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1. 发明授权

US08695110B2 Scanning probe microscope and sample observing method using the same 有权
标题翻译：扫描探针显微镜及使用其的样品观察方法
公开(公告)号：US08695110B2
公开(公告)日：2014-04-08
申请号：US13586754
申请日：2012-08-15
申请人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Motoyuki Hirooka
发明人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Motoyuki Hirooka
IPC分类号： G01Q70/00 , G01Q70/16 , G01N13/00
CPC分类号： G01Q60/18 , G01Q60/22
摘要： In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample.
摘要翻译：在使用孔径探针的近场扫描显微镜中，实际上孔径形成的上限为至多几十nm。在使用散射探针的近场扫描显微镜中，由于外部照明光作为背景噪声，分辨能力被限制在至多几十nm。此外，通过探针的损伤或磨损，测量再现性被严重降低。可以以nm级分辨能力和高再现性测量样品表面的光学数据和不均匀性数据，同时通过制造具有nm级光学分辨率的等离子体增强近场探针而不损害探针和样品通过将nm级圆柱形结构与nm级微粒组合，并在样品上的各个测量点处以低接触力将探针重复地移动到样品并从中离开它们的能力。

2. 发明授权

US07732764B2 Field emission electron gun and electron beam applied device using the same 有权
标题翻译：场发射电子枪和电子束施加装置使用相同
公开(公告)号：US07732764B2
公开(公告)日：2010-06-08
申请号：US11831989
申请日：2007-08-01
申请人： Tadashi Fujieda , Makoto Okai , Kishio Hidaka , Mitsuo Hayashibara , Shunichi Watanabe
发明人： Tadashi Fujieda , Makoto Okai , Kishio Hidaka , Mitsuo Hayashibara , Shunichi Watanabe
IPC分类号： H01J31/073 , H01J37/26 , H01J37/30
CPC分类号： H01J37/073 , B82Y10/00 , B82Y40/00 , H01J1/3044 , H01J9/025 , H01J37/3174 , H01J2201/3043 , H01J2201/30434 , H01J2201/30469 , H01J2201/30484 , H01J2201/30488 , H01J2201/30496 , H01J2237/06341 , H01J2237/26
摘要： The object of the present invention is to enable the optical axis of an electron beam of a field emission electron gun mounting thereon an electron gun composed of a fibrous carbon material to be adjusted easily. Moreover, it is also to obtain an electron beam whose energy spread is narrower than that of the electron gun. Further, it is also to provide a high resolution electron beam applied device mounting thereon the field emission electron gun. The means for achieving the objects of the present invention is in that the fibrous carbon material is coated with a material having a band gap, in the field emission electron gun including an electron source composed of a fibrous carbon material and an electrically conductive base material for supporting the fibrous carbon material, an extractor for field-emitting electrons, and an accelerator for accelerating the electrons. Moreover, it is also to apply the field emission electron gun to various kinds of electron beam applied devices.
摘要翻译：本发明的目的是使得能够容易地调整由其上安装有由纤维状碳材料构成的电子枪的场发射电子枪的电子束的光轴。此外，还要获得能量扩散比电子枪窄的电子束。此外，还提供安装在其上的高分辨率电子束施加装置的场致发射电子枪。用于实现本发明的目的的手段在于，在场发射电子枪中包括具有带隙的材料的纤维状碳材料包括由纤维状碳材料构成的电子源和用于支撑纤维状碳材料，用于场发射电子的提取器和用于加速电子的加速器。此外，还将场致发射电子枪应用于各种电子束施加装置。

3. 发明申请

US20100064396A1 SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME 有权
标题翻译：扫描探针显微镜和使用其的样品观察方法
公开(公告)号：US20100064396A1
公开(公告)日：2010-03-11
申请号：US12523369
申请日：2008-02-26
申请人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Motoyuki Hirooka
发明人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Motoyuki Hirooka
IPC分类号： G01Q60/18 , G01Q60/24
CPC分类号： G01Q60/18 , G01Q60/22
摘要： In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample.
摘要翻译：在使用孔径探针的近场扫描显微镜中，实际上孔径形成的上限为至多几十nm。在使用散射探针的近场扫描显微镜中，由于外部照明光作为背景噪声，分辨能力被限制在至多几十nm。此外，通过探针的损伤或磨损，测量再现性被严重降低。可以以nm级分辨能力和高再现性测量样品表面的光学数据和不均匀性数据，同时通过制造具有nm级光学分辨率的等离子体增强近场探针而不损害探针和样品通过将nm级圆柱形结构与nm级微粒组合，并在样品上的各个测量点处以低接触力将探针重复地移动到样品并从中离开它们的能力。

