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    • 11. 发明申请
    • Water vapor passivation of a wall facing a plasma
    • 面对等离子体的水的水蒸气钝化
    • US20070190266A1
    • 2007-08-16
    • US11351676
    • 2006-02-10
    • Xinyu Fu
    • Xinyu Fu
    • B08B6/00B08B9/00C23C16/00H05H1/24
    • H01L21/76814H01L21/02063
    • A chamber passivation method particularly useful for hydrogen plasma cleaning of low-k dielectrics prior to coating a barrier layer into a via hole with hydrogen radicals are provided from a remote plasma source. For each wafer, the chamber is passivated with water vapor (or other gas even more chemabsorbed on plasma facing walls) passed through the remote plasma source prior to the ignition of the hydrogen plasma. The water vapor is absorbed on walls, such as alumina and quartz parts of the remote plasma source, and forms a protective mono-layer that endures sufficiently long to protect the walls during the generation of the hydrogen plasma. Thereby, the plasma facing walls, particularly of a dielectric such as alumina, are protected from etching.
    • 从远程等离子体源提供在将阻挡层涂覆到具有氢自由基的通孔中之前特别可用于低k电介质的氢等离子体清洗的室钝化方法。 对于每个晶片,在氢等离子体点燃之前,通过远程等离子体源的水蒸气(或者在面向等离子体的壁上更多化学吸附的其它气体)钝化室。 水蒸汽被吸收在诸如远距离等离子体源的氧化铝和石英部分的壁上,并且形成足够长的保护单层,以在氢等离子体的产生期间保护壁。 因此,保护​​等离子体面对的壁,特别是电介质如氧化铝,防止蚀刻。
    • 16. 发明申请
    • METHOD FOR NITRIDATION PRETREATMENT
    • 硝化预处理方法
    • US20100099251A1
    • 2010-04-22
    • US12256235
    • 2008-10-22
    • XINYU FUJick M. Yu
    • XINYU FUJick M. Yu
    • H01L21/768
    • H01L21/76826H01L21/76814H01L21/76831H01L23/53238H01L2924/0002H01L2924/00
    • In one embodiment, a method for fabricating a damascene structure is provided which includes exposing a dielectric surface on a substrate to a nitrogen plasma to form a nitrided dielectric layer, wherein the dielectric surface contains a plurality of openings therein, depositing a barrier layer on the nitrided dielectric surface, and depositing a seed layer over the barrier layer. In some examples, the nitrogen plasma is formed from nitrogen gas or a mixture of nitrogen gas and hydrogen gas. The nitrogen plasma may be formed in a barrier deposition chamber or by a reactive preclean chamber. In another embodiment, a bulk layer may be deposited to fill the openings after depositing the seed layer. In one example, the bulk layer may contain copper, tungsten, or alloys thereof, and be deposited by an electrochemical plating process.
    • 在一个实施例中,提供了一种用于制造镶嵌结构的方法,其包括将衬底上的电介质表面暴露于氮等离子体以形成氮化介电层,其中电介质表面包含多个开口,在其上沉积阻挡层 氮化电介质表面,并且在阻挡层上沉积种子层。 在一些实例中,氮等离子体由氮气或氮气和氢气的混合物形成。 氮等离子体可以形成在阻挡沉积室中或通过反应性预清洗室形成。 在另一个实施例中,沉积种子层之后可沉积体层以填充开口。 在一个实例中,本体层可以包含铜,钨或其合金,并且通过电化学电镀工艺沉积。
    • 17. 发明授权
    • Apparatus and a method for cleaning a dielectric film
    • 用于清洁电介质膜的装置和方法
    • US07658802B2
    • 2010-02-09
    • US11284775
    • 2005-11-22
    • Xinyu FuJohn ForsterWei W. Wang
    • Xinyu FuJohn ForsterWei W. Wang
    • B08B6/00
    • H01L21/02063H01J37/32357H01J37/32422H01J37/3266
    • An apparatus and a method of cleaning a dielectric film are provided in the present invention. In one embodiment, an apparatus of cleaning a dielectric film the apparatus includes a chamber body adapted to support a substrate therein, a remote plasma source adapted to provide a plurality of reactive radicals to the chamber body, a passage coupling the remote plasma source to the chamber body, and at least one magnet disposed adjacent the passage. In another embodiment, a method of cleaning a dielectric film that includes providing a substrate having an at least partially exposed dielectric layer disposed in a process chamber, generating a plurality of reactive radicals in a remote plasma source, flowing the reactive radicals from the remote plasma source into the process chamber through a passage having at least one magnet disposed adjacent the passage, and magnetically filtering the reactive radicals passing through the passage.
