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1. 发明授权

US12000861B2 System and method for a non-tapping mode scattering-type scanning near-field optical microscopy 有权
公开(公告)号：US12000861B2
公开(公告)日：2024-06-04
申请号：US17887890
申请日：2022-08-15
申请人： Lehigh University
发明人： Haomin Wang , Xiaoji Xu
IPC分类号： G01Q60/06 , G01Q60/18 , G01Q60/22
CPC分类号： G01Q60/06 , G01Q60/22 , G01Q60/18
摘要： Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

2. 发明申请

US20220390485A1 System and Method for a Non-Tapping Mode Scattering-Type Scanning Near-Field Optical Microscopy 有权
公开(公告)号：US20220390485A1
公开(公告)日：2022-12-08
申请号：US17887890
申请日：2022-08-15
申请人： Lehigh University
发明人： Haomin Wang , Xiaoji Xu
IPC分类号： G01Q60/06 , G01Q60/22
摘要： Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

3. 发明申请

US20210080484A1 Methods And Systems For Scanning Probe Sample Property Measurement And Imaging 有权
公开(公告)号：US20210080484A1
公开(公告)日：2021-03-18
申请号：US17105475
申请日：2020-11-25
申请人： The Regents of the University of Colorado, a body corporate
发明人： Rafael Piestun , Simon Labouesse , Markus B. Raschke , Eric Muller , Samuel Johnson
IPC分类号： G01Q60/22 , G01Q60/06 , G01Q10/06 , G01Q30/04 , G01J3/44 , G01J3/45 , G01J3/10 , G01J3/02 , G01J3/28
摘要： Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.

4. 发明申请

US20210041477A1 System and Method for a Non-Tapping Mode Scattering-Type Scanning Near-Field Optical Microscopy 有权
公开(公告)号：US20210041477A1
公开(公告)日：2021-02-11
申请号：US16963917
申请日：2019-01-22
申请人： Lehigh University
发明人： Haomin Wang , Xiaoji Xu
IPC分类号： G01Q60/06 , G01Q60/22
摘要： Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

5. 发明授权

US08832861B2 Near field optical microscope 有权
标题翻译：近场光学显微镜
公开(公告)号：US08832861B2
公开(公告)日：2014-09-09
申请号：US13259484
申请日：2010-03-12
申请人： Nenad Ocelic
发明人： Nenad Ocelic
IPC分类号： G01Q60/06 , G01Q60/22 , B82Y35/00 , B82Y20/00
CPC分类号： G01Q60/22 , B82Y20/00 , B82Y35/00 , Y10S977/826
摘要： The invention relates to a device for conducting near-field optical measurements of a specimen, a method for conducting near-field optical measurements and the use of the device.
摘要翻译：本发明涉及一种用于进行样本的近场光学测量的装置，用于进行近场光学测量的方法以及该装置的使用。

6. 发明授权

US08108943B2 Method and system for near-field spectroscopy using targeted deposition of nanoparticles 有权
标题翻译：使用纳米颗粒靶向沉积的近场光谱法的方法和系统
公开(公告)号：US08108943B2
公开(公告)日：2012-01-31
申请号：US12324693
申请日：2008-11-26
申请人： Mark S. Anderson
发明人： Mark S. Anderson
IPC分类号： G01Q60/06
CPC分类号： G01Q30/02 , G01J3/44 , G01N21/648 , G01N21/658 , G01Q60/06
摘要： There is provided in one embodiment of the invention a method for analyzing a sample material using surface enhanced spectroscopy. The method comprises the steps of imaging the sample material with an atomic force microscope (AFM) to select an area of interest for analysis, depositing nanoparticles onto the area of interest with an AFM tip, illuminating the deposited nanoparticles with a spectrometer excitation beam, and disengaging the AFM tip and acquiring a localized surface enhanced spectrum. The method may further comprise the step of using the AFM tip to modulate the spectrometer excitation beam above the deposited nanoparticles to obtain improved sensitivity data and higher spatial resolution data from the sample material. The invention further comprises in one embodiment a system for analyzing a sample material using surface enhanced spectroscopy.
摘要翻译：在本发明的一个实施例中提供了一种使用表面增强光谱分析样品材料的方法。该方法包括以下步骤：用原子力显微镜（AFM）对样品材料进行成像，以选择用于分析的感兴趣区域，用AFM尖端将纳米颗粒沉积到感兴趣区域上，用光谱仪激发束照射沉积的纳米颗粒，以及脱离AFM尖端并获取局部表面增强光谱。该方法还可以包括使用AFM尖端来调制沉积的纳米粒子上方的光谱仪激发光束以获得改进的灵敏度数据和来自样品材料的较高空间分辨率数据的步骤。本发明还在一个实施方案中包括使用表面增强光谱分析样品材料的系统。

