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    • 3. 发明授权
    • Flash memory device and flash memory system including buffer memory
    • 闪存设备和闪存系统包括缓冲存储器
    • US08301829B2
    • 2012-10-30
    • US13108687
    • 2011-05-16
    • Jin-Yub Lee
    • Jin-Yub Lee
    • G06F12/02
    • G06F12/0246G06F12/0638G06F2212/7203
    • A flash memory device includes a flash memory and a buffer memory. The flash memory is divided into a main region and a spare region. The buffer memory is a random access memory and has the same structure as the flash memory. In addition, the flash memory device further includes control means for mapping an address of the flash memory applied from a host so as to divide a structure of the buffer memory into a main region and a spare region and for controlling the flash memory and the buffer memory to store data of the buffer memory in the flash memory or to store data of the flash memory in the buffer memory.
    • 闪存器件包括闪存和缓冲存储器。 闪存分为主区域和备用区域。 缓冲存储器是随机存取存储器,并且具有与闪存相同的结构。 另外,闪存装置还包括控制装置,用于映射从主机应用的闪速存储器的地址,以将缓冲存储器的结构划分成主区域和备用区域,并用于控制闪速存储器和缓冲器 用于将缓冲存储器的数据存储在闪速存储器中或用于将闪存的数据存储在缓冲存储器中的存储器。
    • 4. 发明授权
    • Method and device for performing cache reading
    • 用于执行高速缓存读取的方法和设备
    • US07908425B2
    • 2011-03-15
    • US12216003
    • 2008-06-27
    • Jin-Yub LeeSang-Won Hwang
    • Jin-Yub LeeSang-Won Hwang
    • G06F12/00G06F12/02
    • G06F12/0893G11C7/1039G11C7/1051G11C7/106G11C16/0483G11C16/26G11C2207/2245
    • In a read method for a memory device, a bit line is set with data in a first memory cell; and the data on the bit line is stored in a register. The data in the register is transferred to a data bus while setting the bit line with data in a second memory cell. In another read method for a memory device, a bit line of a first memory cell is initialized and the bit line is pre-charged with a pre-charge voltage. Data in a memory cell on the bit line is developed, and a register corresponding to the bit line is initialized. The data on the bit line is stored in the register. The data in the register is output externally while performing the initializing, pre-charging, making and initializing to set the bit line with data in a second memory cell.
    • 在存储器件的读取方法中,位线被设置在第一存储器单元中的数据中; 位线上的数据存储在寄存器中。 寄存器中的数据被传送到数据总线,同时在第二个存储单元中将位线设置为数据。 在存储器件的另一读取方法中,初始化第一存储器单元的位线,并且利用预充电电压对位线进行预充电。 开发位线上存储单元中的数据,初始化与位线对应的寄存器。 位线上的数据存储在寄存器中。 寄存器中的数据在执行初始化,预充电,制作和初始化时从外部输出,以将位线设置为第二个存储单元中的数据。
    • 5. 发明授权
    • Method of verifying programming operation of flash memory device
    • 验证闪存设备的编程操作的方法
    • US07907454B2
    • 2011-03-15
    • US12247288
    • 2008-10-08
    • Min-Gun ParkJin-yub Lee
    • Min-Gun ParkJin-yub Lee
    • G11C16/06
    • G11C16/3454G11C16/0483
    • A method is provided for verifying a programming operation of a flash memory device. The flash memory device includes at least one memory string in which a string selection transistor, multiple memory cells and a ground selection transistor are connected in series, and the programming operation is performed with respect to a selected memory cell in the memory string. The method includes applying a voltage, obtained by adding a threshold voltage of the string selection transistor to a power supply voltage, to a string selection line connected to the string selection transistor; applying a ground voltage to wordlines connected to each of the memory cells and a ground selection line connected to the ground selection transistor; precharging a bitline connected to the memory string to the power supply voltage; and determining whether a programming operation of the selected memory cell is complete.