    • 在本发明中提供了一种清洁电介质膜的装置和方法。 在一个实施例中,一种清洁电介质膜的装置包括适于在其中支撑衬底的室主体,适于向室主体提供多个反应性基团的远程等离子体源,将远程等离子体源耦合到 室主体,以及邻近通道设置的至少一个磁体。 在另一个实施例中,一种清洁电介质膜的方法,该方法包括提供具有设置在处理室中的至少部分暴露的电介质层的衬底,在远程等离子体源中产生多个反应性基团,使来自远端等离子体的反应性基团 通过具有邻近通道设置的至少一个磁体的通道进入处理室,并对穿过通道的反应性基团进行磁过滤。
    • 18. 发明申请
    • Remote Plasma Source for Pre-Treatment of Substrates Prior to Deposition
    • 远程等离子体源在沉积前预处理基板
    • US20090017227A1
    • 2009-01-15
    • US11776131
    • 2007-07-11
    • Xinyu FUJick M. YU
    • Xinyu FUJick M. YU
    • H05H1/24C23C16/00
    • C23C16/0245H01J37/32357
    • A plasma processing chamber particularly useful for pre-treating low-k dielectric films and refractory metal films subject to oxidation prior to deposition of other layers. A remote plasma source (RPS) excites a processing gas into a plasma and delivers it through a supply tube to a manifold in back of a showerhead faceplate. The chamber is configured for oxidizing and reducing plasmas in the same or different processes when oxygen and hydrogen are selectively supplied to the RPS. The supply tube and showerhead may be formed of dielectric oxides which may be passivated by a water vapor plasma from the remote plasma source. In one novel process, a protective hydroxide coating is formed on refractory metals by alternating neutral plasmas of hydrogen and oxygen.
    • 一种等离子体处理室,特别适用于在沉积其它层之前预处理低k电介质膜和难以处理的金属薄膜。 远程等离子体源(RPS)将处理气体激发到等离子体中并将其通过供应管输送到喷头面板背面的歧管。 当氧气和氢气选择性地供应给RPS时,该室被配置用于在相同或不同的过程中氧化和还原等离子体。 供应管和喷头可以由介电氧化物形成,其可以由远程等离子体源的水蒸汽等离子体钝化。 在一个新颖的方法中,通过交替的氢和氧的中性等离子体在难熔金属上形成保护性氢氧化物涂层。
    • 19. 发明申请
    • Apparatus and a method for cleaning a dielectric film
    • 用于清洁电介质膜的装置和方法
    • US20070113868A1
    • 2007-05-24
    • US11284775
    • 2005-11-22
    • Xinyu FuJohn ForsterWei Wang
    • Xinyu FuJohn ForsterWei Wang
    • B08B6/00
    • H01L21/02063H01J37/32357H01J37/32422H01J37/3266
    • An apparatus and a method of cleaning a dielectric film are provided in the present invention. In one embodiment, an apparatus of cleaning a dielectric film the apparatus includes a chamber body adapted to support a substrate therein, a remote plasma source adapted to provide a plurality of reactive radicals to the chamber body, a passage coupling the remote plasma source to the chamber body, and at least one magnet disposed adjacent the passage. In another embodiment, a method of cleaning a dielectric film that includes providing a substrate having an at least partially exposed dielectric layer disposed in a process chamber, generating a plurality of reactive radicals in a remote plasma source, flowing the reactive radicals from the remote plasma source into the process chamber through a passage having at least one magnet disposed adjacent the passage, and magnetically filtering the reactive radicals passing through the passage.
    • 在本发明中提供了一种清洁电介质膜的装置和方法。 在一个实施例中,一种清洁电介质膜的装置包括适于在其中支撑衬底的室主体,适于向室主体提供多个反应性基团的远程等离子体源,将远程等离子体源耦合到 室主体,以及邻近通道设置的至少一个磁体。 在另一个实施例中,一种清洁电介质膜的方法,该方法包括提供具有设置在处理室中的至少部分暴露的电介质层的衬底,在远程等离子体源中产生多个反应性基团,使来自远端等离子体的反应性基团 通过具有邻近通道设置的至少一个磁体的通道进入处理室,并对穿过通道的反应性基团进行磁过滤。