7. 发明授权

US5883387A SPM cantilever and a method for manufacturing the same 失效
标题翻译： SPM悬臂及其制造方法
公开(公告)号：US5883387A
公开(公告)日：1999-03-16
申请号：US878686
申请日：1997-06-19
申请人： Katsuhiro Matsuyama , Michio Takayama
发明人： Katsuhiro Matsuyama , Michio Takayama
IPC分类号： G01B21/30 , G01Q60/04 , G01Q60/06 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q60/40 , G01Q70/14 , G01B5/28
CPC分类号： G01Q60/06 , B82Y20/00 , B82Y35/00 , G01Q60/04 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q60/40 , G01Q70/14 , Y10S977/873
摘要： An SPM cantilever comprises a cantilever portion shaped as a thin plate and extending between a proximal end and a free end, a supporting portion attached to one surface of the cantilever portion on a side of the proximal end, and a probe projecting from the other surface of the cantilever portion on a side of the free end of the cantilever portion the supporting member, and the cantilever portion and the probe are made of different materials.
摘要翻译： SPM悬臂包括形成为薄板并在近端和自由端之间延伸的悬臂部分，附接到近端侧的悬臂部分的一个表面的支撑部分和从另一表面突出的探针的悬臂部分在支撑部件的悬臂部分的自由端的一侧上，并且悬臂部分和探针由不同的材料制成。

8. 发明授权

US5354985A Near field scanning optical and force microscope including cantilever and optical waveguide 失效
标题翻译：近场扫描光学和力显微镜包括悬臂和光波导
公开(公告)号：US5354985A
公开(公告)日：1994-10-11
申请号：US72286
申请日：1993-06-03
申请人： Calvin F. Quate
发明人： Calvin F. Quate
IPC分类号： B81C1/00 , G01Q20/02 , G01Q20/04 , G01Q60/06 , G01Q60/22 , G01Q60/38 , H01J3/14
CPC分类号： G01Q60/06 , B82Y20/00 , B82Y35/00 , G01Q20/04 , G01Q60/22 , G01Q60/38 , Y10S977/862 , Y10S977/863 , Y10S977/868 , Y10S977/873
摘要： A near field scanning optical microscope (NSOM) includes a cantilever which is aligned generally parallel to the surface of a sample. An optical waveguide extends along the cantilever to a tip which protrudes downward from the cantilever. A small aperture at the apex of the tip allows light radiation flowing through the waveguide to be directed toward the sample. The cantilever is vibrated, and variations in its resonant frequency are detected and delivered to a feedback control system to maintain a constant separation between the tip and the sample. The NSOM can also be operated as an atomic force microscope in either a contact or non-contact mode.
摘要翻译：近场扫描光学显微镜（NSOM）包括大体平行于样品表面排列的悬臂。光波导沿着悬臂延伸到从悬臂向下突出的尖端。在尖端的顶点处的小孔允许流过波导的光辐射被引向样品。悬臂振动，并且其谐振频率的变化被检测并传送到反馈控制系统以保持尖端和样品之间的恒定间隔。 NSOM也可以作为原子力显微镜在接触或非接触模式下操作。

9. 发明授权

US11415597B2 System and method for a non-tapping mode scattering-type scanning near-field optical microscopy 有权
公开(公告)号：US11415597B2
公开(公告)日：2022-08-16
申请号：US16963917
申请日：2019-01-22
申请人： Lehigh University
发明人： Haomin Wang , Xiaoji Xu
IPC分类号： G01Q60/06 , G01Q60/22 , G01Q60/18
摘要： Systems, apparatuses, and methods for realizing a peak-force scattering scanning near-field optical microscopy (PF-SNOM). Conventional scattering-type microscopy (s-SNOM) techniques uses tapping mode operation and lock-in detections that do not provide direct tomographic information with explicit tip-sample distance. Using a peak force scattering-type scanning near-field optical microscopy with a combination of peak force tapping mode and time-gated light detection, PF-SNOM enables direct sectioning of vertical near-field signals from a sample surface for both three-dimensional near-field imaging and spectroscopic analysis. PF-SNOM also delivers a spatial resolution of 5 nm and can simultaneously measure mechanical and electrical properties together with optical near-field signals.

10. 发明授权

US10261107B2 Scanning resonator microscopy 有权
公开(公告)号：US10261107B2
公开(公告)日：2019-04-16
申请号：US15562499
申请日：2016-03-30
申请人： University of Kansas
发明人： Robert Conley Dunn
IPC分类号： G01Q60/06 , G01Q60/22 , G01Q60/38
摘要： A method of imaging a sample via scanning resonator microscopy is provided comprising positioning a whispering gallery mode (WGM) optical resonator at a first location over the surface of the sample, the WGM optical resonator characterized by at least one resonance frequency, wherein the WGM optical resonator is mounted to the free end of an atomic force microscopy (AFM) cantilever such that the WGM optical resonator moves with the AFM cantilever, and wherein the AFM cantilever is operably coupled to an AFM system configured to provide a topographical image of the sample; evanescently coupling excitation light into the WGM optical resonator; detecting light derived from the excitation light to monitor for a shift in the at least one resonance frequency induced by the surface of the sample; and repeating steps (a)-(c) at least at a second location over the surface of the sample.

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