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41. 发明申请

US20090324450A1 Nanometer Scale Instrument for Biochemically, Chemically, or Catalytically Interacting with a Sample Material 失效
标题翻译：用于与样品材料进行生物化学，化学或催化相互作用的纳米级仪器
公开(公告)号：US20090324450A1
公开(公告)日：2009-12-31
申请号：US12423747
申请日：2009-04-14
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： B01J19/00
CPC分类号： G03F1/84 , G01B7/31 , G01Q80/00 , G03F7/70375 , G03F7/70483 , G11B5/232 , G11B5/3116 , G11B9/06 , G11B9/08 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/007 , G11B11/05 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/851 , Y10S977/86 , Y10S977/875 , Y10S977/877
摘要： An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample material with respect to each other, and a controller. The controller controls the probe positioning apparatus in positioning the probe over the sample and controls the tip positioning apparatus in lowering the tip into the sample material to produce an interaction between the porous tip and the sample material.
摘要翻译：一种仪器包括具有多孔尖端的探针，用于相对于样品材料定位尖端的末端定位装置，将探针和样品材料相对于彼此定位的探针定位装置，以及控制器。控制器控制探头定位装置将探针定位在样品上，并控制尖端定位装置将尖端降低到样品材料中，以产生多孔尖端和样品材料之间的相互作用。

42. 发明授权

US07542402B2 Contact probe storage FET sensor and write heater arrangements 有权
标题翻译：接触探头存储FET传感器和写加热器布置
公开(公告)号：US07542402B2
公开(公告)日：2009-06-02
申请号：US10827370
申请日：2004-04-20
申请人： Robert Guido Mejia , Richard Lee Hilton
发明人： Robert Guido Mejia , Richard Lee Hilton
IPC分类号： G11B7/00
CPC分类号： G11B9/14 , B82Y10/00 , G11B9/1409 , G11B11/08 , G11B11/16
摘要： A read/write arrangement for a contact probe storage arrangement or the like, has a cantilever disposed with a medium which is movable relative to the cantilever. A device which is associated with one of the cantilever and the medium is configured to be responsive to changes in electrical field between the medium and the cantilever caused by a change in distance between the medium and the cantilever. A heater is disposed on the cantilever for heating the medium and for inducing localized topographical changes which represent bits of data. A circuit electrically interconnects both of the device and the heater.
摘要翻译：用于接触探针存储装置等的读/写布置具有悬臂，其布置有可相对于悬臂运动的介质。与悬臂和介质中的一个相关联的装置被配置为响应介质和悬臂之间的距离变化引起的介质和悬臂之间的电场变化。加热器设置在悬臂上用于加热介质并且用于引起表示数据位的局部地形变化。电路将两个器件和加热器互连。

43. 发明授权

US07535817B2 Nanometer scale data storage device and associated positioning system 失效
标题翻译：纳米级数据存储设备及相关定位系统
公开(公告)号：US07535817B2
公开(公告)日：2009-05-19
申请号：US11325248
申请日：2006-01-03
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G11B7/00
CPC分类号： G03F1/84 , G01B7/31 , G01Q80/00 , G03F7/70375 , G03F7/70483 , G11B5/232 , G11B5/3116 , G11B9/06 , G11B9/08 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/007 , G11B11/05 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/851 , Y10S977/86 , Y10S977/875 , Y10S977/877
摘要： A data storage system that includes a positioning system for positioning the write/read mechanism and the storage medium of the data storage device with respect to each other in first and second predefined directions. The positioning system comprises a positioning apparatus comprising microfabricated first and second positioning assemblies. The positioning system further comprises a controller to position a positionable support structure of the first positioning assembly in a first predefined direction within a range of positioning that is larger than the range of movement of a moveable support structure of the first positioning assembly by controlling (A) a stationary support structure clamp in clamping and unclamping the positionable structure to and from the support structure, (B) a moveable structure clamp in clamping and unclamping the positionable support structure to and from the moveable support structure, and (C) the movement of the moveable support structure.
摘要翻译：一种数据存储系统，包括用于在第一和第二预定方向上相对于彼此定位数据存储装置的写/读机制和存储介质的定位系统。定位系统包括定位装置，其包括微加工的第一和第二定位组件。定位系统还包括控制器，用于通过控制（A（A））将第一定位组件的可定位的支撑结构定位在比第一定位组件的可移动支撑结构的移动范围大的定位范围内的第一预定方向）固定的支撑结构夹紧器夹紧和释放位于支撑结构上的可定位结构，（B）可移动的结构夹具夹紧并将可定位的支撑结构松开并移动到可移动的支撑结构上，以及（C）可移动的支撑结构。

