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    • 2. 发明申请
    • MAGNETIC MEMORY ELEMENT AND NONVOLATILE MEMORY DEVICE
    • 磁记忆元件和非易失性存储器件
    • US20130070523A1
    • 2013-03-21
    • US13416408
    • 2012-03-09
    • Daisuke SaidaMinoru AmanoJunichi Ito
    • Daisuke SaidaMinoru AmanoJunichi Ito
    • G11C11/15
    • G11C11/16G11C11/161G11C11/1659G11C11/1673G11C11/1675H01L27/228H01L43/08
    • According to one embodiment, a magnetic memory element includes a stacked body including first and second stacked units. The first stacked unit includes first and second ferromagnetic layers and a first nonmagnetic layer. A magnetization of the first ferromagnetic layer is fixed in a direction perpendicular to the first ferromagnetic layer. A magnetization of the second ferromagnetic layer is variable. The first nonmagnetic layer is provided between the first and second ferromagnetic layers. The second stacked unit stacked with the first stacked unit includes third and fourth ferromagnetic layers and a second nonmagnetic layer. A magnetization of the third ferromagnetic layer is variable. The fourth ferromagnetic layer is stacked with the third ferromagnetic layer. A magnetization of the fourth ferromagnetic layer is fixed in a direction perpendicular to the fourth ferromagnetic layer. The second nonmagnetic layer is provided between the third and fourth ferromagnetic layers.
    • 根据一个实施例,磁存储元件包括包括第一和第二堆叠单元的堆叠体。 第一堆叠单元包括第一和第二铁磁层和第一非磁性层。 第一铁磁层的磁化在垂直于第一铁磁层的方向固定。 第二铁磁层的磁化是可变的。 第一非磁性层设置在第一和第二铁磁层之间。 与第一堆叠单元堆叠的第二堆叠单元包括第三和第四铁磁层和第二非磁性层。 第三铁磁层的磁化是可变的。 第四铁磁层与第三铁磁层层叠。 第四铁磁层的磁化在垂直于第四铁磁层的方向固定。 第二非磁性层设置在第三和第四铁磁层之间。
    • 3. 发明申请
    • NONVOLATILE MEMORY DEVICE
    • 非易失性存储器件
    • US20130070522A1
    • 2013-03-21
    • US13416076
    • 2012-03-09
    • Daisuke SaidaMinoru AmanoTazumi NagasawaYuichi OhsawaJunichi Ito
    • Daisuke SaidaMinoru AmanoTazumi NagasawaYuichi OhsawaJunichi Ito
    • G11C11/15
    • G11C11/16G11C11/161G11C11/1659G11C11/1673G11C11/1675H01L27/228H01L43/08
    • According to one embodiment, a nonvolatile memory device includes a magnetic memory element and a control unit. The magnetic memory element includes a stacked body including first and second stacked units. The first stacked unit includes a first ferromagnetic layer having a magnetization fixed, a second ferromagnetic layer having a magnetization variable and a first nonmagnetic layer provided between the first and second ferromagnetic layers. The second includes a third ferromagnetic layer having a magnetization rorated by a passed current to produce oscillation, a fourth ferromagnetic layer having a magnetization fixed and a second nonmagnetic layer provided between the third and fourth ferromagnetic layers stacked with each other. A frequency of the oscillation changes in accordance with the direction of the magnetization of the second ferromagnetic layer. The control unit includes a reading unit reading out the magnetization of the second ferromagnetic layer.
    • 根据一个实施例,非易失性存储器件包括磁存储元件和控制单元。 磁存储元件包括包括第一和第二堆叠单元的堆叠体。 第一堆叠单元包括具有磁化固定的第一铁磁层,具有磁化变化的第二铁磁层和设置在第一和第二铁磁层之间的第一非磁性层。 第二铁磁层具有通过通过的电流产生振荡的磁化的第三铁磁层,具有磁化固定的第四铁磁层和设置在彼此堆叠的第三和第四铁磁层之间的第二非磁性层。 振荡的频率根据第二铁磁层的磁化方向而变化。 控制单元包括读出第二铁磁层的磁化的读取单元。
    • 10. 发明授权
    • Tunnel magnetoresistance effect device, and a portable personal device
    • 隧道磁阻效应器,以及便携式个人设备
    • US07359163B2
    • 2008-04-15
    • US10884946
    • 2004-07-07
    • Minoru AmanoYoshiaki Saito
    • Minoru AmanoYoshiaki Saito
    • G11B5/33
    • H01L43/08B82Y10/00B82Y25/00G01R33/093G01R33/098G11B5/3906G11B5/3909G11C11/15H01F10/3254H01F10/3268H01F10/3272H01L27/228
    • A TMR device comprising an antiferromagnetic layer made of an antiferromagnetic material containing Mn, a magnetization fixed layer made of a ferromagnetic material, a tunnel barrier layer made of a dielectric material, and a magnetization free layer made of a ferromagnetic material. An insulator material layer is inserted in the magnetization fixed layer at a distance from the antiferromagnetic material layer and the tunnel barrier layer. One material can be expressed by NX, where X is a first element selected from the group consisting of oxygen, nitrogen and carbon; and N is a second element, provided that the bonding energy between the first and the second elements is higher than the bonding energy between manganese and the first element. A second material can be expressed by MX, where M is an element selected from the group consisting of titanium, tantalum, vanadium, aluminum, europium, and scandium; and X is an element selected from the group consisting of oxygen, nitrogen and carbon. The tunnel magnetoresistance effect device suppresses the diffusion of Mn from the Mn based alloy constituting the antiferromagnetic material layer even after heat treatment is performed.
    • 一种TMR装置,包括由含铁的反铁磁材料制成的反铁磁层,由铁磁材料制成的磁化固定层,由介电材料制成的隧道势垒层和由铁磁材料制成的无磁化层。 将绝缘体材料层插入到与反铁磁性材料层和隧道势垒层相隔一定距离的磁化固定层中。 一种材料可由NX表示,其中X是选自氧,氮和碳的第一元素; 并且N是第二元素,条件是第一和第二元素之间的结合能高于锰与第一元素之间的键合能。 第二种材料可以由MX表示,其中M是选自钛,钽,钒,铝,铕和钪的元素; X是选自氧,氮和碳的元素。 隧道磁阻效应器件即使在进行热处理之后也能抑制构成反铁磁体层的Mn基合金的Mn扩散。