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    • 7. 发明申请
    • Method of inspecting actual speed of semiconductor integrated circuit
    • 检查半导体集成电路实际速度的方法
    • US20060001434A1
    • 2006-01-05
    • US11128331
    • 2005-05-13
    • Takashi HiramatsuKinya DaioAkiko Fukuda
    • Takashi HiramatsuKinya DaioAkiko Fukuda
    • G01R27/00
    • G01R31/318577
    • It is an object to comprehensively carry out an actual speed inspection without reducing an operating speed in a normal mode in a scan test for a semiconductor integrated circuit. In order to operate a circuit at a proper frequency in a shift operation, to operate the circuit in an actual operation time in a capture operation, and to effectively implement different duty ratios from each other for a group of circuits having different operating frequency characteristics in the capture operation, the duty ratios of respective clocks are changed in a shift operation cycle immediately before a capture operation cycle and the respective clocks are set to have an equal duty ratio in a capture operation cycle. In that case, an NT signal control circuit for generating an NT signal to specify the switching of the shift operation and the capture operation is provided in a semiconductor integrated circuit to execute an operation in response to the NT signal within one clock cycle.
    • 在半导体集成电路的扫描试验中,不会降低正常模式下的运行速度,而是全面地进行实际的速度检查。 为了在移位操作中以适当的频率操作电路,在捕获操作中的实际操作时间内操作电路,并且为具有不同工作频率特性的一组电路有效地实现彼此不同的占空比 在捕获操作周期之前的移位操作周期中,各个时钟的占空比被改变,并且在捕获操作周期中各个时钟被设置为具有相等的占空比。 在这种情况下,在半导体集成电路中提供用于产生用于指定移位操作和捕捉操作的切换的NT信号的NT信号控制电路,以在一个时钟周期内响应于NT信号执行操作。