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21. 发明授权

US06707078B1 Dummy wordline for erase and bitline leakage 有权
标题翻译：用于擦除和位线泄漏的虚拟字线
公开(公告)号：US06707078B1
公开(公告)日：2004-03-16
申请号：US10230729
申请日：2002-08-29
申请人： Hidehiko Shiraiwa , Yider Wu , Jean Yee-Mei Yang , Mark T. Ramsbey , Darlene G. Hamilton
发明人： Hidehiko Shiraiwa , Yider Wu , Jean Yee-Mei Yang , Mark T. Ramsbey , Darlene G. Hamilton
IPC分类号： H01L2968
CPC分类号： H01L27/11568 , G11C16/0466 , H01L27/115
摘要： One aspect of the present invention relates to a SONOS type non-volatile semiconductor memory device having improved erase speed, the device containing bitlines extending in a first direction; wordlines extending in a second direction, the wordlines comprising functioning wordlines and at least one dummy wordline, wherein the dummy wordline is positioned near at least one of a bitline contact and an edge of the core region, and the dummy wordline is treated so as not to cycle between on and off states. Another aspect of the present invention relates to a method of making a SONOS type non-volatile semiconductor memory device having improved erase speed, involving forming a plurality of bitlines extending in a first direction in the core region; forming a plurality of functioning wordlines extending in a second direction in the core region; forming at least one dummy wordline between the functioning wordlines and the periphery region or between the functioning wordlines and a bitline contact and treating the device so that the dummy wordline does not cycle between on and off states.
摘要翻译：本发明的一个方面涉及一种具有改进的擦除速度的SONOS型非易失性半导体存储器件，该器件含有沿第一方向延伸的位线; 所述字线在第二方向上延伸，所述字线包括功能字线和至少一个伪字线，其中所述伪字线位于所述芯区域的位线接触和边缘中的至少一个附近，并且所述伪字线被处理为不在开关状态之间循环。本发明的另一方面涉及一种制造具有改进的擦除速度的SONOS型非易失性半导体存储器件的方法，包括形成在芯区域中沿第一方向延伸的多个位线; 形成在所述芯区域中沿第二方向延伸的多个功能字线; 在功能字线和外围区域之间或在功能字线和位线接触之间形成至少一个伪字线，并对器件进行处理，使得伪字线不会在导通和关断状态之间循环。

22. 发明授权

US06680509B1 Nitride barrier layer for protection of ONO structure from top oxide loss in fabrication of SONOS flash memory 有权
标题翻译：用于保护ONO结构的氮化物阻挡层免受SONOS闪存的制造中的顶部氧化物损失
公开(公告)号：US06680509B1
公开(公告)日：2004-01-20
申请号：US10158044
申请日：2002-05-30
申请人： Yider Wu , Jean Yee-Mei Yang , Mark Ramsbey , Emmanuel H. Lingunis , Yu Sun
发明人： Yider Wu , Jean Yee-Mei Yang , Mark Ramsbey , Emmanuel H. Lingunis , Yu Sun
IPC分类号： H01L29792
CPC分类号： H01L27/11568 , H01L27/115 , Y10S438/954
摘要： A method for fabricating a SONOS device having a buried bit-line including the steps of: providing a semiconductor substrate having an ONO structure overlying the semiconductor substrate; forming a nitride barrier layer on the ONO structure to form, a four-layer stack; forming a patterned photoresist layer on the nitride barrier layer; implanting As or P ions through the four-layer stack to form a bit-line buried under the ONO structure; stripping the photoresist layer and cleaning an upper surface of the four-layer stack; and consolidating the four-layer stack by applying an oxidation cycle. The invention further relates to a SONOS-type device including the nitride barrier layer.
摘要翻译：一种用于制造具有掩埋位线的SONOS器件的方法，包括以下步骤：提供具有覆盖在半导体衬底上的ONO结构的半导体衬底; 在ONO结构上形成氮化物阻挡层以形成四层堆叠; 在氮化物阻挡层上形成图案化的光致抗蚀剂层; 将As或P离子注入四层堆叠中以形成埋在ONO结构下的位线; 剥离光致抗蚀剂层并清洁四层堆叠的上表面; 并通过施加氧化循环来合并四层堆叠。本发明还涉及包括氮化物阻挡层的SONOS型器件。

