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1. 发明申请

US20220113813A1 Glasses-Type Terminal 有权
公开(公告)号：US20220113813A1
公开(公告)日：2022-04-14
申请号：US17450599
申请日：2021-10-12
申请人： Hiroyuki IKEDA
发明人： Hiroyuki IKEDA
IPC分类号： G06F3/03 , G06F3/01 , G02B27/00 , G02B27/01 , G06F3/0488 , G06K9/00 , G06T19/00
摘要： When an image capturing apparatus captures an image of an original screen and a finger reflected on an eye of a user, an operation determination unit determines the content of an operation performed with the finger based on image data of the captured image. An operation position identification unit generates data representing a position of the finger on the original screen based on the image data of the captured image. An input control unit recognizes a content of an input instruction corresponding to the operation performed with the finger, based on data on the content of the operation obtained by the operation determination unit, data on the position generated by the operation position identification unit, and data on the original screen stored in a storage unit, and controls the original screen to be displayed on a display apparatus according to the recognized content of the input instruction.

2. 发明授权

US10379626B2 Portable computing device 有权
公开(公告)号：US10379626B2
公开(公告)日：2019-08-13
申请号：US14406989
申请日：2013-03-08
申请人： Hiroyuki Ikeda
发明人： Hiroyuki Ikeda
IPC分类号： G06F3/023 , G06F3/041 , G06F3/0488 , G06F3/0354 , G06F3/0481
摘要： A portable computing device includes a touch screen associated with a display, and a controller that causes a keyboard image and at least one command graphic to be displayed on the display. The command graphic contains a direction-specifying area for selecting a direction of movement of a cursor that is movable within the keyboard image and a selection input area. Touch position information concerning whether the direction-specifying area or the selection input area has been touched is generated by the controller. When the direction-specifying area is touched, the cursor is moved in one or more discrete key image units in a direction of movement indicated by a portion of direction-specifying area that was touched, and when the selection input area is touched, the character of the character key image that the cursor is currently superimposed upon is displayed on the character display field.

3. 发明申请

US20160025983A1 COMPUTER DISPLAY DEVICE MOUNTED ON EYEGLASSES 审中-公开
标题翻译：计算机显示设备安装在眼镜上
公开(公告)号：US20160025983A1
公开(公告)日：2016-01-28
申请号：US14809420
申请日：2015-07-27
申请人： Hiroyuki Ikeda
发明人： Hiroyuki Ikeda
IPC分类号： G02B27/01 , G06F3/0488 , G06F3/01
CPC分类号： G02B27/0172 , G02B27/017 , G02B2027/0138 , G02B2027/0178 , G06F3/01 , G06F3/017 , G06F3/0346 , G06F3/0418 , G06F3/0426 , G06F3/0481 , G06F3/04815 , G06F3/04883 , G06F3/04886
摘要： When an imaging apparatus (30) captures an image of a finger performing an operation on a visual confirmation screen (S2), an operation determining unit (73) of a computer display device (1) mounted on eyeglasses (10) determines the contents of the operation performed by the finger based on image data obtained by the imaging apparatus (30). A positional data generating unit (74) generates positional data of the finger based on the image data. Based on data concerning the determined contents of the operation performed by the finger, the generated positional data of the finger, and reference data concerning the visual confirmation screen stored in a storage unit (90), an input control unit (76) determines the contents of an inputted instruction corresponding to the operation performed by the finger, and controls an original screen to be displayed on an display apparatus (20) in accordance with the determined contents of the inputted instruction.
摘要翻译：当成像装置（30）拍摄在视觉确认画面上执行操作的手指的图像（S2）时，安装在眼镜（10）上的计算机显示装置（1）的操作确定单元（73）确定内容基于由成像装置（30）获得的图像数据由手指执行的操作。位置数据生成单元（74）基于图像数据生成手指的位置数据。根据关于由手指执行的操作确定的内容的数据，生成的手指的位置数据和与存储在存储单元（90）中的可视确认画面有关的参考数据，输入控制单元（76）确定内容对与手指进行的操作相对应的输入指令，根据输入指令的确定内容，控制要在显示装置（20）上显示的原始画面。

