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    • 18. 发明授权
    • Method for applying or removing material
    • 施加或去除材料的方法
    • US06528807B1
    • 2003-03-04
    • US09485210
    • 2000-02-04
    • Hans Wilfried Peter KoopsJohannes KretzHubert Brueckl
    • Hans Wilfried Peter KoopsJohannes KretzHubert Brueckl
    • H01J37305
    • B82B3/00G01Q30/12G01Q70/06G01Q80/00G11B9/14G11B9/1409G11B9/1418G11B9/1463Y10S977/855Y10S977/86Y10S977/869Y10S977/888
    • A process which allows effective application or removal of materials to and from substrates using a scanning probe microscope operated at atmospheric pressure. The substrate is placed in a trough, located on the x-y table of a scanning probe microscope (SXM), and this trough is filled with a liquid and/or gaseous medium up to a level such that the top side of the substrate is covered with a thin layer, composed of at least one monolayer of the medium. For depositing a structured precipitate from the medium or for structuring etching of the surface of the substrate, the microtip of the SXM is then dipped into the layer and supplied with an electric voltage or with voltage pulses. The process can be used for applying or removing materials to and from substrates. The process is also usable for characterization of the geometry and for restoration or the production of microtips of SXM cantilevers, as well as for storing information, for reading information and for erasing information.
    • 使用在大气压下操作的扫描探针显微镜,可以有效地施加或去除衬底的工艺。将衬底置于位于扫描探针显微镜(SXM)的xy台上的槽中,该槽是 填充有液体和/或气体介质,直到基底的顶侧覆盖有由介质的至少一个单层组成的薄层。 为了从介质沉积结构沉淀物或用于构造基板表面的蚀刻,然后将SXM的微尖端浸入该层中并提供电压或电压脉冲。该方法可用于施加或去除 材料往返于基材。 该过程还可用于表征SXM悬臂的几何形状和微型尖头的恢复或生产,以及用于存储信息,用于读取信息和擦除信息。