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    • 22. 发明申请
    • Operation Supporting Device, Method and Program
    • 操作支持设备,方法和程序
    • US20080051651A1
    • 2008-02-28
    • US10599487
    • 2005-03-29
    • Seiji YamamotoSusumu TerakawaToshihisa TakaiKatsuhiro Sato
    • Seiji YamamotoSusumu TerakawaToshihisa TakaiKatsuhiro Sato
    • A61B8/00
    • A61B8/08A61B8/0816A61B8/4416
    • Surgical operation supporting apparatus and method is disclosed in which based on a plurality of high-definition tomographic images of an operation site produced before surgery, a three-dimensional model of the operation site is generated, and a surface of the operation site is optically measured during the surgical operation, and further, first position information that represents a three-dimensional position of each of points on the surface of the operation site is acquired. Further, an unexposed portion of the operation site is measured with ultrasonic waves during the surgical operation, and the second position information that represents a three-dimensional position of each of points in the unexposed portion of the operation site is acquired. Moreover, based on the first position information and the second position information, displacement and distortion occurring at each of the points in the operation site are estimated using the generated three-dimensional model. And then, in accordance with the estimated displacement and distortion occurring at each of the points in the operation site, the plurality of high-definition tomographic images of the operation site produced before the surgical operation are corrected and the corrected high-definition tomographic images are displayed.
    • 公开了一种手术操作辅助装置和方法,其中,根据手术前产生的手术部位的多个高清晰度断层摄影图像,生成操作部位的三维模型,并且操作部位的表面被光学测量 在外科手术中,获取表示操作部位的表面上的各点的三维位置的第一位置信息。 此外,在手术操作期间用超声波测量操作部位的未曝光部分,并且获取表示操作部位的未曝光部分中的每个点的三维位置的第二位置信息。 此外,基于第一位置信息和第二位置信息,使用所生成的三维模型来估计在操作部位的每个点发生的位移和失真。 然后,根据在操作部位的每个点发生的估计的位移和失真,校正在外科手术之前产生的操作部位的多个高清晰度断层图像,并且校正的高清晰度断层图像 显示。
    • 24. 发明授权
    • Article washing apparatus
    • 文章洗涤装置
    • US06938282B2
    • 2005-09-06
    • US10453521
    • 2003-06-04
    • Seiji Yamamoto
    • Seiji Yamamoto
    • E03C1/18A47L15/00A47L15/24B08B3/02A47K1/04
    • A47L15/247A47L15/0086
    • A tableware washing apparatus is adapted to allow garbage deposited to tableware to be washed off by washing water injected toward the inside of a shower sink, and the garbage dropped into the inside of the shower sink to be washed out with the washing water. A cross-sectional shape of the shower sink includes a bottom wall having a large curvature, a first sidewall rising substantially vertically from one of opposite ends of the bottom wall, and a second sidewall rising from the other end of the bottom wall and having a curvature smaller than that of the bottom wall. A sectional area of a flow path at the bottom wall is small, as compared with a shower sink having a quadrilateral section or a circular section. Therefore, even if the flow rate of the washing water is reduced to save water, the flow speed of the washing water flowing on the bottom wall can be raised to effectively wash out the garbage.
    • 餐具洗涤装置适用于通过冲洗向淋浴槽内部注入的水而将垃圾沉积到餐具上,并将垃圾落入淋浴槽内部以用洗涤水冲洗掉。 淋浴器的横截面形状包括具有大曲率的底壁,从底壁的相对端之一基本垂直地上升的第一侧壁和从底壁的另一端起升的第二侧壁,并且具有 曲率小于底壁的曲率。 与具有四边形截面或圆形截面的淋浴器相比,底壁处的流路的截面面积小。 因此,即使减少洗涤水的流量来节省水分,也可以提高流动在底壁上的洗涤水的流速,有效地清洗垃圾。
    • 28. 发明授权
    • Surface analyzing method and its apparatus
    • 表面分析方法及其装置
    • US5714757A
    • 1998-02-03
    • US542562
    • 1995-10-13
    • Naoshi ItabashiKozo MochijiHiroyasu ShichiSeiji YamamotoSatoshi OsabeKeiichi Kanehori
    • Naoshi ItabashiKozo MochijiHiroyasu ShichiSeiji YamamotoSatoshi OsabeKeiichi Kanehori
    • G01N23/225G01Q90/00H01J37/252H01J37/08
    • G01N23/2255H01J37/252H01J2237/04756
    • A surface analyzing method comprising an ion generation step for generating multiply-charged ions of specific ion species and specific charge state; a deceleration step for decelerating the generated multiply-charged ions to a lower kinetic energy than an energy of threshold of sputtering of an objective material; an irradiation step for irradiating the decelerated multiply-charged ions on the surface of a sample; and an analysis step for analyzing particles or light emitted from the surface of said sample by the irradiation of said multiply-charged ions. Apparatus is provided for carrying out the method. Since the ions irradiated on the sample surface are multiply-charged ions having a lower kinetic energy than that of threshold of sputtering of materials constituting a sample, the irradiated ions interact merely with the top surface layer of the sample whereby analyzed information merely from the top surface layer of the sample can be obtained, and as a result, the kind of atoms of the top surface layer of the sample and the bonding state of said atoms can be analyzed with high sensitivity and high resolution.
