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    • 53. 发明授权
    • Variable capacity compressor
    • 可变容量压缩机
    • US08152483B2
    • 2012-04-10
    • US12296206
    • 2007-04-05
    • Makoto KawamuraMasakazu Aoki
    • Makoto KawamuraMasakazu Aoki
    • F04B1/12F04B27/08
    • F04B27/1072
    • The variable capacity compressor has a rotor 21, as a rotating member, fixed to a drive shaft 10 and rotating integrally with the drive shaft 10, a swash plate 24, as a tilting member, tiltably and slidably attached to the drive shaft 10, a linkage mechanism 40 linking the rotor 21 and the swash plate 24 at a position corresponding to an upper dead center of the swash plate 24, transferring rotation of the rotor 21 to the swash plate 24, and guiding the tilting movement of the swash plate 24, and a tilting movement guide 60 provided between the rotor 21 and the swash plate 24 and anterior to the linkage mechanism 40 in the rotating direction and guiding changes of the inclination angle of the swash plate 24 with respect to the drive shaft 10.
    • 可变容量压缩机具有作为旋转构件的转子21,其固定到驱动轴10并与驱动轴10一体旋转;作为倾斜构件的斜盘24可倾斜并可滑动地附接到驱动轴10, 连接机构40将转子21和旋转斜盘24连接在与斜盘24的上止点对应的位置,将转子21的旋转传递到旋转斜盘24,以及引导斜盘24的倾斜运动, 以及倾斜运动引导件60,其设置在转子21和旋转斜盘24之间并且在连动机构40的旋转方向前方,并且引导斜盘24相对于驱动轴10的倾斜角度的变化。
    • 56. 发明授权
    • Semiconductor characteristic evaluation apparatus
    • 半导体特性评估装置
    • US06833725B2
    • 2004-12-21
    • US10600800
    • 2003-06-19
    • Shin-ichi OhkawaMasakazu Aoki
    • Shin-ichi OhkawaMasakazu Aoki
    • G01R3102
    • G11C29/50008G01R31/2884G01R31/30G11C2029/5002
    • On a basic measurement unit arranged in a lattice shape on a chip, a resistance measurement circuit, a capacity measurement circuit, an n-type MOS transistor measurement circuit, a p-type MOS transistor measurement circuit, and a ring oscillator measurement circuit are mounted by several tens of patterns. Each measurement circuit mounted by several tens of patterns is connected to a measurement bus to constitute a measurement bus net in accordance with measured items. Switching of connection of the measurement bus net with a measurement terminal pad is electrically controlled properly by X, Y address selection signals outputted from X, Y address decoders to X, Y address selection signal lines.
    • 在芯片上布置成格子状的基本测量单元上安装有电阻测量电路,电容测量电路,n型MOS晶体管测量电路,p型MOS晶体管测量电路和环形振荡器测量电路 几十种图案。 安装了数十种图案的每个测量电路都连接到测量总线,以根据测量项目构成测量总线网。 通过从X,Y地址解码器输出到X,Y地址选择信号线的X,Y地址选择信号,对测量总线网络与测量端子焊盘的连接进行切换。
    • 58. 发明授权
    • Semiconductor device having redundancy circuit
    • 具有冗余电路的半导体器件
    • US06754114B2
    • 2004-06-22
    • US10401975
    • 2003-03-31
    • Masashi HoriguchiJun EtohMasakazu AokiKiyoo Itoh
    • Masashi HoriguchiJun EtohMasakazu AokiKiyoo Itoh
    • G11C700
    • G11C29/80G11C29/785G11C29/808
    • A semiconductor memory is provided with a defect recovery scheme featuring a redundancy circuit. The memory array in the memory has a plurality of word lines, a plurality of bit lines, a spare bit line, and a plurality of memory cells. The redundancy circuit includes one or more comparing circuits having programmable elements which function as a memory for storing therein a defective address existing in the memory array. The programmable elements of the redundancy circuit can be programmed in accordance with any of a number of different types of defect modes. Each comparing circuit of the redundancy circuit compares information (data) inputted therein, for example, the column and row addresses which may be under the control of an address multiplex system, with that programmed in the programmable elements of the comparing circuit. On the basis of this comparison, an appropriate defect recovery is effected.
    • 半导体存储器具有冗余电路的缺陷恢复方案。 存储器中的存储器阵列具有多个字线,多个位线,备用位线和多个存储器单元。 冗余电路包括具有可编程元件的一个或多个比较电路,其作为用于在其中存储存在于存储器阵列中的缺陷地址的存储器。 冗余电路的可编程元件可以根据多种不同类型的缺陷模式中的任何一种进行编程。 冗余电路的每个比较电路将在其中输入的信息(数据),例如可能在地址多路复用系统的控制下的列和行地址与在比较电路的可编程元件中编程的信息(数据)进行比较。 在此比较的基础上,进行适当的缺陷恢复。