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    • 11. 发明申请
    • Process for producing single crystal and single crystal
    • 制造单晶和单晶的方法
    • US20070017433A1
    • 2007-01-25
    • US10560581
    • 2004-05-28
    • Masahiro SakuradaMakoto IidaNobuaki MitamuraAtsushi Ozaki
    • Masahiro SakuradaMakoto IidaNobuaki MitamuraAtsushi Ozaki
    • C30B15/00C30B21/06C30B28/10C30B30/04C30B27/02
    • C30B29/06C30B15/203
    • The present invention is a method for producing a single crystal with pulling the single crystal from a raw material melt in a chamber by CZ method, wherein when growing the single crystal, where a pulling rate is defined as V and a temperature gradient of the crystal is defined as G during growing the single crystal, the temperature gradient G of the crystal is controlled by changing at least two or more of pulling conditions including a diameter of the straight body of the single crystal, a rotation rate of the single crystal during pulling the single crystal, a flow rate of an inert-gas introduced into the chamber, a position of a heater heating the raw material melt and a distance between the melt surface of the raw material melt and a heat insulating member provided in the chamber so as to oppose to the surface of the raw material melt, thereby V/G which is a ratio of the pulling rate V and the temperature gradient G of the crystal is controlled so that a single crystal including a desired defect region is grown. Thereby, there is provided a method for producing a single crystal in which when the single crystal is grown by CZ method, V/G can be controlled without lowering a pulling rate V, and thus the single crystal including a desired defect region can be produced effectively for a short time.
    • 本发明是一种通过CZ法从室内的原料熔融物中拉出单晶的单晶的制造方法,其中,当生长单晶时,拉伸速度定义为V,晶体的温度梯度 在生长单晶时被定义为G,通过改变至少两个或更多个拉丝条件来控制晶体的温度梯度G,所述拉伸条件包括单晶直直体的直径,拉伸期间单晶的旋转速率 单晶,引入到室中的惰性气体的流量,加热原料熔体的加热器的位置以及原料熔体的熔融表面与设置在室中的绝热构件之间的距离,以便 与原料熔体的表面相对,从而控制作为晶体的拉伸速度V与温度梯度G的比的V / G,使得包含 生长期望的缺陷区域。 因此,提供了一种单晶的制造方法,其中当通过CZ法生长单晶时,可以在不降低拉伸速度V的情况下控制V / G,从而可以产生包含所需缺陷区的单晶 有效地在短时间内。
    • 19. 发明授权
    • Serial access memory comprising disconnecting circuit between serial bus
lines and preamplifier
    • 串行存取存储器包括在串行总线和前置放大器之间断开电路
    • US5282166A
    • 1994-01-25
    • US825214
    • 1992-01-24
    • Atsushi Ozaki
    • Atsushi Ozaki
    • G11C8/04G11C7/06G11C7/12G11C11/401G11C11/409G11C11/417G11C7/00
    • G11C7/12G11C7/062G11C7/065
    • An improved serial access memory without erroneous reading where a faster reading operation is required. The serial access memory includes a disconnecting circuit connected between a serial bus line pair and a preamplifier. A data signal read out from a memory cell is provided to the preamplifier via the serial bus line pair. The disconnecting circuit electrically disconnects the serial bus line pair from the preamplifier after a predetermined time has elapsed since the preamplifier commences amplifying operation. An equalize circuit commences equalization of a next data signal right after the operation of the disconnecting circuit. Since the equalize timing of the serial bus line pair for reading the next data is made to commence earlier, proper reading operation can be realized even if the frequency of an externally applied serial out clock signal SOC is increased.
    • 改进的串行访问存储器,而不需要更快读取操作的错误读取。 串行存取存储器包括连接在串行总线对和前置放大器之间的断开电路。 从存储单元读出的数据信号通过串行总线对提供给前置放大器。 在从前置放大器开始放大操作经过预定时间之后,断开电路将串行总线线对与前置放大器电气断开。 均衡电路在断开电路的操作之后开始下一个数据信号的均衡。 由于用于读取下一个数据的串行总线线对的均衡时间早于开始,因此即使外部施加的串行输出时钟信号SOC的频率增加,也可以实现适当的读取操作。