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    • 3. 发明授权
    • Ferroelectric crystal display panel and manufacturing method thereof
    • 铁电晶体显示面板及其制造方法
    • US4730903A
    • 1988-03-15
    • US821840
    • 1986-01-23
    • Shunpei YamazakiTakashi InushimaAkira MaseToshimitsu KonumaMitsunori Sakama
    • Shunpei YamazakiTakashi InushimaAkira MaseToshimitsu KonumaMitsunori Sakama
    • G02F1/1365G02F1/13
    • G02F1/1365Y10S359/90
    • A ferroelectric liquid crystal display having a matrix of ferroelectric liquid crystal elements and nonlinear elements having a diode characteristic in which the liquid crystal elements are connected in series with the nonlinear elements. The first substrate member comprises (a) a transparent first substrate having an insulating surface, (b) a plurality of m.times.n (m>1, n>1) of rectangular transparent conductive layers C.sub.11 to C.sub.1n, C.sub.21 to C.sub.2n, . . . C.sub.m1 to C.sub.mn arranged on the substrate in a matrix form on the first substrate, (c) a layer member A.sub.ij formed on the conductive layer C.sub.ij (where i=1, 2 . . . m and j=1, 2 . . . n) and (d) a stripe-like conductive layer F.sub.i extending in the row direction and making contact with layer member A.sub.i1 to A.sub.in on the side opposite from the conductive layer C.sub.i1 to C.sub.in, wherein the opposing side surfaces a and a' of the layer member A.sub.ij defining is length are substantially aligned with the opposing side surfaces b and b' of the conductive layer C.sub.ij defining its width, respectively, and wherein the opposing side surface b and b' of the layer member A.sub.ij defining its width are substantially aligned with the opposing side surfaces b and b' of the conductive layer F.sub.i defining its width, respectively. The layer member A.sub.ij may be a laminate layer of a first nontransparent conductive layer, non-single-crystal semiconductor layer member or thin insulating layer which permits passage therethrough of tunnel current and a second nontransparent conductive layer.
    • 具有铁电液晶元件的矩阵的铁电液晶显示器和具有二极管特性的非线性元件,其中液晶元件与非线性元件串联连接。 第一衬底构件包括(a)具有绝缘表面的透明第一衬底,(b)矩形透明导电层C11至C1n,C21至C2n的多个m1n(m1,n≥1)。 。 。 Cm1至Cmn以矩阵形式布置在第一衬底上的衬底上,(c)形成在导电层Cij上的层构件Aij(其中i = 1,2 ...和j = 1,2 ...) )和(d)沿行方向延伸的条状导电层Fi,并且在与导电层Ci1至Cin相对的一侧与层构件Ai1至Ain接触,其中层的相对侧表面a和a' 构件Aij的长度分别基本上与导电层Cij的相对的侧表面b和b'对准,以限定其宽度,并且其中限定其宽度的层构件Aij的相对的侧表面b和b'基本上与 导电层Fi的相对的侧表面b和b'分别限定其宽度。 层构件Aij可以是允许隧道电流通过的第一非透明导电层,非单晶半导体层构件或薄绝缘层的层压层和第二非透明导电层。
    • 5. 发明授权
    • Solid state imaging device with low trap density
    • 具有低陷阱密度的固态成像装置
    • US5591988A
    • 1997-01-07
    • US477104
    • 1995-06-07
    • Michio AraiTakashi InushimaMitsufumi CodamaKazushi SugiuraIchiro TakayamaIsamu KoboriYukio YamauchiNaoya Sakamoto
    • Michio AraiTakashi InushimaMitsufumi CodamaKazushi SugiuraIchiro TakayamaIsamu KoboriYukio YamauchiNaoya Sakamoto
    • H01L21/84H01L27/12H01L27/146H01L31/113H01L29/04H01L31/036H01L31/0376H01L31/20
    • H01L27/14643H01L21/84H01L27/1237H01L31/1133
    • A substrate (1) has a surface covered with an insulation layer (2), on which an active layer (3') made of non-single crystal silicon through thin film technique is provided. A gate electrode layer (5') is partially provided on said active layer through a gate insulation layer (4). Said active layer (3') is subject to injection of P-type or N-type impurities to provide an image sensor of MOS structure. Bias potential is applied to a gate electrode so that a circuit between a source and a drain is in an On state, so that input light through said substrate or said gate electrode is applied to said active layer, and electrical output depending upon said input light is obtained from said source electrode or said drain electrode. Other MOS transistors for switching element and/or shift registers for operating said image sensor are provided on said substrate (1). Said active layer (3') is obtained by crystallizing said amorphous silicon layer through a laser anneal process or a high temperature anneal process, and hydrogenation process, and the trap density of said active layer is less than 5.times.10.sup.11 /cm.sup.2. Optical response time is short, less than 500 .mu.sec, so, high speed operation ten times as high as that of a prior image sensor is possible.
    • 基板(1)具有被绝缘层(2)覆盖的表面,在其上提供通过薄膜技术由非单晶硅制成的有源层(3')。 栅极电极层(5')通过栅极绝缘层(4)部分地设置在所述有源层上。 所述有源层(3')经受注入P型或N型杂质以提供MOS结构的图像传感器。 将偏置电位施加到栅电极,使得源极和漏极之间的电路处于导通状态,使得通过所述衬底或所述栅电极的输入光被施加到所述有源层,并且根据所述输入光输出电输出 从所述源电极或所述漏电极获得。 用于操作所述图像传感器的用于开关元件和/或移位寄存器的其它MOS晶体管设置在所述基板(1)上。 所述有源层(3')是通过激光退火工艺或高温退火工艺和氢化工艺使所述非晶硅层结晶而获得的,并且所述有源层的陷阱密度小于5×10 11 / cm 2。 光学响应时间短,小于500μs,因此可以实现高于现有图像传感器的10倍的高速度运行。
    • 6. 发明授权
    • Electronic device utilizing a material capable of storing information
which is readable by illumination
    • 利用能够存储可通过照明读取的信息的材料的电子设备
    • US5469424A
    • 1995-11-21
    • US199955
    • 1994-02-22
    • Takashi InushimaRimantas Vaitkus
    • Takashi InushimaRimantas Vaitkus
    • G01J1/42G11B11/08G11C13/04G01J1/02
    • G01J1/429G11B11/08G11C13/047
    • An electronic device comprising a diamond illuminated with ultraviolet radiation, a light source for illuminating the diamond with visible light, and a means for measuring a photocurrent induced in the diamond. The ultraviolet radiation has wavelengths shorter than about 230 nm corresponding to the energy bandgap of the diamond and is made to impinge on the diamond. Then, the light which has wavelengths longer than about 230 nm is made to impinge on the diamond. The photocurrent induced in the diamond is measured. In this way, the amount of the previously emitted ultraviolet radiation having wavelengths shorter than about 230 nm is known. Although the diamond is a primary substance to be illuminated, the substance to be illuminated comprises a material selected from a group consisting of diamond, boron nitride, aluminum nitride and a multi-layer thereof.
    • 一种电子设备,包括用紫外线照射的金刚石,用可见光照射金刚石的光源,以及用于测量在金刚石中引起的光电流的装置。 紫外线辐射具有短于约230nm的波长,对应于金刚石的能量带隙并使其撞击在金刚石上。 然后,使波长超过约230nm的光照射在金刚石上。 测量在金刚石中诱发的光电流。 以这种方式,已知波长短于约230nm的先前发射的紫外线辐射的量。 虽然金刚石是要被照明的主要物质,但被照射的物质包括选自金刚石,氮化硼,氮化铝及其多层的材料。