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111. 发明授权

US07425983B2 Security system 失效
标题翻译：保安系统
公开(公告)号：US07425983B2
公开(公告)日：2008-09-16
申请号：US10755293
申请日：2004-01-13
申请人： Shiho Izumi , Hiroshi Kuroda , Satoru Kuragaki
发明人： Shiho Izumi , Hiroshi Kuroda , Satoru Kuragaki
IPC分类号： H04N7/18
CPC分类号： G08B13/19691 , G08B13/187 , G08B13/19608 , G08B13/19695 , G08B13/2491 , H05B37/0227
摘要： A simple outdoor security system which uses sensors to monitor an area around a building to detect intruders while reducing the number of sensors necessary for ensuring detection accuracy, which has at least a detection means for radiating light or an electric wave to a prescribed area to detect an object, receiving a wave reflected by the object and detecting at least the speed and location of the object; an imaging means for imaging the object; and a means for directing said imaging means toward the object according to the object's speed and location detected by said detection means.
摘要翻译：一种简单的户外安全系统，其使用传感器来监测建筑物周围的区域以检测入侵者，同时减少确保检测精度所需的传感器的数量，其至少具有用于将光或电波照射到指定区域以检测接收由物体反射的波并至少检测物体的速度和位置的物体; 用于对物体成像的成像装置; 以及用于根据由所述检测装置检测到的物体的速度和位置将所述成像装置朝向物体引导的装置。

112. 发明授权

US07388199B2 Probe manufacturing method, probe, and scanning probe microscope 失效
标题翻译：探针制造方法，探头和扫描探针显微镜
公开(公告)号：US07388199B2
公开(公告)日：2008-06-17
申请号：US10570198
申请日：2004-09-03
申请人： Takafumi Morimoto , Tooru Shinaki , Yoshiyuki Nag'No , Yukio Kenbou , Yuuichi Kunitomo , Takenori Hiroki , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa , Ken Murayama , Mitsuo Hayashibara , Kishio Hidaka , Tadashi Fujieda
发明人： Takafumi Morimoto , Tooru Shinaki , Yoshiyuki Nag'No , Yukio Kenbou , Yuuichi Kunitomo , Takenori Hiroki , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa , Ken Murayama , Mitsuo Hayashibara , Kishio Hidaka , Tadashi Fujieda
IPC分类号： G21K7/00
CPC分类号： G01Q70/12
摘要： A probe is made by attaching a carbon nanotube 12 to a mounting base end 13, which eliminates the effects of a carbon contamination film, to increase the bonding strength, increase the conductivity of the probe, and strengthen the bonding performance thereof by coating the entire circumference of the nanotube and the base with a coating film, rather than coating just one side. The work of mounting the carbon nanotube and mounting base end are performed under observation by a microscope. Further, the carbon contamination film 14 formed by an electron microscope is stripped off at a stage before bonding by the coating film.
摘要翻译：通过将碳纳米管12附着到安装基端13上，从而消除碳污染膜的影响，提高接合强度，提高探针的导电性，并通过涂覆全部纳米管的周长和基底与涂膜，而不是仅涂覆一面。在显微镜观察下进行安装碳纳米管和安装基端的工作。此外，通过电子显微镜形成的碳污染膜14在通过涂膜粘合之前的阶段被剥离。