4. 发明授权

US08358340B2 Pattern inspection device and method of inspecting pattern 失效
标题翻译：图案检查装置及检验方式
公开(公告)号：US08358340B2
公开(公告)日：2013-01-22
申请号：US12477666
申请日：2009-06-03
申请人： Ryoji Yoshikawa , Tomohide Watanabe , Hiromu Inoue , Hiroyuki Ikeda , Hiroyuki Tanizaki
发明人： Ryoji Yoshikawa , Tomohide Watanabe , Hiromu Inoue , Hiroyuki Ikeda , Hiroyuki Tanizaki
IPC分类号： H04N7/18 , H04N9/47
CPC分类号： G01N21/95607 , G01N2021/95676 , G06T7/001 , G06T2207/30148
摘要： A pattern inspection device according to the embodiment, includes: an image picking-up portion for picking-up an image of a pattern formation member in which a plurality of opening patterns are formed so as to obtain a picked-up image of the pattern formation member; a reference image obtaining portion for obtaining a reference image used for comparing with the picked-up image; and a pattern defect detecting portion for matching the center locations of the opening pattern images respectively between the picked-up image and the reference image, forming difference images of the opening pattern images between the picked-up image and the reference image per the opening pattern and detecting the defect of the opening pattern base on the difference images.
摘要翻译：根据实施例的图案检查装置包括：图像拾取部分，用于拾取其中形成有多个开口图案的图案形成构件的图像，以便获得图案形成的拾取图像会员; 参考图像获取部分，用于获得用于与所拾取的图像进行比较的参考图像; 以及图案缺陷检测部分，用于分别在拾取图像和参考图像之间匹配打开图案图像的中心位置，形成每个打开图案的拍摄图像和参考图像之间的打开图案图像的差异图像并且基于差分图像检测打开图案的缺陷。

5. 发明申请

US20110255770A1 INSPECTION SYSTEM AND METHOD FOR INSPECTING LINE WIDTH AND/OR POSITIONAL ERRORS OF A PATTERN 有权
标题翻译：用于检查图案的线宽和/或位置错误的检查系统和方法
公开(公告)号：US20110255770A1
公开(公告)日：2011-10-20
申请号：US13083157
申请日：2011-04-08
申请人： Takanao Touya , Shuichi Tamamushi , Hidenori Sato , Hiroyuki Tanizaki , Takeshi Fujiwara , Eiji Sawa , Kentaro Okuda , Hiroyuki Ikeda , Hiromu Inoue , Hiroshi Tsukada
发明人： Takanao Touya , Shuichi Tamamushi , Hidenori Sato , Hiroyuki Tanizaki , Takeshi Fujiwara , Eiji Sawa , Kentaro Okuda , Hiroyuki Ikeda , Hiromu Inoue , Hiroshi Tsukada
IPC分类号： G06K9/00
CPC分类号： G06T7/001 , G01N21/9501 , G01N21/9503 , G01N21/956 , G06T7/0004 , G06T7/0006 , G06T7/70 , G06T7/74 , G06T2207/10004 , G06T2207/30141 , G06T2207/30148
摘要： A method and system for imaging an object to be inspected and obtaining an optical image; creating a reference image from design pattern data; preparing an inspection recipe including one or more templates and parameter settings necessary for the inspection; checking the pattern and the template against each other, and selecting the reference image which corresponds to the template; detecting first and second edges in the selected reference image in accordance with the parameter setting using determined coordinates as a reference; detecting first and second edges in the optical image, this optical image corresponds to the selected reference image; and determining an inspection value by acquiring the difference between the line width of the optical image and the reference image using the first edge and second edge of the reference image and the first edge and second edges of the optical image.
摘要翻译：一种用于对待检查对象进行成像并获得光学图像的方法和系统; 从设计模式数据创建参考图像; 准备包括一个或多个模板和检查所需的参数设置的检查配方; 检查图案和模板，并选择与模板对应的参考图像; 根据使用确定的坐标作为参考的参数设置来检测所选参考图像中的第一和第二边缘; 检测光学图像中的第一和第二边缘，该光学图像对应于所选择的参考图像; 以及通过使用参考图像的第一边缘和第二边缘以及光学图像的第一边缘和第二边缘获取光学图像的线宽和参考图像之间的差来确定检查值。

