShirasuToshio Matsuura
    • G03F7/20G03H1/00G03H1/26
    • G03F7/70558G03F7/70625G03H1/00
    • An exposure apparatus is used for reproducing a mask pattern of a semiconductor device or the like onto a photosensitive substrate using a holography. The holography is utilized also in a process for alignment between a mask pattern hologram and an exposure region of the substrate. The pattern hologram is recorded to a recording medium by interference between an object wave from the pattern and a reference wave, and a second hologram is formed to the medium by diffraction light from an alignment mark formed on the mask. Prior to reconstruction of the pattern image, reconstruction light from the second hologram, illuminated with a reconstruction wave, is irradiated onto the substrate arranged in place of the mask. A reproduction image of the alignment mark on the substrate surface illuminated with the reconstruction light is measured, and relative displacement between the medium and the substrate is detected from a result of the measurement. The relative positional relationship between the medium and the substrate is corrected in accordance with the displacement information, and, thereafter, the surface is exposed with a reconstruction image of the pattern hologram.
    • 使用曝光装置将半导体装置等的掩模图案再现到使用全息术的感光基板上。 全息术也用于掩模图案全息图和衬底的曝光区域之间的对准的过程。 图案全息图通过来自图案的对象波与参考波之间的干涉而被记录到记录介质上,并且通过衍射光从形成在掩模上的对准标记的衍射光形成第二全息图。 在图案图像重建之前,用重建波照射的来自第二全息图的重建光被照射到布置在掩模上的衬底上。 测量用重建光照射的基板表面上的对准标记的再现图像,并且从测量结果检测介质和基板之间的相对位移。 根据位移信息来校正介质和基板之间的相对位置关系,然后用图案全息图的重构图像曝光表面。
    • 10. 发明授权
    • Exposure apparatus and method
    • 曝光装置和方法
    • US5657130A
    • 1997-08-12
    • US408714
    • 1995-03-22
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • Hiroshi ShirasuKazuaki SaikiSeiji MiyazakiSusumu Mori
    • G03F7/20G03F7/207G03F9/00H01L21/027G01B11/00
    • G03F7/70216G03F7/70275G03F7/70358G03F7/70791G03F9/70
    • In an exposure apparatus and method, a mask and a substrate are scanned in synchronism with each other so that the pattern of the mask may be transferred onto the substrate through a projection optical system. First beams of light are irradiated to least two locations on the mask spaced apart in a direction intersecting the scanning direction of the mask. The reflected light thereof is received, and the positions of the points on the mask to which the beam of light has been irradiated are detected in the direction of the optical axis of the projection optical system. In addition, second beams of light are irradiated to at least two locations on the substrate spaced apart in the scanning direction, and the reflected light thereof is received. The positions of the points on the substrate to which the second beam of light has been irradiated are also detected in the direction of the optical axis of the projection optical system are detected. The posture of at least one of the mask and the substrate is adjusted on the basis of the positions detected with the first and second beams.
    • 在曝光装置和方法中,掩模和基板彼此同步地扫描,使得掩模的图案可以通过投影光学系统被转印到基板上。 第一光束照射在与掩模的扫描方向相交的方向间隔开的掩模上的至少两个位置。 在投影光学系统的光轴的方向上检测其反射光,并且在光束照射的掩模上的点的位置被检测。 此外,第二光束照射到沿扫描方向间隔开的基板上的至少两个位置,并且其反射光被接收。 检测到在投影光学系统的光轴的方向上检测到已经照射第二光束的基板上的点的位置。 基于由第一和第二光束检测到的位置来调整掩模和基板中的至少一个的姿势。