44. 发明授权

US07212487B2 Data readout arrangement 失效
标题翻译：数据读出布置
公开(公告)号：US07212487B2
公开(公告)日：2007-05-01
申请号：US10751880
申请日：2004-01-07
申请人： Gary A. Gibson
发明人： Gary A. Gibson
IPC分类号： G11B7/00
CPC分类号： G11B9/04 , B82Y10/00 , G11B9/14 , G11B9/1418 , G11B9/1445 , G11B11/08 , G11B11/16 , G11B2005/0021
摘要： A readout arrangement has a base which has a flexible member supporting a probe on a free end thereof so that the probe is movable with respect to the base; a medium in which a superficial data indicative topographical feature can be formed, the superficial data indicative topographical feature being configured to be contacted by the probe, the medium and the base being arranged to be movable relative to one another; and a semiconductor element disposed with one of the base and medium, the semiconductor element being configured to be responsive to an electric field generated in response to interaction between the probe and the superficial data indicative topographical feature.
摘要翻译：读出装置具有底座，该基座具有在其自由端上支撑探针的柔性构件，使得探针可相对于底座移动; 其中可以形成表面数据指示性外形特征的介质，所述表面数据指示性外形特征被配置为被所述探针接触，所述介质和所述基底被布置成可相对于彼此移动; 以及设置有所述基底和介质中的一个的半导体元件，所述半导体元件被配置为响应于响应于所述探针和所述表面数据指示性拓扑特征之间的相互作用而产生的电场。

45. 发明授权

US07130141B2 Assembly for thermal and/or thermally-assisted information processing 有权
标题翻译：用于热和/或热辅助信息处理的组件
公开(公告)号：US07130141B2
公开(公告)日：2006-10-31
申请号：US10401565
申请日：2003-03-31
申请人： S. Jay Chey , Hendrik F. Hamann , Martin Patrick O'Boyle , H. Kumar Wickramasinghe
发明人： S. Jay Chey , Hendrik F. Hamann , Martin Patrick O'Boyle , H. Kumar Wickramasinghe
IPC分类号： H05B1/02 , G11B5/02
CPC分类号： G11B5/3136 , G11B5/10 , G11B5/1871 , G11B5/58 , G11B5/60 , G11B5/6011 , G11B5/6064 , G11B9/00 , G11B11/00 , G11B11/16 , G11B2005/001 , G11B2005/0013 , G11B2005/0021
摘要： An information processing assembly includes at least one heater suitable for information processing, and a controller for controlling the at least one heater by at least one of adjusting a power to the at least one heater to match a target power level, and changing a polarity of an electrical current supplied to the heater.
摘要翻译：信息处理组件包括至少一个适于信息处理的加热器，以及控制器，用于通过至少一个调节至少一个加热器的功率以匹配目标功率电平来控制至少一个加热器，以及改变至少一个加热器的极性提供给加热器的电流。

46. 发明授权

US07045780B2 Scanning probe microscopy inspection and modification system 失效
公开(公告)号：US07045780B2
公开(公告)日：2006-05-16
申请号：US10616453
申请日：2003-07-08
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G01N23/00 , G21K7/00
CPC分类号： G01Q60/58 , G01B7/31 , G01N23/225 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q20/00 , G01Q20/02 , G01Q30/04 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q70/02 , G01Q70/06 , G01Q80/00 , G02B21/002 , G03F1/72 , G03F1/84 , G03F7/2049 , G03F7/704 , G03F7/70616 , G11B5/232 , G11B5/3116 , G11B5/3163 , G11B5/3166 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/855 , Y10S977/871
摘要： A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.

47. 发明申请

US20050038950A1 Storage device having a probe and a storage cell with moveable parts 失效
标题翻译：具有探针的存储装置和具有可移动部件的存储单元
公开(公告)号：US20050038950A1
公开(公告)日：2005-02-17
申请号：US10640063
申请日：2003-08-13
申请人： Todd Adelmann
发明人： Todd Adelmann
IPC分类号： G01R31/26 , G06F12/00 , G11B9/00 , G11B9/06 , G11B11/00 , G11B11/16 , G11C5/00 , G11C5/06 , G11C11/56 , H01L21/66
CPC分类号： G11C11/56 , B82Y10/00 , G11B9/062 , G11B9/14 , G11B9/1445 , G11B9/1472 , G11B11/007 , G11B11/16 , G11B2005/0021 , G11C5/06 , H01H2001/0047
摘要： A storage device comprises a probe and storage cell having moveable parts that are actuatable to plural positions to represent respective different data states. The probe interacts with the moveable parts to selectively actuate the moveable parts to the plural positions.
摘要翻译：存储装置包括探针和存储单元，其具有可致动到多个位置的可移动部分，以表示各自的不同数据状态。探针与可移动部件相互作用以选择性地将可移动部件致动到多个位置。