6. 发明申请

US20110169001A1 DISPLAY DEVICE, SWITCHING CIRCUIT AND FIELD EFFECT TRANSISTOR 有权
标题翻译：显示设备，切换电路和场效应晶体管
公开(公告)号：US20110169001A1
公开(公告)日：2011-07-14
申请号：US12984767
申请日：2011-01-05
申请人： Yoshitaka Ozeki , Yasuhito Kuwahara , Shigetaka Toriyama , Hiroyuki Ikeda
发明人： Yoshitaka Ozeki , Yasuhito Kuwahara , Shigetaka Toriyama , Hiroyuki Ikeda
IPC分类号： H01L29/04 , H01L21/84
CPC分类号： H01L29/78696 , G02F1/13624 , G02F1/136286 , H01L29/42384 , H01L29/78609 , H01L29/78645
摘要： A this film transistor is provided. The thin film transistor includes a semiconductor layer including a source region, a drain region, and a channel region, wherein the channel region is provided between the source region and the drain region; and a gate electrode overlapping with the channel region, wherein the channel region includes at least a portion of a channel width that is configured to at least one of continuously decrease and continuously increase in a lengthwise direction.
摘要翻译：提供了这种胶片晶体管。所述薄膜晶体管包括：源区域，漏极区域和沟道区域的半导体层，其中所述沟道区域设置在所述源极区域和所述漏极区域之间; 以及与沟道区重叠的栅极，其中沟道区包括沟道宽度的至少一部分，其被配置为在长度方向上连续减小并连续增加中的至少一个。

7. 发明授权

US07633067B2 Security sensor device having frost protective step 有权
标题翻译：具有防霜保护步骤的安全传感器装置
公开(公告)号：US07633067B2
公开(公告)日：2009-12-15
申请号：US11909483
申请日：2006-03-29
申请人： Hiroyuki Ikeda
发明人： Hiroyuki Ikeda
IPC分类号： H05K7/00
CPC分类号： G08B29/18 , G08B13/183
摘要： In a security sensor device an element unit (21) including a sensor elements (15, 23) for transmitting or receiving a detection wave (IR) is supported on a sensor body (41) in such a manner as to adjust a horizontal deflecting angle and a vertical deflecting angle θv; a cover (43) is attached to the sensor body; and the center of pivotal movement (10) for the vertical deflection is displaced downward or upward from the intermediate portion of the element unit. A recessed portion (56) recessed inwardly of the cover is formed in a part of the cover corresponding to the part, to which the center of pivotal movement of the element unit is displaced, through a stepped portion (44). A hood (17) for shielding a part of the region, where the detection wave passes for, from the airy region is provided above and near the center of pivotal movement.
摘要翻译：在安全传感器装置中，包括用于发送或接收检测波（IR）的传感器元件（15,23）的元件单元（21）以调节水平偏转角度的方式被支撑在传感器主体（41）上和垂直偏转角度盖（43）附接到传感器主体; 并且用于垂直偏转的枢转运动的中心（10）从元件单元的中间部分向下或向上移位。在盖子的内部凹入部分（56）形成在盖子的与元件单元的枢转运动的中心位移的部分相对应的部分中，通过阶梯部分（44）。用于屏蔽来自通风区域的检测波通过的区域的一部分的罩（17）设置在枢转运动的中心的上方和附近。

