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    • 94. 发明授权
    • Process for producing semiconductor article
    • 半导体制品的制造方法
    • US06326279B1
    • 2001-12-04
    • US09532079
    • 2000-03-21
    • Yasuo KakizakiTakao YoneharaNobuhiko Sato
    • Yasuo KakizakiTakao YoneharaNobuhiko Sato
    • H01L2176
    • H01L21/76259
    • To lessen the number of steps and reduce cost in the manufacture of high-quality SOI substrate, a process for producing a semiconductor article comprises the steps of forming a porous semiconductor layer at at least one surface of a first substrate, forming a non-porous single-crystal semiconductor layer on the porous semiconductor layer, bonding the first substrate to a second substrate with the former's non-porous single-crystal semiconductor layer facing the latter in contact, to form a bonded structure, and dividing the bonded structure at the porous semiconductor layer, wherein the process further comprises the step of previously forming on the one surface of the first substrate an epitaxial silicon layer in a thickness at least n-times (n≧2) the thickness of the porous semiconductor layer.
    • 为了减少步骤数量并降低制造高质量SOI衬底的成本,制造半导体产品的方法包括以下步骤:在第一衬底的至少一个表面上形成多孔半导体层,形成无孔 在多孔半导体层上形成单晶半导体层,将第一衬底与第二衬底接合,使前者的无孔单晶半导体层面向后面的非多孔单晶半导体层接触,形成接合结构,并将接合结构分为多孔 半导体层,其中所述工艺还包括以下步骤:在所述第一衬底的所述一个表面上形成厚度至少为所述多孔半导体层的厚度的n倍(n≥2)的厚度的外延硅层。
    • 99. 发明授权
    • High-productivity porous semiconductor manufacturing equipment
    • 高效多孔半导体制造设备
    • US08999058B2
    • 2015-04-07
    • US12774667
    • 2010-05-05
    • George D. KamianSomnath NagSubbu TamilmaniMehrdad M. MoslehiKarl-Josef KramerTakao Yonehara
    • George D. KamianSomnath NagSubbu TamilmaniMehrdad M. MoslehiKarl-Josef KramerTakao Yonehara
    • C30B1/10C25D11/32H01L31/18C25D17/00C25D17/06C25D11/00
    • C25D11/32C25D11/005C25D17/001C25D17/06C25F3/12C25F7/00H01L31/1892Y02E10/50
    • This disclosure enables high-productivity fabrication of semiconductor-based separation layers (made of single layer or multi-layer porous semiconductors such as porous silicon, comprising single porosity or multi-porosity layers), optical reflectors (made of multi-layer/multi-porosity porous semiconductors such as porous silicon), formation of porous semiconductor (such as porous silicon) for anti-reflection coatings, passivation layers, and multi-junction, multi-band-gap solar cells (for instance, by forming a variable band gap porous silicon emitter on a crystalline silicon thin film or wafer-based solar cell). Other applications include fabrication of MEMS separation and sacrificial layers for die detachment and MEMS device fabrication, membrane formation and shallow trench isolation (STI) porous silicon (using porous silicon formation with an optimal porosity and its subsequent oxidation). Further the disclosure is applicable to the general fields of Photovoltaics, MEMS, including sensors and actuators, stand-alone, or integrated with integrated semiconductor microelectronics, semiconductor microelectronics chips and optoelectronics.
    • 本公开使得能够高生产率地制造基于半导体的分离层(由单层或多层多孔半导体(例如多孔硅,包括单孔隙率或多孔度层构成),光反射器(由多层/多孔多孔半导体 孔隙度多孔半导体如多孔硅),用于防反射涂层的多孔半导体(例如多孔硅)的形成,钝化层和多结的多带隙太阳能电池(例如,通过形成可变带隙 晶体硅薄膜或晶圆太阳能电池上的多孔硅发射器)。 其他应用包括制造用于脱模和MEMS器件制造,膜形成和浅沟槽隔离(STI)多孔硅的MEMS分离和牺牲层(使用具有最佳孔隙率并随后氧化的多孔硅形成)。 此外,本公开可应用于光伏,MEMS(包括传感器和致动器)的独立或集成半导体微电子,半导体微电子芯片和光电子学的一般领域。