23. 发明授权

US06664191B1 Non self-aligned shallow trench isolation process with disposable space to define sub-lithographic poly space 有权
标题翻译：非自对准浅沟槽隔离工艺与一次性空间定义亚光刻多孔空间
公开(公告)号：US06664191B1
公开(公告)日：2003-12-16
申请号：US09973131
申请日：2001-10-09
申请人： Unsoon Kim , Yider Wu , Yu Sun , Michael K. Templeton , Angela T. Hui , Chi Chang
发明人： Unsoon Kim , Yider Wu , Yu Sun , Michael K. Templeton , Angela T. Hui , Chi Chang
IPC分类号： H01L21302
CPC分类号： H01L27/11526 , H01L21/0337 , H01L21/0338 , H01L21/76229 , H01L21/76838 , H01L27/11531 , Y10S438/975
摘要： A method is provided of forming lines with spaces between memory cells below a minimum printing dimension of a photolithographic tool set. In one aspect of the invention, lines and spaces are formed in a first polysilicon layer that forms floating gates of flash memory cells. STI regions are formed between adjacent memory cells in a substrate to isolate the cells from one another. The first polysilicon layer is deposited over the substrate covering the STI regions. The first polysilicon layer is then planarized by a CMP process or the like to eliminate overlay issues associated with the STI regions. A hard mask layer is deposited over the first polysilicon layer and a first space dimension d1 etched between adjacent memory cells. A conformal nitride layer is deposited over the hard mask layer and an etch step performed to form nitride side walls adjacent the spaces. The nitride side walls reduce the first space dimension to a second space dimension d2, so that spaces can be formed in the first polysilicon layer at a dimension smaller than the minimum printable dimension of the photolithographic tool set.
摘要翻译：提供了一种在光刻工具组的最小打印尺寸之下形成具有在存储器单元之间的空间的线的方法。在本发明的一个方面，线和间隔形成在形成闪存单元的浮动栅极的第一多晶硅层中。 STI区域形成在衬底中的相邻存储单元之间，以隔离细胞。第一多晶硅层沉积在覆盖STI区域的衬底上。然后通过CMP工艺等将第一多晶硅层平坦化，以消除与STI区域相关联的覆盖问题。在第一多晶硅层上沉积硬掩模层，并在相邻的存储单元之间蚀刻第一空间尺寸d1。在硬掩模层上沉积共形氮化物层，并且执行蚀刻步骤以形成邻近空间的氮化物侧壁。氮化物侧壁将第一空间尺寸减小到第二空间尺寸d2，使得可以以小于光刻工具组的最小可打印尺寸的尺寸在第一多晶硅层中形成空间。

24. 发明授权

US06566736B1 Die seal for semiconductor device moisture protection 失效
标题翻译：半导体器件防潮密封
公开(公告)号：US06566736B1
公开(公告)日：2003-05-20
申请号：US09998624
申请日：2001-11-30
申请人： Hiroyuki Ogawa , Yider Wu , Yu Sun
发明人： Hiroyuki Ogawa , Yider Wu , Yu Sun
IPC分类号： H01L23544
CPC分类号： H01L23/564 , H01L23/3185 , H01L23/485 , H01L2224/0401 , H01L2224/04042 , H01L2224/05567 , H01L2224/45144 , H01L2924/0002 , H01L2924/19041 , H01L2224/05552 , H01L2924/00
摘要： Moisture seal apparatus and methodologies are disclosed for protecting semiconductor devices from moisture. An upper seal layer, such as SiN is formed over an upper insulator layer and an exposed portion of a die seal metal structure so as to form a vertical moisture seal between electrical components in the semiconductor device and the ambient environment. A lateral seal may be formed from the die seal metal structure in an upper metal layer in the device and one or more contacts extending downward from the die seal metal to the substrate or to a lower die seal metal structure.
摘要翻译：公开了用于保护半导体器件免受湿气的湿度密封装置和方法。在上绝缘体层和模具密封金属结构的暴露部分上形成诸如SiN的上密封层，以便在半导体器件中的电气部件和周围环境之间形成垂直的湿气密封。横向密封件可以由装置中的上金属层中的模具密封金属结构和从模具密封金属向下延伸到基板或下模密封金属结构的一个或多个触点形成。

25. 发明授权

US08802537B1 System and method for improving reliability in a semiconductor device 有权
标题翻译：用于提高半导体器件的可靠性的系统和方法
公开(公告)号：US08802537B1
公开(公告)日：2014-08-12
申请号：US11189874
申请日：2005-07-27
申请人： Yider Wu , Unsoon Kim , Kuo-Tung Chang , Harpreet Sachar
发明人： Yider Wu , Unsoon Kim , Kuo-Tung Chang , Harpreet Sachar
IPC分类号： H01L21/76
CPC分类号： H01L21/76224 , H01L21/02057
摘要： A method for forming a memory device is provided. A nitride layer is formed over a substrate. The nitride layer and the substrate are etched to form a trench. The memory device is pre-cleaned to prepare a surface of the memory device for oxide formation thereon, where cleaning the memory device removes portions of the barrier oxide layer on opposite sides of the trench. The nitride layer is trimmed on opposite sides of the trench. A liner oxide layer is formed in the trench.
摘要翻译：提供了一种用于形成存储器件的方法。在衬底上形成氮化物层。蚀刻氮化物层和衬底以形成沟槽。存储器件被预先清洁以准备用于其上形成氧化物的存储器件的表面，其中清洁存储器件去除沟槽相对侧上的阻挡氧化物层的部分。在沟槽的相对侧上修整氮化物层。在沟槽中形成衬里氧化物层。