    • 一种表面分析方法,包括用于产生特定离子种类的多电荷离子和特定电荷状态的离子产生步骤; 减速步骤,用于将产生的多电荷离子减速到比目标材料的溅射阈值的能量更低的动能; 照射步骤,用于在样品的表面上照射减速的多电荷离子; 以及分析步骤,用于通过照射所述多电荷离子来分析从所述样品的表面发射的颗粒或光。 提供了用于执行该方法的装置。 由于照射在样品表面上的离子是具有比构成样品的材料的溅射阈值低的动能的多电荷离子,因此照射的离子仅与样品的顶表面层相互作用,从而仅从顶部分析信息 可以获得样品的表面层,结果,可以以高灵敏度和高分辨率分析样品的顶表面层的原子的种类和所述原子的键合状态。
    • 29. 发明授权
    • Surface treating method and apparatus therefor
    • 表面处理方法及其设备
    • US5527731A
    • 1996-06-18
    • US149941
    • 1993-11-10
    • Seiji YamamotoKozo Mochiji
    • Seiji YamamotoKozo Mochiji
    • C23C16/44C23C16/452C23C16/455C23C16/48H01J37/32H01L21/285H01L21/306H01L21/203
    • C23C16/4551C23C16/452C23C16/483H01J37/32H01J37/32422H01L21/28512H01L21/30621H01J2237/0812
    • A surface treating method of the invention comprises the steps of generating mixed chemical species containing an intended chemical species of ions necessary for surface treatment by ionization of a gas, selectively trapping the intended chemical species from the mixed chemical species, exciting the intended chemical species to predetermined vibrational and electronic states, extracting the excited chemical species from a position where trapped, and subjecting the extracted chemical species to surface treatment on a surface of an article to be treated. In this method, the intended chemical species of ions which are under vibrational and electronic conditions effective for the surface treatment and have a certain mass number have been once trapped at a given position. The trapped ions are uniformly arranged with respect to their translational velocity and applied to a sample surface. Thus, dry etching with high anisotropy and high selectivity to material and deposition with good uniformity can be realized.
    • 本发明的表面处理方法包括以下步骤:产生混合化学物质,其含有通过电离电离进行表面处理所必需的离子化学物质种类,选择性地捕集来自混合化学物质的预期化学物质,将预期化学物质激发至 预定的振动和电子状态,从被捕获的位置提取被激发的化学物质,并对所提取的化学物质在待处理物品的表面进行表面处理。 在这种方法中,在有效用于表面处理并且具有一定质量数量的振动和电子条件下的目标化学物质种类一度被捕获在给定位置。 捕获的离子相对于其平移速度均匀地排列并施加到样品表面。 因此,可以实现具有高各向异性的干蚀刻和具有高均匀性的材料和沉积的高选择性。
    • 30. 发明授权
    • Digital signal processing system
    • 数字信号处理系统
    • US5432853A
    • 1995-07-11
    • US212857
    • 1994-03-15
    • Seiji Yamamoto
    • Seiji Yamamoto
    • G09C1/00H04L9/16H04L9/20H04L9/22H04L9/24H04L9/00
    • H04L9/0662
    • A selector circuit (11) generates generator polynomial information (SD) by performing a predetermined logic operation in response to a random number signal (S1). A quasi-random code generator circuit (1) outputs a quasi-random code (RP) by using a generator polynomial determined based on the generator polynomial information (SD). An exclusive-OR gate (6) scrambles an input digital signal (DI) by calculating the exclusive-OR of the input digital signal (DI) applied to its first input and the quasi-random code (RP) applied to its second input, to output a scrambled output digital signal (DO). The generator polynomial may be changed for each packet, whereby a digital signal processing system is permitted to transmit and receive the scrambled digital signal which is difficult to decode.
    • 选择器电路(11)通过响应随机数信号(S1)执行预定的逻辑运算来产生生成多项式信息(SD)。 准随机码发生器电路(1)通过使用基于生成多项式信息(SD)确定的生成多项式来输出准随机码(RP)。 异或门(6)通过计算应用于其第一输入的输入数字信号(DI)和应用于其第二输入的准随机码(RP)的异或来对输入数字信号(DI)进行加扰, 以输出加扰输出数字信号(DO)。 可以为每个分组改变生成多项式,从而允许数字信号处理系统发送和接收难以解码的加扰数字信号。