    • 提供了一种用于验证闪存设备的编程操作的方法。 闪速存储器件包括串联选择晶体管,多个存储单元和地选择晶体管串联连接的至少一个存储器串,并且相对于存储器串中的所选存储单元执行编程操作。 该方法包括将串联选择晶体管的阈值电压加到电源电压而获得的电压施加到连接到串选择晶体管的串选择线; 对连接到每个存储单元的字线和连接到地选择晶体管的接地选择线施加接地电压; 将连接到存储器串的位线预充电到电源电压; 以及确定所选存储单元的编程操作是否完成。
    • 6. 发明授权
    • Multi-bit flash memory devices having a single latch structure and related programming methods, systems and memory cards
    • 具有单个锁存结构和相关编程方法,系统和存储卡的多位闪存器件
    • US07876613B2
    • 2011-01-25
    • US12182274
    • 2008-07-30
    • Sang-Chul KangHo-kil LeeJin-Yub Lee
    • Sang-Chul KangHo-kil LeeJin-Yub Lee
    • G11C11/34G11C16/04G11C16/06
    • G11C16/10G11C11/5628G11C16/3454G11C2211/5621G11C2211/5642
    • Multi-bit flash memory devices are provided. The multi-bit flash memory device includes an array of memory cells and a page buffer block including page buffers. Each of the page buffers has a single latch structure and performs a write operation with respect to memory cells according to loaded data. A buffer random access memory (RAM) is configured to store program data provided from an external host device during a multi-bit program operation. Control logic is provided that is configured to control the page buffer block and the buffer RAM so that program data stored in the buffer RAM is reloaded into the page buffer block whenever data programmed before the multi-bit program operation is compared with data to be currently programmed. The control logic is configured to store data to be programmed next in the buffer RAM before the multi-bit program operation is completed.
    • 提供多位闪存设备。 该多位闪存器件包括存储单元阵列和包括页缓冲器的页缓冲块。 每个页面缓冲器具有单个锁存结构,并且根据加载的数据对存储器单元执行写入操作。 缓冲随机存取存储器(RAM)被配置为在多位程序操作期间存储从外部主机设备提供的程序数据。 提供了控制逻辑,其被配置为控制页面缓冲区块和缓冲器RAM,使得存储在缓冲器RAM中的程序数据被重新加载到页面缓冲器块中,每当在多位程序操作之前编程的数据与当前的数据进行比较 程序。 控制逻辑被配置为在多位程序操作完成之前存储要在缓冲RAM中接下来被编程的数据。
    • 7. 发明授权
    • Multi-block memory device erasing methods and related memory devices
    • 多块存储器件擦除方法和相关存储器件
    • US07813184B2
    • 2010-10-12
    • US11614413
    • 2006-12-21
    • Hoo-Sung KimHyung-Seok KangJin-Yub Lee
    • Hoo-Sung KimHyung-Seok KangJin-Yub Lee
    • G11C11/00
    • G11C16/16G11C16/0483G11C16/3445
    • Methods of performing multi-block erasing operations on a memory device that includes a plurality of memory blocks are provided. Pursuant to these methods, the rate at which a first voltage that is applied to the memory blocks that are to be erased during the multi-block erasing operation rises is controlled based on the number of memory blocks that are to be erased. The memory device may be a flash memory device, and the first voltage may be an erasing voltage that is applied to a substrate of the flash memory device. The rate at which the first voltage rises may be set so that the substrate of the flash memory device reaches the erasing voltage level at approximately the same time regardless of the number of memory blocks that are to be erased.
    • 提供了在包括多个存储器块的存储器件上执行多块擦除操作的方法。 根据这些方法,基于要擦除的存储块的数量来控制施加到在多块擦除操作期间被擦除的存储块的第一电压上升的速率。 存储器件可以是闪存器件,并且第一电压可以是施加到闪存器件的衬底的擦除电压。 可以设置第一电压上升的速率,使得闪存器件的衬底在大致相同的时间达到擦除电压电平,而与要擦除的存储器块的数量无关。