26. 发明授权

US08476156B1 Manufacturing method of flash memory structure with stress area 有权
标题翻译：具有应力区域的闪存结构的制造方法
公开(公告)号：US08476156B1
公开(公告)日：2013-07-02
申请号：US13338405
申请日：2011-12-28
申请人： Yider Wu , Hung-Wei Chen
发明人： Yider Wu , Hung-Wei Chen
IPC分类号： H01L21/3205 , H01L21/4763
CPC分类号： H01L27/11521 , H01L21/28273 , H01L29/66825 , H01L29/7881
摘要： In a manufacturing method of a flash memory structure with a stress area, a better stress effect can be achieved by controlling the manufacturing process of a tunneling oxide layer formed in a gate structure and contacted with a silicon substrate, so that an L-shaped spacer (or a first stress area) and a contact etch stop layer (or a second stress area) of each L-shaped spacer are formed between two gate structures and aligned towards each other to enhance the carrier mobility of the gate structure, so as to achieve the effects of improving a read current, obtaining the required read current by using a lower read voltage, reducing the possibility of having a stress-induced leakage current, and enhancing the data preservation of the flash memory.
摘要翻译：在具有应力区域的闪存结构的制造方法中，通过控制形成在栅极结构中并与硅衬底接触的隧道氧化物层的制造工艺，可以获得更好的应力效应，使得L形间隔物（或第一应力区域）和每个L形间隔物的接触蚀刻停止层（或第二应力区域）形成在两个栅极结构之间并且彼此对准以增强栅极结构的载流子迁移率，从而实现改善读取电流的效果，通过使用较低的读取电压获得所需的读取电流，减少产生应力引起的漏电流的可能性，以及增强闪速存储器的数据保存。

27. 发明授权

US07939423B2 Method for manufacturing nonvolatile semiconductor memory device structure 有权
标题翻译：非易失性半导体存储器件结构的制造方法
公开(公告)号：US07939423B2
公开(公告)日：2011-05-10
申请号：US12761460
申请日：2010-04-16
申请人： Yider Wu
发明人： Yider Wu
IPC分类号： H01L21/76
CPC分类号： H01L29/78 , H01L27/115 , H01L27/11521 , H01L27/11524
摘要： A non-volatile semiconductor manufacturing method comprises the steps of making element isolation/insulation films that partitions element-forming regions in a semiconductor substrate; stacking a floating gate on the semiconductor substrate via a first gate insulating film; stacking a second gate insulating film formed on the floating gate, and stacking a control gate formed on the floating gate via the second gate insulating film, and self-aligning source and drain diffusion area with the control gate. In the process of stacking a floating gate by partially etching a field oxide film in a select gate area, followed by floating gate formed in a element-forming region and select gate region, and followed by a chemical mechanical polish(CMP) process, both floating gate and select gate is hereby formed simultaneously. Thereby, when memory cells are miniaturized, the invention allows the process to be simple and reduce the defect density.
摘要翻译：非易失性半导体制造方法包括以下步骤：制造在半导体衬底中分隔元件形成区域的元件隔离/绝缘膜; 通过第一栅极绝缘膜在半导体衬底上堆叠浮置栅极; 堆叠形成在浮置栅极上的第二栅极绝缘膜，并且通过第二栅极绝缘膜堆叠形成在浮置栅极上的控制栅极以及与控制栅极的自对准源极和漏极扩散区域。在通过在选择栅极区域中局部蚀刻场氧化物膜的同时堆叠浮栅的过程中，随后是形成在元件形成区域中的浮栅并选择栅极区域，然后进行化学机械抛光（CMP）工艺，浮动门和选择门同时形成。因此，当存储单元小型化时，本发明允许该过程简单并减少缺陷密度。

