会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明授权
    • Depletion mode chip decoupling capacitor
    • 耗尽模式芯片去耦电容
    • US5032892A
    • 1991-07-16
    • US453861
    • 1989-12-20
    • Wen-Foo ChernWard M. ParkinsonThomas M. TrentKevin G. DuesmanJames E. O'Toole
    • Wen-Foo ChernWard M. ParkinsonThomas M. TrentKevin G. DuesmanJames E. O'Toole
    • H01L27/02H01L27/08H05K1/02
    • H01L27/0805H01L27/0214H05K1/0231
    • An integrated cirucuit is provided with a depletion mode filter capacitor, which reduces voltage spiking, while at the same time avoiding latchup problems caused by the capacitor. The depletion mode capacitor has a barrier layer which is doped to an opposite conductivity type as the integrated circuit's substrate, achieved by doping to provide an opposite difference from four valence electrons as the substrate. The barrier is formed as a part of a CMOS process, in a manner which avoids additional process steps. The capacitor is formed with one node connected to ground or substrate, and the other node directly to a power bus. The capacitor is located on open space available on the whole siliocn chip (memory as well as logic chip), particularly directly underneath the metal power bus to achieve an on-chip power bus decoupling capacitor wth capacitance in excess of 0.001 .mu.F.
    • 一个集成的cirucuit配备有耗尽型滤波电容,可以减少电压尖峰,同时避免电容引起的闭锁问题。 耗尽型电容器具有阻挡层,其被掺杂成与集成电路的衬底相反的导电类型,通过掺杂实现,以提供与四价电子相反的差异作为衬底。 阻挡层以避免额外工艺步骤的方式形成为CMOS工艺的一部分。 电容器形成有一个节点连接到接地或基板,另一个节点直接连接到电源总线。 电容器位于整个硅芯片(存储器和逻辑芯片)上的开放空间上,特别是直接在金属电源总线下方,以实现片上电源总线去耦电容器超过0.001μF的电容。