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    • 4. 发明授权
    • Carrier injection dynamic random access memory having stacked depletion
region in Mesa
    • 载体注入动态随机存取存储器在Mesa中具有堆叠的耗尽区域
    • US5321285A
    • 1994-06-14
    • US925316
    • 1992-08-10
    • Ruojia LeeStanley N. Protigal
    • Ruojia LeeStanley N. Protigal
    • G11C11/404H01L27/108H01L29/68G11C11/34
    • H01L27/108G11C11/404
    • A carrier injected dynamic random access memory is defined. A depletion region adjacent to a source/drain region of a transistor is used as a storage cell in a memory array, and logic levels may then be measured by sensing the conductive portion. A low logic level is stored by a reduced formation of the depletion adjacent the conductive portion. These logic levels are sensed and periodically refreshed by conduction through the access device. The logic levels may be read by measuring potential through the access device, or by measuring punch through voltage between the source/drain region and a nearby conductive region. As the level of injected carriers increases, the punch through also increases. A punch through results in a readable increase in current through the access device, thereby providing an indicia of a in logic level.
    • 定义了载体注入的动态随机存取存储器。 将与晶体管的源极/漏极区域相邻的耗尽区域用作存储器阵列中的存储单元,然后可以通过感测导电部分来测量逻辑电平。 通过减少邻近导电部分的耗尽的形成来存储低逻辑电平。 这些逻辑电平被感测并通过通过接入设备的导通而周期性刷新。 逻辑电平可以通过测量通过存取装置的电位,或通过测量源极/漏极区域和附近导电区域之间的穿透电压来读取。 随着注射载体的水平增加,冲孔也增加。 穿孔导致通过访问设备的电流的可读增加,从而提供逻辑级别的标记。