4. 发明申请

US20080315747A1 Electron emitting element, electron gun, and electron beam applied equipment using the same 审中-公开
标题翻译：电子发射元件，电子枪和使用其的电子束施加设备
公开(公告)号：US20080315747A1
公开(公告)日：2008-12-25
申请号：US12076888
申请日：2008-03-25
申请人： Makoto Okai , Tadashi Fujieda , Kishio Hidaka , Mitsuo Hayashibara , Shun-ichi Watanabe
发明人： Makoto Okai , Tadashi Fujieda , Kishio Hidaka , Mitsuo Hayashibara , Shun-ichi Watanabe
IPC分类号： H01J29/46
CPC分类号： H01J37/073 , H01J37/28
摘要： An electron emitting element having a cap portion 103 with a closed structure and a columnar axis portion 101a comprising a tubular material composed mostly of carbon and a conductive base material for immobilizing the tubular material, characterized in that; the cap portion 103 includes a plurality of five-membered ring structures 104 made by atoms which constitute the tubular material and the distance between the five-membered ring structures 104 is 30 nm or more.
摘要翻译：电子发射元件具有封闭结构的盖部分103和包括主要由碳组成的管状材料的柱状轴线部分101a和用于固定管状材料的导电基底材料，其特征在于：盖部分103包括由构成管状材料的原子制成的多个五元环结构104，并且五元环结构104之间的距离为30nm以上。

5. 发明授权

US07239261B2 Electromagnetic wave absorption material and an associated device 有权
标题翻译：电磁波吸收材料及相关装置
公开(公告)号：US07239261B2
公开(公告)日：2007-07-03
申请号：US10913494
申请日：2004-08-09
申请人： Tadashi Fujieda , Kishio Hidaka , Shinzou Ikeda , Mitsuo Hayashibara , Noriyuki Taguchi
发明人： Tadashi Fujieda , Kishio Hidaka , Shinzou Ikeda , Mitsuo Hayashibara , Noriyuki Taguchi
IPC分类号： H01Q17/00 , H05K9/00
CPC分类号： H05K9/0083 , B82Y10/00 , B82Y30/00 , H01L2224/16225 , H01L2224/48091 , H01L2224/48227 , H01L2924/01012 , H01L2924/01025 , H01L2924/01046 , H01L2924/01078 , H01L2924/01079 , H01L2924/12041 , H01L2924/1423 , H01L2924/16152 , H01L2924/3011 , H01L2924/3025 , H01Q17/004 , H05K3/284 , H05K9/0024 , Y10S977/932 , H01L2924/00014 , H01L2924/00
摘要： The purpose of the present invention is to provide an easy-to-manufacture electromagnetic wave absorption material usable from submillimeter wave region to millimeter wave region with an excellent radio wave absorbing performance and a variety of usage thereof.The present invention is characterized by an electromagnetic wave absorption material comprised of a dispersions of at least one of the materials: a multi-layer hollow globule of carbon, a schungite carbon, and the schungite ore; mixed into a matter having a high electrical resistivity. The invention is further characterized by an electronic device, an optical transmission module, an optical reception module, a high frequency telecommunication equipment, and a stop-free automated tollgate system, wherein at least a part of their board, electronic element, and circuit wiring are covered with said electromagnetic wave absorption material.
摘要翻译：本发明的目的是提供一种易于制造的电磁波吸收材料，其可从亚毫米波区域到毫米波区域使用，具有优异的无线电波吸收性能和各种用途。本发明的特征在于电磁波吸收材料由至少一种材料的分散体构成：碳酸多层中空球，schiteite碳和schiteite矿石; 混合成具有高电阻率的物质。本发明的特征还在于电子设备，光传输模块，光接收模块，高频电信设备和无停止自动收费系统，其中至少一部分电路板，电子元件和电路布线被所述电磁波吸收材料覆盖。