8. 发明申请

US20090303323A1 PATTERN INSPECTION DEVICE AND METHOD OF INSPECTING PATTERN 失效
标题翻译：图案检查装置及检查图案的方法
公开(公告)号：US20090303323A1
公开(公告)日：2009-12-10
申请号：US12477666
申请日：2009-06-03
申请人： Ryoji Yoshikawa , Tomohide Watanabe , Hiromu Inoue , Hiroyuki Ikeda , Hiroyuki Tanizaki
发明人： Ryoji Yoshikawa , Tomohide Watanabe , Hiromu Inoue , Hiroyuki Ikeda , Hiroyuki Tanizaki
IPC分类号： H04N7/18 , G06K9/00
CPC分类号： G01N21/95607 , G01N2021/95676 , G06T7/001 , G06T2207/30148
摘要： A pattern inspection device according to the embodiment, includes: an image picking-up portion for picking-up an image of a pattern formation member in which a plurality of opening patterns are formed so as to obtain a picked-up image of the pattern formation member; a reference image obtaining portion for obtaining a reference image used for comparing with the picked-up image; and a pattern defect detecting portion for matching the center locations of the opening pattern images respectively between the picked-up image and the reference image, forming difference images of the opening pattern images between the picked-up image and the reference image per the opening pattern and detecting the defect of the opening pattern base on the difference images.
摘要翻译：根据实施例的图案检查装置包括：图像拾取部分，用于拾取其中形成有多个开口图案的图案形成构件的图像，以便获得图案形成的拾取图像会员; 参考图像获取部分，用于获得用于与所拾取的图像进行比较的参考图像; 以及图案缺陷检测部分，用于分别在拾取图像和参考图像之间匹配打开图案图像的中心位置，形成每个打开图案的拍摄图像和参考图像之间的打开图案图像的差异图像并且基于差分图像检测打开图案的缺陷。

9. 发明申请

US20080258177A1 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE 审中-公开
标题翻译：制造半导体器件和半导体器件的方法
公开(公告)号：US20080258177A1
公开(公告)日：2008-10-23
申请号：US12102777
申请日：2008-04-14
申请人： Hiroyuki IKEDA , Toshio Sasaki , Akinobu Watanabe , Toshio Yamada , Akihisa Uchida
发明人： Hiroyuki IKEDA , Toshio Sasaki , Akinobu Watanabe , Toshio Yamada , Akihisa Uchida
IPC分类号： H01L27/088
CPC分类号： H01L27/11 , G11C5/14 , H01L27/0207
摘要： Wirings connected to a gate electrode of a slave switch circuit cell for substrate bias circuits are respectively electrically connected to a wiring for a power supply potential and a wiring for a reference potential. Thus, the switch operation of the slave switch circuit cell is made invalid. Wirings connected to n wells of respective circuit cells are electrically connected to a wiring for the power supply potential, and wirings connected to p wells of the respective circuit cells are electrically connected to the wiring. Thus, the n wells are fixed to the power supply potential, and the p wells are fixed to the reference potential.
摘要翻译：连接到用于衬底偏置电路的从属开关电路单元的栅电极的布线分别电连接到用于电源电位的布线和用于参考电位的布线。因此，从开关电路单元的开关动作无效。连接到各个电路单元的n个阱的布线电连接到用于电源电位的布线，并且连接到各个电路单元的p阱的布线电连接到布线。因此，n个阱被固定到电源电位，并且p阱被固定到参考电位。

10. 发明授权

US07378201B2 Method for repairing a photomask, method for inspecting a photomask, method for manufacturing a photomask, and method for manufacturing a semiconductor device 有权
标题翻译：修复光掩模的方法，光掩模检查方法，光掩模的制造方法以及半导体装置的制造方法
公开(公告)号：US07378201B2
公开(公告)日：2008-05-27
申请号：US11478650
申请日：2006-07-03
申请人： Katsuki Ohashi , Hiromu Inoue , Akira Ono , Hiroyuki Ikeda
发明人： Katsuki Ohashi , Hiromu Inoue , Akira Ono , Hiroyuki Ikeda
IPC分类号： G03C5/00 , G03F9/00 , G03K9/00
CPC分类号： G03F7/70058 , G01N21/956 , G01N2021/95676 , G03F1/72 , G03F1/84 , Y10S430/146
摘要： A method for inspecting a photomask, comprising generating a laser beam, changing a phase of the laser beam to smooth the brightness distribution of the laser beam, applying the smoothed laser beam to the photomask, acquiring an image of the photomask using a sensor while the laser beam and the photomask are relatively moved, examining the image of the photomask for a defect of the mask-pattern of the photomask.
摘要翻译：一种用于检查光掩模的方法，包括产生激光束，改变激光束的相位以平滑激光束的亮度分布，将平滑的激光束施加到光掩模，使用传感器获取光掩模的图像，同时激光束和光掩模相对移动，检查光掩模的图像以获得光掩模的掩模图案的缺陷。

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