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    • 2. 发明授权
    • Particle attachment preventing method and substrate processing apparatus
    • 粒子附着防止方法和基板处理装置
    • US08134134B2
    • 2012-03-13
    • US12612990
    • 2009-11-05
    • Takahiro Murakami
    • Takahiro Murakami
    • G21G5/00
    • H01J37/32871H01J37/32091H01J37/32165H01J37/32477
    • In a particle attachment preventing method in a substrate processing apparatus, an electron density control power supplied from the second power supply is adjusted such that an electron density above the substrate gets lower than during a plasma processing, for a preset short period of time after the plasma processing is ended, and a bias power supplied from the first power is maintained for the preset short period of time. The second power supply is a high frequency power supply for supplying a high frequency power having a frequency that is higher than that of the bias power, and in said adjusting of the electron density control power, the high frequency power supplied from the second power supply is lowered as compared with that during the plasma processing.
    • 在基板处理装置中的粒子附着防止方法中,调整从第二电源供给的电子密度控制电力,使得基板上方的电子密度低于等离子体处理期间的电子密度,在预定的短时间段之后 等离子体处理结束,并且从预设的短时间段维持从第一功率提供的偏置功率。 第二电源是用于提供具有高于偏置功率的频率的高频功率的高频电源,并且在所述电子密度控制功率的调整中,从第二电源提供的高频功率 与等离子体处理期间相比降低。
    • 5. 发明申请
    • Envelope for a flat panel display and flat panel display employing the envelope
    • 用于平板显示器的信封和采用信封的平板显示器
    • US20050184637A1
    • 2005-08-25
    • US11044455
    • 2005-01-28
    • Tsunehiko SugawaraTakahiro Murakami
    • Tsunehiko SugawaraTakahiro Murakami
    • H01J1/30H01J11/02H01J29/02H01J29/86H01J31/12H01J23/12
    • H01J31/123H01J29/862H01J2329/861H01J2329/862
    • An envelope for e.g. FED has spacerless structure while increase of the mass due to increase of the thickness of glass is suppressed. Further, the handling of conductors connected to emitters can be easy. An envelope for a flat panel display comprising a glass envelope and a support member for preventing deformation, wherein the glass envelope comprises a front glass and a rear glass, and the support member comprises a rim, bridges and a rear plate. The front glass comprises a face portion for displaying an image and a skirt portion is extended to the rear glass so that a hermetical seal is kept by the contact of a seal edge portion at the end of the skirt portion to the rear glass, the rim supports outer peripheries of outer surfaces of the skirt portion and the face portion, the rear plate is fixed to the rear glass to support the rear glass, and the rim and the rear plate are connected via a plurality of bridges.
    • 一个信封。 FED具有无间隙结构,同时由于玻璃的厚度增加而增加了质量。 此外,连接到发射器的导体的处理可以容易。 一种用于平板显示器的信封,包括玻璃外壳和用于防止变形的支撑构件,其中玻璃外壳包括前玻璃和后玻璃,并且支撑构件包括边缘,桥和后板。 前玻璃包括用于显示图像的面部分,并且裙部延伸到后玻璃,使得通过裙部的端部处的密封边缘部分与后玻璃的接触来保持气密密封,边缘 支撑裙部外表面的外周和面部,后板固定在后玻璃上以支撑后玻璃,并且边缘和后板通过多个桥连接。
    • 6. 发明授权
    • Packed battery examining apparatus
    • 封装电池检查装置
    • US06229281B1
    • 2001-05-08
    • US09446127
    • 2000-04-07
    • Hiroyuki TatsumiToshiaki OkumaTatsuya FuchizakiTakahiro Murakami
    • Hiroyuki TatsumiToshiaki OkumaTatsuya FuchizakiTakahiro Murakami
    • H01M1046
    • H01M10/4257G01R31/3004H01M2/1022H01M10/4285H01M10/48
    • A controller comprises means for transmitting to an interface device, when predetermined data for examination must be acquired from a communication and charge or discharge controller in a packed battery which is an examination object in the step of performing examination processing, a communication command for acquiring the data for examination, the interface device comprises means for converting, when it receives the communication command from the controller, the received communication command into protocol data corresponding to a communication protocol used for communication with the packed battery which is an examination object, means for transmitting the obtained protocol data to the communication and charge or discharge controller in the packed battery which is an examination object, and means for receiving the data for examination which has been fed from the communication and the charge or discharge controller in the packed battery and transmitting the data for examination to the controller.
