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    • 53. 发明授权
    • Apparatus for inspecting deformation of pipe
    • 用于检查管道变形的装置
    • US5745232A
    • 1998-04-28
    • US682765
    • 1996-07-30
    • Kiyoshi Hasegawa
    • Kiyoshi Hasegawa
    • G01B11/16F16L55/00F17D5/02G01B11/24G01B11/245G01C7/06G01B11/26
    • G01C7/06G01B11/24
    • An inspection apparatus is disclosed which is adapted to accurately detect an irradiated position on a target board which is irradiated with a beam, to thereby inspect deformation of a pipe such as a sewer or the like. A laser beam emitting unit (3) is arranged on one end side of a sewer (1). The laser beam emitting unit (3) is so adjusted that a laser beam (15) is impinged on a target board (11) of a target vehicle (9) traveling from the other end side of the pipe toward the laser beam emitting unit (3). The target board (11) is provided thereon with a plurality of phototransistors (13), whereby the irradiated position is detected depending on electric signals generated by the phototransistors.
    • PCT No.PCT / JP94 / 00429 Sec。 371日期:1996年7月3日 102(e)日期1996年7月30日PCT 1994年3月17日PCT公布。 WO95 / 21367 PCT出版物 日期:1995年8月10日公开了一种适于精确地检测被照射的梁的目标板上的照射位置的检查装置,从而检测诸如下水道等的管道的变形。 激光束发射单元(3)布置在下水道(1)的一端侧。 激光束发射单元(3)被调节为使得激光束(15)撞击在从管道的另一端侧朝向激光束发射单元行进的目标车辆(9)的目标板(11)上 3)。 目标板(11)上设置有多个光电晶体管(13),由此根据由光电晶体管产生的电信号来检测照射位置。
    • 54. 发明授权
    • Method of X-ray mapping analysis
    • X射线成像分析方法
    • US5511103A
    • 1996-04-23
    • US325805
    • 1994-10-19
    • Kiyoshi Hasegawa
    • Kiyoshi Hasegawa
    • G01N23/22G01N23/223
    • G01N23/22
    • The sample stage is scanned in a grid pattern with a feed pitch finer than the width of the primary beams, and with X-ray intensities at each point as values, primary and secondary mapping data are prepared. In order to convert the shape and size of the primary beam into a size of each of the mapping data, a beam template is prepared in which portions irradiated with primary beam being"1" and portions not irradiated being "0". The background intensity is determined as a threshold value, and at the positions where the value of the primary mapping data is below the threshold value, beam template is overlaid on the secondary mapping data. Those values in the secondary mapping data corresponding to "1" portions of the beam template are replaced with "0", and this is performed over all the measured points, thereby data closely approximating the actual boundary of the element concerned is obtained on the secondary mapping data.
    • 样品台以网格图案扫描,馈送距离比主光束的宽度更窄,并且在每个点处的X射线强度作为值,准备主和次映射数据。 为了将主光束的形状和大小转换为每个映射数据的大小,准备一束光束模板,其中以一次光束照射的部分为“1”,未照射的部分为“0”。 将背景强度确定为阈值,并且在主映射数据的值低于阈值的位置处,将束模板覆盖在次映射数据上。 对应于波束模板的“1”部分的二次映射数据中的这些值被替换为“0”,并且这在所有测量点上执行,从而在二次方获得与该元件的实际边界近似的数据 映射数据。
    • 55. 发明授权
    • Sheet film feeder
    • 片材送料机
    • US4767113A
    • 1988-08-30
    • US936743
    • 1986-12-02
    • Kiyoshi HasegawaYutaka Seko
    • Kiyoshi HasegawaYutaka Seko
    • B65H3/08B65H5/14G03B42/02G03B42/04B65H5/22
    • B65H5/14B65H3/08G03B42/025G03B42/045
    • A sheet film feeder according to the present invention is incorporated in an X-ray photographing apparatus and feeds a sheet film from an unphotographed film housing magazine to a sheet film holder at a waiting position. A suction mechanism for sucking an unphotographed film is provided to the sheet film feeder. In addition, the feeder has a transportation apparatus for transporting the suction mechanism from the unphotographed film housing magazine to the sheet film holder, and a rotation apparatus for rotating the suction mechanism through approximately 90.degree. when the suction mechanism is transported from the unphotographed film housing magazine to the sheet film holder. Therefore, the suction mechanism is rotated approximately 90.degree. and transported from the magazine to the holder. For this reason, the unphotographed film is rotated from the vertical to horizontal state and fed to the holder without damage.