113. 发明授权

US07333191B2 Scanning probe microscope and measurement method using the same 失效
标题翻译：扫描探针显微镜和测量方法使用相同
公开(公告)号：US07333191B2
公开(公告)日：2008-02-19
申请号：US10893364
申请日：2004-07-19
申请人： Ken Murayama , Yukio Kenbou , Yuuichi Kunitomo , Takenori Hiroki , Yoshiyuki Nagano , Takafumi Morimoto , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa
发明人： Ken Murayama , Yukio Kenbou , Yuuichi Kunitomo , Takenori Hiroki , Yoshiyuki Nagano , Takafumi Morimoto , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa
IPC分类号： G01B1/00
CPC分类号： G01Q20/02 , G01Q30/06 , G01Q70/04
摘要： A scanning probe microscope has a cantilever with a probe facing a sample and a measurement section for measuring a physical quantity occurring between the probe and the sample when the probe scans a surface of the sample, holding the physical quantity constant to measure the surface of the sample. The above microscope further has a probe tilt mechanism, an optical microscope etc. for detecting a position of the probe when the probe is tilted, and a control section for setting the probe in a first tilt posture and second tilt posture, measuring a surface of the sample by the measurement section at each tilt posture, detecting the position of the probe at least at the second tilt posture by the optical microscope etc., and making a measurement location at the second tilt posture match with a measurement location at the first tilt posture for measurement.
摘要翻译：扫描探针显微镜具有悬臂，探针面向样品和测量部分，用于测量探头和样品之间发生的物理量，当探针扫描样品的表面时，保持物理量常数以测量样品的表面样品。上述显微镜还具有探针倾斜机构，光学显微镜等，用于在探头倾斜时检测探头的位置;以及控制部，用于将探针设置在第一倾斜姿势和第二倾斜姿势中，通过测量部分在每个倾斜姿势下的样本，至少通过光学显微镜等检测第二倾斜姿势的探测器的位置，并且使第二倾斜姿势的测量位置与第一倾斜处的测量位置匹配测量姿势。

114. 发明申请

US20070266780A1 Scanning Probe Microscope 失效
标题翻译：扫描探头显微镜
公开(公告)号：US20070266780A1
公开(公告)日：2007-11-22
申请号：US11737779
申请日：2007-04-20
申请人： SHUICHI BABA , Masahiro Watanabe , Toshihiko Nakata , Toru Kurenuma , Hiroshi Kuroda , Takafumi Morimoto , Yukio Kembo , Manabu Edamura
发明人： SHUICHI BABA , Masahiro Watanabe , Toshihiko Nakata , Toru Kurenuma , Hiroshi Kuroda , Takafumi Morimoto , Yukio Kembo , Manabu Edamura
IPC分类号： G01N13/10
CPC分类号： G01Q60/28 , G01Q10/06 , G01Q30/04
摘要： With a scanning probe microscope, if a plurality of sample properties are measured using a scanning scheme of allowing a probe to approach and withdraw from a sample, the sample properties need to be accurately and reliably detected in the minimum required measurement time. Further, the acting force between the probe and the sample varies depending on the type of the probe and the wear condition of a probe tip. Thus, disadvantageously, property values acquired using different probes cannot be compared with one another unless the artifactual effect of the measuring probes are eliminated. In accordance with the present invention, with a scanning probe microscope, the probe is brought into intermittent contact with the sample, while driving means repeatedly allows the probe to approach and withdraw from the sample with a variable amplitude. The sample property is thus acquired at a high speed. Further, a calibration sample is used in a given environment (given temperature and humidity) to acquire a force curve for at least one point. Information obtained from the force curve is used to correct measurements to display the distribution of the sample property.
摘要翻译：使用扫描探针显微镜，如果使用允许探针进入和退出样本的扫描方案测量多个样品特性，则需要在最小所需测量时间内精确可靠地检测样品性质。此外，探针和样品之间的作用力根据探针的类型和探针尖端的磨损情况而变化。因此，不利的是，使用不同探针获得的特性值不能相互比较，除非消除了测量探针的人为影响。根据本发明，利用扫描探针显微镜，使探针与样品间歇接触，同时驱动装置反复允许探针以可变的幅度从样品接近和退出。因此，以高速度获取样品特性。此外，在给定的环境（给定的温度和湿度）中使用校准样品以获得至少一个点的力曲线。从力曲线获得的信息用于校正测量值以显示样品属性的分布。