6. 发明授权

US06574966B2 Gas turbine for power generation 有权
标题翻译：用于发电的燃气轮机
公开(公告)号：US06574966B2
公开(公告)日：2003-06-10
申请号：US10124406
申请日：2002-04-18
申请人： Kishio Hidaka , Shigeyoshi Nakamura , Yutaka Fukui , Masao Shiga , Ryo Hiraga , Hajime Toriya , Toshio Fujita
发明人： Kishio Hidaka , Shigeyoshi Nakamura , Yutaka Fukui , Masao Shiga , Ryo Hiraga , Hajime Toriya , Toshio Fujita
IPC分类号： F02C700
CPC分类号： C22C38/44 , C21D6/004 , C21D9/0068 , C21D9/28 , C21D2201/04 , C21D2211/008 , C22C19/03 , C22C38/001 , C22C38/04 , C22C38/46 , C22C38/48 , C22C38/52 , F01D5/225 , F01D5/28 , F01D5/3053 , F02C6/18 , F05D2260/201 , F05D2260/205 , F05D2260/2322 , F05D2300/607
摘要： A gas turbine for power generation operated at a turbine nozzle inlet temperature ranging from 1200 to 1650° C., which is improved to obtain a high heat efficiency by making disk blades and nozzles arranged in first to final stages from optimum materials and optimally cooling these disk blades and nozzles, and to obtain a combined power generation system using the gas turbine. The combined power generation system includes a highly efficient gas turbine operated at a turbine nozzle inlet combustion gas temperature ranging from 1200 to 1650° C., and a high pressure-intermediate pressure-low pressure integral type steam turbine operated at a steam inlet temperature of 530° C. or more, wherein the gas turbine is configured such that turbine blades, nozzles and disks are each cooled, and the blades and nozzles are each made from an Ni-based alloy having a single crystal or columnar crystal structure and disks are made from a martensite steel.
摘要翻译：用于发电的燃气轮机在1200至1650℃的涡轮喷嘴入口温度下运行，其通过使盘片和喷嘴从最佳材料的第一到最后阶段排列而最佳地冷却，从而获得高的热效率磁盘叶片和喷嘴，并且获得使用燃气轮机的组合发电系统。组合发电系统包括在涡轮喷嘴入口燃烧气体温度范围为1200至1650℃的高效燃气轮机和高在530℃或更高的蒸气入口温度下工作的压力 - 中压低压一体式蒸汽轮机，其中燃气轮机被构造成使得涡轮机叶片，喷嘴和盘都被冷却，并且叶片和喷嘴各自由具有单晶或柱状晶体结构的Ni基合金制成，圆盘由马氏体钢制成。

7. 发明授权

US5911842A Heat resisting steel and steam turbine rotor shaft and method of making thereof 失效
标题翻译：耐热钢和汽轮机转子轴及其制造方法
公开(公告)号：US5911842A
公开(公告)日：1999-06-15
申请号：US841676
申请日：1997-04-30
申请人： Masao Shiga , Kishio Hidaka , Norio Yamada , Shigeyoshi Nakamura , Yutaka Fukui , Nobuo Shimizu , Ryoichi Kaneko , Yasuhiro Harada , Yasuo Watanabe , Toshio Fujita , Norio Morisada , Yasuhiko Tanaka
发明人： Masao Shiga , Kishio Hidaka , Norio Yamada , Shigeyoshi Nakamura , Yutaka Fukui , Nobuo Shimizu , Ryoichi Kaneko , Yasuhiro Harada , Yasuo Watanabe , Toshio Fujita , Norio Morisada , Yasuhiko Tanaka
IPC分类号： F01D5/02 , C21D9/28 , C21D9/38 , C22C38/00 , C22C38/22 , C22C38/24 , C22C38/26 , C22C38/30 , C22C38/32 , C22C38/54 , F01D5/06 , C21D8/10 , C21D9/30
CPC分类号： C22C38/32 , C21D9/28 , C22C38/001 , C22C38/22 , C22C38/24 , C22C38/26 , C22C38/30 , C21D2211/008
摘要： A heat resisting steel whose metal structure is entirely martensite phase produced by tempering after quenching. The steel comprises, by weight, 0.05 to 0.20% C, not more than 0.15% Si, not more than 1.5% Mn, not more than 1.0% Ni, 8.5 to 13.0% Cr, not more than 3.50% Mo, not more than 3.5% W, 0.05 to 0.30% V, 0.01 to 0.20% Nb, not more than 5.0% Co, 0.001 to 0.020% boron, 0.005 to 0.040% nitrogen, 0.0005 to 0.0050% oxygen and 0.00001 to 0.0002% hydrogen. The steel has preferably not more than 10 of the Cr equivalent. The steel has 10 kgf/mm.sup.2 or more of 100,000 hours creep rupture strength at 650.degree. C.
摘要翻译：淬火后通过回火生产金属结构完全是马氏体相的耐热钢。该钢包含0.05〜0.20％的C，不大于0.15％的Si，不超过1.5％的Mn，不超过1.0％的Ni，8.5〜13.0％的Cr，不大于3.50％的Mo，不大于 3.5％W，0.05〜0.30％V，0.01〜0.20％Nb，5.0％以下的Co，0.001〜0.020％的硼，0.005〜0.040％的氮，0.0005〜0.0050％的氧和0.00001〜0.0002％的氢。钢优选不超过10当量的Cr当量。该钢在650℃下具有10kgf / mm 2以上的100,000小时蠕变断裂强度