28. 发明申请

US20100230738A1 NOR FLASH MEMORY STRUCTURE WITH HIGHLY-DOPED DRAIN REGION AND METHOD OF MANUFACTURING THE SAME 审中-公开
标题翻译：具有高排水区域的非闪存存储器结构及其制造方法
公开(公告)号：US20100230738A1
公开(公告)日：2010-09-16
申请号：US12400828
申请日：2009-03-10
申请人： Yider Wu , Yung-Chung Lee , Yi-Hsiu Chen
发明人： Yider Wu , Yung-Chung Lee , Yi-Hsiu Chen
IPC分类号： H01L29/788 , H01L21/336 , H01L29/00
CPC分类号： H01L27/11521 , H01L29/40114 , H01L29/42324
摘要： In a method of manufacturing a NOR flash memory structure, a highly-doped ion implantation process is performed to form a highly-doped drain region to overlap with a lightly-doped drain region. Therefore, the flash memory structure can have a reduced drain junction depth to improve the short channel effect while protecting the lightly-doped drain region from being punched through during an etching process for forming a contact hole.
摘要翻译：在制造NOR闪速存储器结构的方法中，执行高掺杂离子注入工艺以形成与轻掺杂漏极区重叠的高度掺杂的漏极区。因此，在用于形成接触孔的蚀刻工艺期间，闪速存储器结构可以具有减小的漏极结深度以改善短沟道效应，同时保护轻掺杂漏极区域不被穿孔。

29. 发明授权

US07632749B1 Semiconductor device having a pad metal layer and a lower metal layer that are electrically coupled, whereas apertures are formed in the lower metal layer below a center area of the pad metal layer 有权
标题翻译：具有电耦合的焊盘金属层和下金属层的半导体器件，而在焊盘金属层的中心区域下方的下金属层中形成孔
公开(公告)号：US07632749B1
公开(公告)日：2009-12-15
申请号：US10823970
申请日：2004-04-13
申请人： Hiroyuki Ogawa , Yider Wu , Nian Yang , Kuo-Tung Chang , Yu Sun
发明人： Hiroyuki Ogawa , Yider Wu , Nian Yang , Kuo-Tung Chang , Yu Sun
IPC分类号： H01L21/44
CPC分类号： H01L21/76816 , H01L24/05 , H01L2224/02166 , H01L2224/05093 , H01L2224/05095 , H01L2224/05096 , H01L2224/05554 , H01L2924/01033 , H01L2924/01074 , H01L2924/01082 , H01L2924/14
摘要： A semiconductor device is disclosed and provided. The semiconductor device includes a pad metal layer having a perimeter area and a center area. Further, the semiconductor device has a lower metal layer having a plurality of apertures below the center area of the pad metal layer. Moreover, an interlayer dielectric is formed between the pad metal layer and the lower metal layer. In an embodiment, the semiconductor device also includes a plurality of vias formed in the interlayer dielectric. The vias electrically couple the pad metal layer and the lower metal layer. Additionally, the vias are located below the perimeter area of the pad metal layer.
摘要翻译：公开并提供了半导体器件。半导体器件包括具有周边区域和中心区域的焊盘金属层。此外，半导体器件具有在焊盘金属层的中心区域下方具有多个孔的下部金属层。此外，在焊盘金属层和下金属层之间形成层间电介质。在一个实施例中，半导体器件还包括形成在层间电介质中的多个通孔。通孔电连接焊盘金属层和下部金属层。另外，通孔位于垫金属层的周边区域的下方。

30. 发明授权

US07408220B2 Non-volatile memory and fabricating method thereof 失效
标题翻译：非易失性存储器及其制造方法
公开(公告)号：US07408220B2
公开(公告)日：2008-08-05
申请号：US11463250
申请日：2006-08-08
申请人： Jongoh Kim , Yider Wu , Kent-Kuohua Chang
发明人： Jongoh Kim , Yider Wu , Kent-Kuohua Chang
IPC分类号： H01L29/788
CPC分类号： H01L21/28282 , H01L27/115 , H01L27/11568
摘要： A method of fabricating a non-volatile memory is provided. A plurality of columns of isolation structures are formed on a substrate. A plurality of rows of stacked gate structures crossing over the isolation structures are formed on the substrate. A plurality of doping regions are formed in the substrate between two neighboring stacked gate structures. A plurality of stripes of spacers are formed on the sidewalls of stacked gate structures. A plurality of first dielectric layers are formed on a portion of the isolation structures adjacent to two rows of stacked gate structures. Also, one isolation structure is disposed between two neighboring first dielectric layers in the same row, while two neighboring rows comprising the first dielectric layer and the isolation structure are arranged in an interlacing manner. A plurality of first conductive layers are formed between two neighboring first dielectric layers in the same row.
摘要翻译：提供了一种制造非易失性存储器的方法。在衬底上形成多个隔离结构的列。在衬底上形成多个跨越隔离结构的层叠栅极结构的行。在两个相邻的堆叠栅极结构之间的衬底中形成多个掺杂区域。在堆叠栅极结构的侧壁上形成多个隔离条。多个第一电介质层形成在隔离结构的与两排堆叠栅极结构相邻的部分上。此外，一个隔离结构设置在相同行中的两个相邻的第一介电层之间，而包括第一介电层和隔离结构的两个相邻行以隔行方式布置。在同一行中的两个相邻的第一电介质层之间形成多个第一导电层。

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