115. 发明申请

US20070180889A1 Probe replacement method for scanning probe microscope 审中-公开
标题翻译：用于扫描探针显微镜的探头更换方法
公开(公告)号：US20070180889A1
公开(公告)日：2007-08-09
申请号：US10565509
申请日：2004-03-22
申请人： Ken Murayama , Yokio Kenbou , Yuuichi Kunitomo , Takenori Hiroki , Yoshiyuki Nagano , Takafumi Morimoto , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa , Takashi Furutani
发明人： Ken Murayama , Yokio Kenbou , Yuuichi Kunitomo , Takenori Hiroki , Yoshiyuki Nagano , Takafumi Morimoto , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa , Takashi Furutani
IPC分类号： G12B21/00 , G01N13/10
CPC分类号： G01Q10/06 , G01Q30/06 , G01Q70/02
摘要： A probe replacement method for a scanning probe microscope for measuring the surface of a sample, having a cantilever (21) having a probe (20), and a measurement unit for measuring a physical quantity between the probe and sample. The scanning probe microscope is provided with a cantilever mount (22), a cantilever cassette (30), an XY stage (14) and Z stage (15) for moving the cantilever cassette, and an optical microscope (18). In a first step, a cantilever is selected from the cantilever cassette and is mounted on the cantilever mount. In a second step, an optical microscope is moved and the mounted cantilever is set in a prescribed position in the field of view after the cantilever is mounted in the scanning probe microscope. In the second step, a step is provided for moving the optical microscope side or the cantilever side and performing positional adjustment.
摘要翻译：一种用于测量具有具有探针（20）的悬臂（21）的样品表面的扫描探针显微镜的探针替换方法和用于测量探针和样品之间的物理量的测量单元。扫描探针显微镜具有用于移动悬臂盒的悬臂安装座（22），悬臂盒（30），XY台（14）和Z台（15）以及光学显微镜（18）。在第一步中，从悬臂盒中选择悬臂，并安装在悬臂安装座上。在第二步骤中，移动光学显微镜，并且在将悬臂安装在扫描探针显微镜中之后，将安装的悬臂设置在视野中的规定位置。在第二步骤中，提供移动光学显微镜侧或悬臂侧并执行位置调整的步骤。

116. 发明申请

US20060284084A1 Probe manufacturing method, probe, and scanning probe microsope 失效
标题翻译：探头制造方法，探针和扫描探针微孔
公开(公告)号：US20060284084A1
公开(公告)日：2006-12-21
申请号：US10570198
申请日：2004-09-03
申请人： Takafumi Morimoto , Tooru Seinaki , Yoshiyuki Nag-No , Yukio Kenbou , Yuuichi Xunitomo , Takenori Hiroki , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa , Ken Murayama , Mitsuo Hayashirara , Kishio Hidaka , Tadashi Fujieda
发明人： Takafumi Morimoto , Tooru Seinaki , Yoshiyuki Nag-No , Yukio Kenbou , Yuuichi Xunitomo , Takenori Hiroki , Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Shigeru Miwa , Ken Murayama , Mitsuo Hayashirara , Kishio Hidaka , Tadashi Fujieda
IPC分类号： G21K7/00
CPC分类号： G01Q70/12
摘要： A method of producing a probe by attaching a carbon nanotube etc. to a mounting base end and bonding it there using a carbon film etc., which method of producing a probe eliminates the effects of a carbon contamination film to increase the bonding strength, increases the conductivity of the probe, and strengthens the bonding performance by coating the entire circumference rather than coating one side, the probe, and a scanning probe microscope are provided. The method of producing a probe is a method of producing a probe comprised of a carbon nanotube 12, a mounting base ends 13 holding this carbon nanotube, and a coating film 17 bonding the carbon nanotube to a mounting base, comprising performing the mounting work of the carbon nanotube and mounting base end under observation by a microscope and stripping off the carbon contamination film 14 formed by an electron microscope at a stage before bonding by the coating film.
摘要翻译：通过使用碳膜等将碳纳米管等附接到安装基端并在其上进行接合来制造探针的方法，制造探针的方法消除了碳污染膜的作用，增加了接合强度，增加了提供探针的导电性，并且通过涂覆整个周边而不是涂覆一侧，探针和扫描探针显微镜来增强粘合性能。制造探针的方法是制造由碳纳米管12，保持该碳纳米管的安装基端13和将碳纳米管粘合到安装基底的涂膜17的探针的制造方法，其特征在于，碳纳米管和安装基端通过显微镜观察，并在通过涂膜粘合之前的阶段剥离由电子显微镜形成的碳污染膜14。

