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    • 41. 发明申请
    • Mobile Communication System
    • 移动通信系统
    • US20090239561A1
    • 2009-09-24
    • US12260174
    • 2008-10-29
    • Daisuke NittaTetsuo TomitaTomonori KumagaiSatoshi WatanabeKazunari Kobayashi
    • Daisuke NittaTetsuo TomitaTomonori KumagaiSatoshi WatanabeKazunari Kobayashi
    • H04B7/00
    • H04W88/12H04W8/06H04W88/08
    • A base station accommodation method and mobile communication system which allows the installation of many micro-miniature BTS devices are provided. The mobile communication system includes a plurality of base stations which accommodate a plurality of mobile terminals respectively; a plurality of first base station control devices, each of which accommodates a predetermined number of base stations out of the plurality of base stations; and a second base station control device which accommodates the plurality of first base station control devices, wherein each of the plurality of first base station control devices comprises, for supporting information identifying a mobile terminal, a mobile terminal data base to store identification information which identifies a base station to which the mobile terminal is subordinate, and a station data base to store an address of the base station.
    • 提供了允许安装许多微型BTS设备的基站调制方法和移动通信系统。 移动通信系统包括分别容纳多个移动终端的多个基站; 多个第一基站控制装置,其各自容纳多个基站中的预定数量的基站; 以及第二基站控制装置,其容纳所述多个第一基站控制装置,其中,所述多个第一基站控制装置中的每一个包括用于支持识别移动终端的信息,移动终端数据库,以存储标识的标识信息 移动终端所属的基站,以及用于存储基站的地址的站数据库。
    • 50. 发明授权
    • Photo acid generator, chemical amplification resist material
    • 照片酸发生器,化学放大抗蚀材料
    • US07211367B2
    • 2007-05-01
    • US11373925
    • 2006-03-13
    • Tomohiro KobayashiSatoshi WatanabeTsunehiro NishiYouichi OhsawaKatsuhiro Kobayashi
    • Tomohiro KobayashiSatoshi WatanabeTsunehiro NishiYouichi OhsawaKatsuhiro Kobayashi
    • G03F7/031
    • G03F7/0045C07D327/06G03F7/0395G03F7/0397G03F7/0758
    • A high resolution resist material comprising an acid generator is provided so that high sensitivity and high resolution for high energy rays of 300 nm or less, small line-edge roughness, and excellence in heat stability and storage stability are obtained. Moreover, a pattern formation method using this resist material are provided. Specifically, a novel compound of the following general formula (1); and a positive resist material comprising this compound preferably as a photo acid generator, and a base resin; are provided. This positive resist material may contain a basic compound or a dissolution inhibitor. Further, the present invention provides a pattern formation method comprising the steps of applying this positive resist material on a substrate, then heat-treating the material, exposing the treated material to a high energy ray having a wavelength of 300 nm or less via a photo mask, optionally heat-treating the exposed material, and developing the material using a developer
    • 提供了包含酸产生器的高分辨率抗蚀剂材料,从而获得了300nm以下的高能量射线的高灵敏度和高分辨率,小的线边缘粗糙度,以及热稳定性和储存稳定性方面的优异性。 此外,提供了使用该抗蚀剂材料的图案形成方法。 具体地,下述通式(1)的新化合物; 以及优选含有该化合物作为光酸发生剂的正性抗蚀剂材料和基础树脂; 被提供。 该正性抗蚀剂材料可含有碱性化合物或溶解抑制剂。 此外,本发明提供了一种图案形成方法,包括以下步骤:将该正性抗蚀剂材料涂布在基板上,然后对该材料进行热处理,通过照片将经处理的材料暴露于波长为300nm以下的高能量射线 掩模,任选地热处理暴露的材料,以及使用显影剂显影材料