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    • 76. 发明授权
    • Multi-spot illumination for improved detection sensitivity
    • 多点照明提高检测灵敏度
    • US09494531B2
    • 2016-11-15
    • US14455161
    • 2014-08-08
    • KLA-Tencor Corporation
    • Yung-Ho Alex ChuangXiaoxu LuJohn FieldenIvan Maleev
    • G01N21/88G01J1/04G01N21/95
    • G01N21/9501G01J1/04G01N21/8806
    • Methods and systems for minimizing interference among multiple illumination beams generated from a non-uniform illumination source to provide an effectively uniform illumination profile over the field of view of an inspection system are presented. In some examples, a pulsed beam of light is split into multiple illumination beams such that each of the beams are temporally separated at the surface of the specimen under inspection. In some examples, multiple illumination beams generated from a non-uniform illumination source are projected onto spatially separated areas on the surface of the specimen. A point object of interest illuminated by each area is imaged onto the surface of a time-delay integration (TDI) detector. The images are integrated such that the relative position of the illumination areas along the direction of motion of the point object of interest has no impact on the illumination efficiency distribution over the field of view.
    • 提出了用于最小化从不均匀照明源产生的多个照明光束之间的干扰的方法和系统,以在检查系统的视场上提供有效均匀的照明轮廓。 在一些示例中,脉冲光束被分成多个照明光束,使得每个光束在被检查的样品的表面处在时间上分离。 在一些示例中,从不均匀照明源产生的多个照明光束投影到样本表面上的空间分离的区域上。 由每个区域照明的感兴趣的点对象被成像到时间延迟积分(TDI)检测器的表面上。 图像被集成为使得照明区域沿着感兴趣点对象的运动方向的相对位置对视场的照明效率分布没有影响。