117. 发明申请

US20060284083A1 Scanning type probe microscope and probe moving control method therefor 失效
标题翻译：扫描型探针显微镜及探头移动控制方法
公开(公告)号：US20060284083A1
公开(公告)日：2006-12-21
申请号：US10569373
申请日：2004-08-27
申请人： Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Yasushi Minomoto , Shigeru Miwa , Ken Murayama , Yukio Kenbou , Yuuichi Yuuichi , Takenori Hiroki , Yoshiyuki Nagano , Takafumi Morimoto
发明人： Tooru Kurenuma , Hiroaki Yanagimoto , Hiroshi Kuroda , Yasushi Minomoto , Shigeru Miwa , Ken Murayama , Yukio Kenbou , Yuuichi Yuuichi , Takenori Hiroki , Yoshiyuki Nagano , Takafumi Morimoto
IPC分类号： G21K7/00
CPC分类号： G01Q10/06 , G01Q30/06 , Y10T29/49828
摘要： The probe tip movement control method of the scanning probe microscope is used for a scanning probe microscope provided with a cantilever 21 having a probe tip 20 facing a sample 12. The atomic force occurring between the probe tip and sample is measured when the probe tip scans the surface of the sample. X-, Y-, and Z-fine movement mechanisms 23, 29, and 30 are used to relatively change the positions of the probe tip and sample. It is possible to maintain a high measurement accuracy and enable scan movement of a probe tip on a sample surface by simple control when measuring a part having a gradient in measurement of an uneven shape on a sample surface.
摘要翻译：扫描探针显微镜的探针头移动控制方法用于具有面向样品12的探针尖端20的悬臂21的扫描探针显微镜。当探针尖端扫描样品的表面时，测量探针尖端和样品之间发生的原子力。 X，Y和Z精细运动机构23,29和30用于相对改变探针尖端和样品的位置。通过简单的控制，可以在测量样品表面上具有不均匀形状的测量梯度的部分时，保持高测量精度并且能够使探针尖端在样品表面上进行扫描运动。

118. 发明授权

US07136736B2 Vehicular travel control device 有权
标题翻译：车辆行驶控制装置
公开(公告)号：US07136736B2
公开(公告)日：2006-11-14
申请号：US10419878
申请日：2003-04-22
申请人： Satoru Kuragaki , Tokuji Yoshikawa , Shiho Izumi , Hiroshi Kuroda , Takao Kojima , Toshimichi Minowa , Toshio Manaka , Nobuyuki Ueki , Kazuaki Takano
发明人： Satoru Kuragaki , Tokuji Yoshikawa , Shiho Izumi , Hiroshi Kuroda , Takao Kojima , Toshimichi Minowa , Toshio Manaka , Nobuyuki Ueki , Kazuaki Takano
IPC分类号： G01S3/00 , G01S13/36
CPC分类号： B60G17/0195 , B60G17/016 , B60G17/019 , B60G2400/0511 , B60G2400/0512 , B60G2400/0513 , B60G2400/204 , B60G2400/2042 , B60G2400/252 , B60G2401/174 , B60G2800/702 , B60T8/172 , B60T2250/04 , B60W2420/00 , B60W2420/52 , G01S13/36 , G01S13/60 , G01S13/874 , G01S2013/9346
摘要： In a vehicular control device, it is necessary to measure or calculate six physical quantities-forward-reverse speed, left-right speed, vertical speed, pitch angle, roll angle, and angle of sideslip-representing vehicular movement and to control the braking force of each wheel and/or the damping coefficient of each suspension shock absorber in order to further shorten braking distance particularly at the time of braking and to prevent spin at that time. In this case, it is necessary to furnish sensors to measure speed and angle directly. In the present invention, four radar sensors are used in order to directly measure the forward-reverse speed and the left-right speed. Also, the vertical speed, the pitch angle, the roll angle, and the angle of sideslip are indirectly measured from the output of the radar sensors. By using three or four radar sensors, six physical quantities—the forward speed, the left-right direction speed, the vertical speed, the angle of sideslip, the pitch angle, and the roll angle—can be measured. Also, by using two radar sensors, three physical quantities—the forward speed, the left-right speed, and the angle of sideslip—can be measured.
摘要翻译：在车辆控制装置中，需要测量或计算六个物理量 - 前进 - 倒退速度，左右速度，垂直速度，俯仰角，侧倾角以及侧滑表示车辆运动的角度并且控制制动力以及每个悬架减震器的阻尼系数，以进一步缩短制动距离，特别是在制动时，并防止此时的旋转。在这种情况下，需要提供传感器直接测量速度和角度。在本发明中，为了直接测量前进后退速度和左右速度，使用四个雷达传感器。此外，从雷达传感器的输出间接测量垂直速度，俯仰角，侧倾角和侧滑角。通过使用三个或四个雷达传感器，可以测量六个物理量 - 前进速度，左右方向速度，垂直速度，侧滑角，俯仰角和滚动角度。此外，通过使用两个雷达传感器，可以测量三个物理量 - 前进速度，左右速度和侧滑角。

