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    • 75. 发明授权
    • Magnetic sensor that includes magenetoresistive films and conductors that combine the magnetoresistive films
    • 磁传感器,包括磁阻膜和导体,结合磁阻膜
    • US08427144B2
    • 2013-04-23
    • US12844090
    • 2010-07-27
    • Naoki OhtaMasanori SakaiHiraku Hirabayashi
    • Naoki OhtaMasanori SakaiHiraku Hirabayashi
    • G01R33/09
    • G01R33/091G01R33/098H01L43/08
    • A magnetoresistive element includes magnetoresistive films each having an upper surface and a lower surface, and conductors combining the magnetoresistive films in series and including top electrodes and bottom electrodes. Each one of the top electrodes and corresponding one of the bottom electrodes oppose each other to sandwich corresponding one of the magnetoresistive films. Each electrode of the top electrodes and the bottom electrodes includes a stem section and a branch section, the stem section extending in a direction along a series alignment direction of the magnetoresistive films, and the branch section extending along the lamination plane in a direction intersecting a direction in which the stem section extends. The branch section in the top electrode is in contact with an upper surface of the corresponding magnetoresistive film, and the branch section in the bottom electrode is in contact with a lower surface of the corresponding magnetoresistive film.
    • 磁阻元件包括各自具有上表面和下表面的磁阻膜,以及将磁阻膜串联并包括顶电极和底电极的导体。 顶部电极和对应的一个底部电极中的每一个彼此相对以夹持相应的一个磁阻膜。 顶部电极和底部电极的每个电极包括杆部分和分支部分,杆部分在沿着磁阻膜的串联取向方向的方向上延伸,并且分支部分沿着层叠平面沿与 杆段延伸的方向。 顶部电极中的分支部分与相应的磁阻膜的上表面接触,并且底部电极中的分支部分与相应的磁阻膜的下表面接触。
    • 79. 发明申请
    • Method of manufacturing a semiconductor device and substrate processing apparatus
    • 半导体器件和衬底处理设备的制造方法
    • US20100297846A1
    • 2010-11-25
    • US12801082
    • 2010-05-20
    • Yukinao KagaTatsuyuki SaitoMasanori Sakai
    • Yukinao KagaTatsuyuki SaitoMasanori Sakai
    • H01L21/285C23C16/06C23C16/34
    • H01L21/28562C23C16/34C23C16/45527C23C16/45544H01L21/76841
    • A method of manufacturing a semiconductor device includes the steps of: forming a first metal film on the substrate placed in a processing chamber by alternately supplying at least one type of a metal compound that is an inorganic raw material and a reactant gas that has reactivity to the metal compound to the processing chamber more than once; forming a second metal film on the substrate by simultaneously supplying at least one type of a metal compound that is an inorganic raw material and a reactant gas that has reactivity to the metal compound to the processing chamber once so that the metal compound and the reactant gas are mixed with each other; and modifying at least one of the first metal film and the second metal film is modified using at least one of the reactant gas and an inert gas after at least one of the alternate supply process and the simultaneous supply process. It thus becomes possible to provide a dense, low-resistive metal film having a smooth film surface with a better quality in comparison with a titanium nitride film formed by the CVD method at a higher deposition rate, that is, at a higher productivity, in comparison with a titanium nitride film formed by the ALD method at a low temperature.
    • 一种制造半导体器件的方法包括以下步骤:通过交替地供给至少一种作为无机原料的金属化合物和具有反应性的反应物气体,在放置在处理室中的基板上形成第一金属膜 金属化合物对处理室不止一次; 通过同时将至少一种作为无机原料的金属化合物和与金属化合物具有反应性的反应物气体同时供给到处理室,从而在基板上形成第二金属膜,使得金属化合物和反应气体 相互混合; 并且在交替供给处理和同时供给处理中的至少一个之后,使用至少一种反应气体和惰性气体来修饰第一金属膜和第二金属膜中的至少一个。 因此,与通过CVD法形成的氮化钛膜以更高的生产率,即更高的生产率相比,可以提供具有光滑膜表面的致密的低电阻金属膜,具有更好的质量 与在低温下通过ALD法形成的氮化钛膜进行比较。