8. 发明申请

US20120204297A1 Scanning Probe Microscope and Method of Observing Sample Using the Same 有权
标题翻译：扫描探针显微镜及其使用方法
公开(公告)号：US20120204297A1
公开(公告)日：2012-08-09
申请号：US13446279
申请日：2012-04-13
申请人： Toshihiko NAKATA , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Makoto Okai , Toshiaki Morita , Motoyuki Hirooka
发明人： Toshihiko NAKATA , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Makoto Okai , Toshiaki Morita , Motoyuki Hirooka
IPC分类号： G01Q60/06 , G01Q60/18 , B82Y15/00
CPC分类号： G01Q60/06 , G01N21/648 , G01Q60/22 , G01Q70/12
摘要： Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force.
摘要翻译：以纳米级分辨率和高重现性测量样品表面的光学信息和地形信息，而不损害探针和样品，通过将纳米级圆柱结构与纳米级微结构组合以形成等离子体激元附近具有纳米级光学分辨率并且以低接触力重复将样品上的每个测量点的探针接近/退回。

9. 发明授权

US08181268B2 Scanning probe microscope and method of observing sample using the same 有权
标题翻译：扫描探针显微镜及使用其的观察样品的方法
公开(公告)号：US08181268B2
公开(公告)日：2012-05-15
申请号：US12864196
申请日：2008-12-18
申请人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Makoto Okai , Toshiaki Morita , Motoyuki Hirooka
发明人： Toshihiko Nakata , Masahiro Watanabe , Takashi Inoue , Kishio Hidaka , Makoto Okai , Toshiaki Morita , Motoyuki Hirooka
IPC分类号： G01N13/10
CPC分类号： G01Q60/06 , G01N21/648 , G01Q60/22 , G01Q70/12
摘要： Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force.
摘要翻译：以纳米级分辨率和高重现性测量样品表面的光学信息和地形信息，而不损害探针和样品，通过将纳米级圆柱结构与纳米级微结构组合以形成等离子体激元附近具有纳米级光学分辨率并且以低接触力重复将样品上的每个测量点的探针接近/退回。

10. 发明申请

US20080029700A1 FIELD EMISSION ELECTRON GUN AND ELECTRON BEAM APPLIED DEVICE USING THE SAME 有权
标题翻译：现场发射电子枪和使用该电子枪的电子束应用装置
公开(公告)号：US20080029700A1
公开(公告)日：2008-02-07
申请号：US11831989
申请日：2007-08-01
申请人： TADASHI FUJIEDA , Makoto Okai , Kishio Hidaka , Mitsuo Hayashibara , Shunichi Watanabe
发明人： TADASHI FUJIEDA , Makoto Okai , Kishio Hidaka , Mitsuo Hayashibara , Shunichi Watanabe
IPC分类号： H01J37/073 , H01J37/26 , H01J37/30
CPC分类号： H01J37/073 , B82Y10/00 , B82Y40/00 , H01J1/3044 , H01J9/025 , H01J37/3174 , H01J2201/3043 , H01J2201/30434 , H01J2201/30469 , H01J2201/30484 , H01J2201/30488 , H01J2201/30496 , H01J2237/06341 , H01J2237/26
摘要： The object of the present invention is to enable the optical axis of an electron beam of a field emission electron gun mounting thereon an electron gun composed of a fibrous carbon material to be adjusted easily. Moreover, it is also to obtain an electron beam whose energy spread is narrower than that of the electron gun. Further, it is also to provide a high resolution electron beam applied device mounting thereon the field emission electron gun. The means for achieving the objects of the present invention is in that the fibrous carbon material is coated with a material having a band gap, in the field emission electron gun including an electron source composed of a fibrous carbon material and an electrically conductive base material for supporting the fibrous carbon material, an extractor for field-emitting electrons, and an accelerator for accelerating the electrons. Moreover, it is also to apply the field emission electron gun to various kinds of electron beam applied devices.
摘要翻译：本发明的目的是使得能够容易地调整由其上安装有由纤维状碳材料构成的电子枪的场发射电子枪的电子束的光轴。此外，还要获得能量扩散比电子枪窄的电子束。此外，还提供安装在其上的高分辨率电子束施加装置的场致发射电子枪。用于实现本发明的目的的手段在于，在场发射电子枪中包括具有带隙的材料的纤维状碳材料包括由纤维状碳材料构成的电子源和用于支撑纤维状碳材料，用于场发射电子的提取器和用于加速电子的加速器。此外，还将场致发射电子枪应用于各种电子束施加装置。

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