119. 发明授权

US07091900B2 Radar 失效
标题翻译：雷达
公开(公告)号：US07091900B2
公开(公告)日：2006-08-15
申请号：US10502596
申请日：2002-01-28
申请人： Kazuaki Takano , Hiroshi Kuroda
发明人： Kazuaki Takano , Hiroshi Kuroda
IPC分类号： G01S13/93
CPC分类号： G01S13/931 , G01S2013/9325 , G01S2013/9346 , G01S2013/9353 , G01S2013/9375
摘要： A radar of the present invention has: (1) an antenna unit for transmitting a radio wave and receiving a reflected wave of the radio wave; (2) rotating means for rotating the antenna unit about an axis along a direction of transmitting the radio wave; and (3) control means for detecting an azimuth of a target from the reflected wave, the azimuth using the axis as a reference and being defined in a plane determined from a posture of the antenna unit and the axis.
摘要翻译：本发明的雷达具有：（1）用于发送无线电波并接收无线电波的反射波的天线单元; （2）旋转装置，用于沿着发送无线电波的方向围绕轴线旋转天线单元; 以及（3）用于从反射波检测目标的方位角的控制装置，使用该轴作为基准的方位角，并且在由天线单元和轴的姿势确定的平面中限定。

120. 发明授权

US07061424B2 Radar device 失效
标题翻译：雷达设备
公开(公告)号：US07061424B2
公开(公告)日：2006-06-13
申请号：US10501709
申请日：2002-01-18
申请人： Hiroshi Kuroda , Kazuaki Takano , Fumihiko Okai
发明人： Hiroshi Kuroda , Kazuaki Takano , Fumihiko Okai
IPC分类号： G01S13/93 , G01S13/34
CPC分类号： G01S7/4026 , G01S7/4056 , G01S13/345 , G01S13/931 , G01S2007/4034 , G01S2007/4082 , G01S2007/4091 , G01S2013/9353 , G01S2013/9375
摘要： The present invention provides a radar device mounted on a moving object that moves along a continuous plane, having (1) a transceiver part for transmitting a signal having a main lobe in the direction of the movement of the moving object and a side lobe directed towards the continuous plane, that receives a first reflection signal from a target in the direction of the main lobe and a second reflection signal from the continuous plane in the direction of the side lobe, and (2) control processing means for detecting the frequency of a beat signal of the second reflection signal received by the transceiver part and the signal emitted by the transceiver part and for detecting information correlated to the attitude of the radar device with respect to the continuous plane based on that frequency. This enables detection of changes of mounting attitude for the moving object without requiring additional hardware.
摘要翻译：本发明提供一种安装在沿着连续平面移动的移动物体上的雷达装置，具有（1）用于在移动物体的运动方向上传递具有主瓣的信号的收发器部分和朝向在主瓣方向从目标接收第一反射信号的连续平面和沿着旁瓣方向的连续平面的第二反射信号，以及（2）用于检测侧波的频率的控制处理装置由收发器部分接收的第二反射信号的拍子信号和由收发器部分发射的信号，并且用于基于该频率检测与雷达装置相对于连续平面的姿态相关的信息。这使得能够检测移动物体的安装姿态的变化，而不需要额外的硬件。

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