48. 发明申请

US20050025034A1 Data storage device and a method of reading data in a data storage device 失效
标题翻译：数据存储装置以及在数据存储装置中读取数据的方法
公开(公告)号：US20050025034A1
公开(公告)日：2005-02-03
申请号：US10632251
申请日：2003-08-01
申请人： Gary Gibson
发明人： Gary Gibson
IPC分类号： G11B9/14 , G11B9/00 , G11B11/08 , G11B11/16 , G11B11/26
CPC分类号： G11B9/14 , B82Y10/00 , C08L2201/12 , G11B9/1409 , G11B9/1445 , G11B9/1472 , G11B9/149 , G11B11/08 , G11B11/16 , G11B2005/0021
摘要： The present invention includes a method and apparatus for storing data. Accordingly, a first aspect of the present invention is a data storage device. The data storage device includes a conduction barrier, a probe tip mounted on a suspension mechanism, a voltage source coupled to the suspension mechanism for emitting a current of electrons through the conduction barrier, a sensing mechanism for sensing a magnitude of the emitted current wherein the magnitude of the current of electrons emitted through the conduction barrier is based on a distance between the probe tip and the sensing mechanism.
摘要翻译：本发明包括一种用于存储数据的方法和装置。因此，本发明的第一方面是数据存储装置。数据存储装置包括导电屏障，安装在悬挂机构上的探针尖端，耦合到悬挂机构的电压源，用于通过导电屏障发射电子流;感测机构，用于感测发射电流的大小，其中，通过导电屏障发射的电子的电流的大小基于探针尖端和感测机构之间的距离。

49. 发明申请

US20040105323A1 Reading data in probe-based storage devices 失效
标题翻译：在基于探针的存储设备中读取数据
公开(公告)号：US20040105323A1
公开(公告)日：2004-06-03
申请号：US10657545
申请日：2003-09-08
发明人： Cherubini Giovanni
IPC分类号： G11C029/00
CPC分类号： B82Y10/00 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B11/16 , G11B2005/0021
摘要： A probe-based storage device comprises a storage surface for storing data represented by deformations in the surface. A probe faces the surface and includes a resonant circuit having a reactance dependent on deflection of the probe relative to the surface. A scanner is provided for scanning the probe across the surface such that the probe follows said deformations. A detector reads data stored on the surface by detecting variation of the resonant frequency of said circuit.
摘要翻译：基于探针的存储装置包括用于存储由表面中的变形表示的数据的存储表面。探针面向表面并且包括具有取决于探针相对于表面的偏转的电抗的谐振电路。提供扫描器用于跨越表面扫描探针，使得探针遵循所述变形。检测器通过检测所述电路的谐振频率的变化来读取存储在表面上的数据。

50. 发明申请

US20020117611A1 Object inspection and/or modification system and method 失效
标题翻译：对象检查和/或修改系统和方法
公开(公告)号：US20020117611A1
公开(公告)日：2002-08-29
申请号：US09919780
申请日：2001-07-31
发明人： Victor B. Kley
IPC分类号： H01J003/14 , H01J005/16
CPC分类号： G01Q60/58 , G01B7/31 , G01N23/225 , G01Q10/02 , G01Q10/04 , G01Q10/06 , G01Q20/00 , G01Q20/02 , G01Q30/04 , G01Q40/00 , G01Q60/04 , G01Q60/16 , G01Q60/22 , G01Q60/38 , G01Q70/02 , G01Q70/06 , G01Q80/00 , G02B21/002 , G03F1/72 , G03F1/84 , G03F7/2049 , G03F7/704 , G03F7/70616 , G11B5/232 , G11B5/3116 , G11B5/3163 , G11B5/3166 , G11B9/14 , G11B9/1409 , G11B9/1418 , G11B9/1427 , G11B9/1436 , G11B9/1445 , G11B9/1454 , G11B9/149 , G11B11/12 , G11B11/16 , G11B2005/0002 , G11B2005/0021 , H02N1/006 , Y10S977/855 , Y10S977/871
摘要： A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection and/or modification of the object. The components of the SPM system include microstructured calibration structures. A probe may be defective because of wear or because of fabrication errors. Various types of reference measurements of the calibration structure are made with the probe or vice versa to calibrate it. The components of the SPM system further include one or more tip machining structures. At these structures, material of the tips of the SPM probes may be machined by abrasively lapping and chemically lapping the material of the tip with the tip machining structures.
摘要翻译：使用SPM技术和技术的扫描探针显微镜（SPM）检查和/或修改系统。该系统包括用于检查和/或修改物体的各种类型的微结构化SPM探针。 SPM系统的组件包括微结构校准结构。由于磨损或由于制造错误，探头可能有缺陷。校准结构的各种参考测量用探针进行，反之亦然，以校准它。 SPM系统的部件还包括一个或多个尖端加工结构。在这些结构中，SPM探针的尖端的材料可以通过用尖端加工结构进行研磨研磨和化学研磨尖端的材料来加工。

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