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    • 4. 发明申请
    • METHOD AND APPARATUS FOR SETTING AN ILLUMINATION OPTICAL UNIT
    • 用于设置照明光学单元的方法和装置
    • US20120300195A1
    • 2012-11-29
    • US13469240
    • 2012-05-11
    • Joachim HartjesStig BielingArtur Hoegele
    • Joachim HartjesStig BielingArtur Hoegele
    • G01B9/00
    • G03F7/70091G03F7/70133G03F7/70141G03F7/70266
    • A method for setting an illumination optical unit involves determining an actual value of an intensity-weighted illumination parameter of the illumination optical unit for multiple field points and for multiple illumination angles. The influence of a deformation of at least one of the optical surfaces of the illumination optical unit on the at least one illumination parameter is then determined. A desired value of the illumination parameter is then predefined. A desired form of the at least one optical surface is determined so that the actual value of the illumination parameter corresponds to the desired value of the illumination parameter within predefined limits. Finally, the optical surface is deformed with the aid of at least one actuator so that an actual form of the optical surface corresponds to the desired form.
    • 用于设置照明光学单元的方法包括确定用于多个场点和多个照明角度的照明光学单元的强度加权照明参数的实际值。 然后确定照明光学单元的至少一个光学表面的变形对至少一个照明参数的影响。 然后预定义所需的照明参数值。 确定至少一个光学表面的期望形式,使得照明参数的实际值对应于预定义限度内的照明参数的期望值。 最后,光学表面借助于至少一个致动器变形,使得光学表面的实际形式对应于所需的形式。
    • 8. 发明申请
    • ILLUMINATION OPTICS FOR EUV MICROLITHOGRAPHY AND RELATED SYSTEM AND APPARATUS
    • EUV微观照相和相关系统和装置的照明光学
    • US20110063598A1
    • 2011-03-17
    • US12915785
    • 2010-10-29
    • Damian FiolkaBerndt WarmChristian SteigerwaldMartin EndresRalf StuetzleJens OssmannRalf ScharnweberMarkus HaufUdo DingerSeverin WaldisMarc KirchJoachim Hartjes
    • Damian FiolkaBerndt WarmChristian SteigerwaldMartin EndresRalf StuetzleJens OssmannRalf ScharnweberMarkus HaufUdo DingerSeverin WaldisMarc KirchJoachim Hartjes
    • G03B27/72
    • G03F7/70191G03F7/70083
    • An illumination optics for EUV microlithography guides an illumination light bundle from a radiation source to an object field with an extension ratio between a longer field dimension and a shorter field dimension, where the ratio is considerably greater than 1. A field facet mirror has a plurality of field facets that set defined illumination conditions in the object field. A following optics downstream of the field facet mirror transmits the illumination light into the object field. The following optics includes a pupil facet mirror with a plurality of pupil facets. The field facets are in each case individually allocated to the pupil facets so that portions of the illumination light bundle impinging upon in each case one of the field facets are guided on to the object field via the associated pupil facet. The field facet mirror not only includes a plurality of basic illumination field facets which provide a basic illumination of the object field via associated basic illumination pupil facets, but also includes a plurality of correction illumination field facets which provide for a correction of the illumination of the object field via associated correction illumination pupil facets. The result is an illumination optics which allows unwanted variations of illumination parameters, for instance an illumination intensity distribution or an illumination angle distribution, to be corrected across the object field.
    • 用于EUV微光刻的照明光学器件将照射光束从辐射源引导到物场,其具有在较大场尺寸和较短场尺寸之间的延伸比,其中该比率远大于1.场分面镜具有多个 的场面在场景中设置定义的照明条件。 在场面反射镜下游的以下光学器件将照明光透射到物体场中。 以下光学器件包括具有多个光瞳面的光瞳小面镜。 场分面在每种情况下分别被分配给光瞳面,使得在各种情况下照射的照明光束的一部分通过相关联的光瞳小面被引导到物场。 场面镜不仅包括多个基本照明场面,它们通过相关联的基本照明光瞳面提供物场的基本照明,而且还包括多个校正照明场面,其提供对照射的照明的校正 通过相关联的校正照明光瞳面进行物体场。 结果是照明光学元件允许在整个对象场校正照明参数的不期望的变化,例如照明强度分布或照明角度分布。