    • 根据本发明的薄片供料器被结合在X射线摄影设备中,并且将来自未照相胶片容纳盒的片状胶片供给到等待位置处的片状胶片保持器。 用于吸引未照相胶片的吸引机构设置在片材进给器上。 此外,进料器具有用于将吸引机构从未照相胶片收纳盒移送到片状胶片保持器的输送装置,以及用于当吸引机构从未照相胶片壳体输送时将抽吸机构旋转大约90°的旋转装置 杂志到薄膜夹持器。 因此,抽吸机构旋转大约90°,并从盒子传送到保持器。 因此,未照相胶片从垂直方向旋转到水平状态,并且不损坏地馈送到保持器。
    • 56. 发明授权
    • Servo control device
    • 伺服控制装置
    • US08890460B2
    • 2014-11-18
    • US13980984
    • 2012-10-25
    • Hidetoshi IkedaYoshihiro MarushitaKoji MaharaKiyoshi HasegawaHidemasa Ogi
    • Hidetoshi IkedaYoshihiro MarushitaKoji MaharaKiyoshi HasegawaHidemasa Ogi
    • G05B5/01G05B6/02
    • G05B6/02G05B5/01
    • A servo control device includes a follow-up control unit that controls a control target that drives a mechanical system by a motor, a command function unit that has input therein a phase signal θ indicating a phase of a cyclic operation performed by the control target, and that calculates a machine motion command according to the phase signal θ by a preset first function, a second derivative unit that uses a second function obtained by second-order differentiating the first function with respect to the phase signal to calculate a value of the second function according to the phase signal as a second-order differential base signal, a correction-value computation unit that computes a first command correction value for correcting the motor motion command by using a product of a square value of the phase velocity, the second-order differential base signal, and a first constant, and a correction-value addition unit that calculates the motor motion command based on an added value of the first command correction value and the machine motion command.
    • 一种伺服控制装置,包括:跟随控制单元,其控制由马达驱动机械系统的控制对象;命令功能单元,其中输入有相位信号; 指示由控制对象执行的循环操作的相位,并且根据相位信号计算机器运动命令; 通过预设的第一功能,二阶导数单元使用通过相对于相位信号对第一函数进行二阶微分而获得的第二函数,以根据相位信号计算第二函数的值作为二阶差分基极 信号,校正值计算单元,其通过使用相速度,二阶差分基准信号和第一常数的平方值的乘积来计算用于校正马达运动命令的第一命令校正值,以及校正 - 值附加单元,其基于第一命令校正值和机器运动命令的相加值来计算马达运动命令。
    • 58. 发明申请
    • X-RAY ANALYZER AND MAPPING METHOD FOR AN X-RAY ANALYSIS
    • X射线分析仪和X射线分析的映射方法
    • US20110206186A1
    • 2011-08-25
    • US13027881
    • 2011-02-15
    • Hiroshi MatsumuraKiyoshi Hasegawa
    • Hiroshi MatsumuraKiyoshi Hasegawa
    • G01N23/201G06K9/00
    • G01N23/223G01N2223/076G06T7/001G06T2207/10061G06T2207/10121G06T2207/30148
    • Provided are an X-ray analyzer and a mapping method for an X-ray analysis which, in a inspection for a harmful substance contained in, for example, a material or a composite electronic component, enable determination as to whether a sample is normal or abnormal to be performed visually based on an image obtained by the X-ray mapping analysis. In the X-ray analyzer, an X-ray mapping image of a sample which is confirmed to be normal in advance is obtained as a reference mapping image. A mapping analysis is performed on a inspection sample. A difference from the reference mapping image is obtained for each pixel, to thereby display a difference mapping image. A region in which the amount of specific element is larger than a reference amount is displayed with high brightness, and hence an abnormal portion may be easily found.
    • 提供了一种X射线分析仪和用于X射线分析的映射方法,其在包含在例如材料或复合电子部件中的有害物质的检查中能够确定样品是正常还是 基于通过X射线映射分析获得的图像,可视化地进行异常。 在X射线分析装置中,作为基准对照图像,获得确认为正常的样本的X射线映射图像。 对检查样品进行映射分析。 对于每个像素获得与参考映射图像的差异,从而显示差异映射图像。 特定元素的量大于基准量的区域以高亮度显示,因此可能容易发现异常部分。
    • 60. 发明授权
    • X-ray analysis apparatus and X-ray analysis method
    • X射线分析仪和X射线分析法
    • US07587025B2
    • 2009-09-08
    • US11972337
    • 2008-01-10
    • Takayuki FukaiYoshiki MatobaKiyoshi Hasegawa
    • Takayuki FukaiYoshiki MatobaKiyoshi Hasegawa
    • G01N23/201
    • G01N23/223G01N2223/076
    • In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.
    • 在X射线分析装置和X射线分析方法中,通过稳定地进行X射线源的稳定地进行定量分析。 具有照射原始X射线的X射线管状灯管,能够调整主X射线强度的主X射线调整机构,检测特征X射线的X射线检测器 从样品输出包括特征X射线和散射X射线的能量信息的信号,分析上述信号的分析仪和设置在样品和X射线检测器之间的入射X射线调节机构, 并且能够调整输入到X射线检测器的特征X射线和散射X射线的总强度。