    • 控制器包括用于发送到接口设备的装置,当在执行检查处理的步骤中作为检查对象的打包电池中的通信和充电或放电控制器必须获取用于检查的预定数据时, 用于检查的数据,接口装置包括用于当接收到来自控制器的通信命令时将接收到的通信命令转换为与用作与检查对象的打包电池进行通信的通信协议相对应的协议数据的装置,用于发送 获取的作为检查对象的包装电池中的通信和充电或放电控制器的协议数据,以及用于接收从通信中馈送的检查数据和包装电池中的充电或放电控制器的装置, 数据进行检查 控制器。
    • 9. 发明授权
    • Apparatus and method for plasma processing
    • 等离子体处理装置及方法
    • US08574446B2
    • 2013-11-05
    • US12536137
    • 2009-08-05
    • Tamotsu MorimotoTakahiro Murakami
    • Tamotsu MorimotoTakahiro Murakami
    • H01L21/00C23F1/00B44C1/22
    • H01J37/32568H01J37/32082
    • At the time of plasma igniting or during plasma processing, only optimizing the distance between electrodes in each case caused a limitation to the prevention of charging damage. To resolve this, a novel plasma processing method employs a plasma processing apparatus which includes an upper electrode to which first high-frequency power is applied, a lower electrode to which second high-frequency power is applied, and a lift mechanism for controlling the spacing between the upper and lower electrodes. The first high-frequency power is applied to the upper electrode to cause plasma igniting. The method is adapted to make the spacing between the upper and lower electrodes larger at least at the time of plasma extinction than during plasma processing of a wafer on the lower electrode.
    • 在等离子体点火或等离子体处理时,仅在每种情况下优化电极之间的距离会对防止充电损坏造成限制。 为了解决这个问题,一种新颖的等离子体处理方法采用等离子体处理装置,其包括施加第一高频功率的上电极,施加第二高频电力的下电极和用于控制间隔的升降机构 在上下电极之间。 将第一高频功率施加到上电极以引起等离子体点火。 该方法适于使得上等电极和下电极之间的间隔至少在等离子体消光时比在下电极上的晶片的等离子体处理期间更大。
    • 10. 发明申请
    • PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
    • 等离子体加工设备和等离子体处理方法
    • US20120241412A1
    • 2012-09-27
    • US13428624
    • 2012-03-23
    • Takahiro MURAKAMI
    • Takahiro MURAKAMI
    • B44C1/22H01L21/3065B05C9/00
    • H01J37/32862B08B7/0035C23C16/4405H01J37/32009H01J37/32495H01J37/32587H01J37/3288H01J2237/022
    • In a plasma processing apparatus for performing a plasma process on a substrate, a damage on a surface of a mounting table can be suppressed without using a dummy wafer when cleaning an inside of the plasma processing apparatus. Upon the completion of a plasma etching process, a surface of the susceptor 3 is exposed, and an inside of a vacuum chamber 1 of the plasma etching apparatus is cleaned by plasma P. Thus, reaction products A adhering to the inside of the vacuum chamber 1 are removed. Here, a DC voltage is applied to the plasma P during the cleaning process. As a result, while obtaining high-density plasma P, the ion energy can be reduced, so that the cleaning process can be performed effectively while suppressing damage on the surface of the susceptor 3.
    • 在用于在基板上进行等离子体处理的等离子体处理装置中,在清洗等离子体处理装置的内部时,可以抑制在安装台的表面上的损坏而不使用伪晶片。 等离子体蚀刻工艺完成后,露出基座3的表面,用等离子体P清洗等离子体蚀刻装置的真空室1的内部。因此,附着在真空室内部的反应产物A 1被删除。 这里,在清洁处理期间,向等离子体P施加直流电压。 结果,在获得高密度等离子体P的同时,可以降低离子能量,从而能够有效地进行清洗处理,同时抑制基座3的表面的损伤。